RELIABILITY TEST DATA Search Results

106 10k 804

Abstract: 106F 213B
Contextual Info: CTS ClearONE Terminator Reliability Test Data RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN &

AVAGO DIP

Abstract: 0133E MIL-STD-217 FIT
Contextual Info: HCNW138 and HCNW139 Low Input Current, High Gain Optocouplers Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use

d313 TRANSISTOR equivalent

Abstract: 207a smd ic smd diode 106E mil-std-202F 101D 6822 TRANSISTOR equivalent transistor d323 MIL-STD-202F-201A transistor D313 smd diode 101a D313 VOLTAGE REGULATOR
Contextual Info: RELIABILITY TESTING OF SEMICONDUCTOR DEVICES V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES 1. WHAT IS RELIABILITY TESTING? 2. RELIABILITY TEST METHODS 3. ACCELERATED LIFE TEST 4. ANALYSIS OF TEST RESULTS 4.1 HOW TO USE WEIBULL PROBABILITY PAPER 3. 4.1.1 APPLICATION OF WEIBULL PROBABILITY PAPER

reliability report

Abstract: quality and reliability report
Contextual Info: Quality and Reliability Report 7. Package Related Reliability Test Data Temperature-Humidity-Bias Test 1. Test Condition Condition: T = 85°C, RH = 85%, Maximum operating voltage Duration: Test time points at 168 hrs, 500 hrs, and 1000 hrs. 2. SRAM Products

Contextual Info: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and

Contextual Info: Reliability Datasheet Philips Lumileds SnapLED Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SnapLED included extensive operational life-time and

MIL-STD-217 FIT

Contextual Info: HCPL-3140 0.4A Photocoupler Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use the same LEDs, similar IC, and the same packaging

Contextual Info: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and

quality and reliability report

Contextual Info: Quality and Reliability Report 7. Package Related Reliability Test Data Temperature Cycle Test TCT 1. Test Condition Condition: T = -65°C / 15min , +150 °C/15min, Non-bias Duration: 500 cycles 2. DRAM Products Package Type Period Total No of Samples No. of

m63044

Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
Contextual Info: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2

PBGA 256 reflow profile

Abstract: bt 2328 pbga 144 BGA cte pbga JESD22-A113 OSP FLIPCHIP CRACK 304-pin dimensions bga jedec thermocouple WELD nsmd smd
Contextual Info: Customer Applications Support and Reliability Test Center Page 1 Motorola General Business Information Customer Applications Support and Reliability Test Center Customer support for new and current packaging technology; Package-to-board Interconnect reliability

MIL-HDBK-217

Abstract: HCPL 454
Contextual Info: HCPL-4200 Optically Coupled 20 mA Current Loop Receiver Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the past three years on this product family. All of these products use the same LEDs, similar IC,

hcpl 731

Abstract: Optocoupler 601 HCPL 601 MIL-HDBK-217 Optocoupler 721 HCPL-2300 optocoupler avago 601 optocoupler OPTOCOUPLER 436 MIL-STD-217 FIT
Contextual Info: HCPL-2300 8 MBd Low Input Optocoupler Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the qualification of this product family. All of these products use similar IC, and the same packaging materials, processes, stress

2430 avago

Abstract: HCPL-2400 HCPL-2430
Contextual Info: HCPL-2400 / 2411, HCPL-2430 20 MBd High CMR Logic Gate Optocouplers Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the past two years on this product family. All of these products use the same

sharp lt022

Abstract: LT022 sharp lt024 LT027 LASER LT028 LT025 lt027 Activation Energy LT024 LASER LT023
Contextual Info: Reliability x x x x x x x x x x x x x Reliability Tests Sharp laser diodes are designed to satisfy the following tests. No. 1 2 .— Test _ Solderablllty test – Solder heat resistance test 3 Temperature cycle test 4 Moisture aging test 5 Temperature-humldlty cycle test

JEDEC JESD22-B117

Abstract: JESD22-B117 Solder Paste, Indium 5.8 N41 250 y 803 IPC-9504 10k resistor 1/8 watt datasheet hot air bga Solder Paste, Indium 5.1, Type 3 10k resistor 1/4 watt datasheet
Contextual Info: RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN & REPORT .4

TRANSISTOR 9642

Abstract: 9544 transistor T0247 package what is fast IGBT transistor IRG4PC50U Equivalent transistors for IRG4PC50U IRG4BC20FD 600V 16 TO220 IRGPC40U irg4ph50ud IRGB440U
Contextual Info: Quarterly Reliability Report for T0247 / T0220 Products Manufactured at IRGB IGBT / CoPack ISSUE.3. October 1997 IGBT / CoPack Quarterly Reliability Report Page 1 of 35 Contents 1 Introduction 2 Reliability Information 3 Environmental Test Results 4 Environmental Test Conditions / Schematics

9544 transistor

Abstract: TRANSISTOR 9642 IRG4PC50U irg4ph50ud igbt failure IRG4PC40UD2 HTGB IRGPH60UD2 IRGBC20FD rectifier IGBT
Contextual Info: Quarterly Reliability Report for T0247 / T0220 Products Manufactured at IRGB IGBT / CoPack ISSUE.3. October 1997 IGBT / CoPack Quarterly Reliability Report Page 1 of 35 Contents 1 Introduction 2 Reliability Information 3 Environmental Test Results 4 Environmental Test Conditions / Schematics

Reliability and Statistics Glossary

Abstract: reliabil ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES
Contextual Info: Reliability and Statistics Glossary Vishay Semiconductors Reliability and Statistics Glossary DEFINITIONS Bias: Accelerated Life Test: A life test under conditions that are more severe than usual operating conditions. It is helpful, but not necessary, that a relationship between test severity and

ECS-3951M/3953M

Abstract: ECS3953M500 ECS-3951M
Contextual Info: Reliability Test Data Report ECS-3951M/3953M Family of SMD Oscillators Test Completed 6/29/2001 Approved by: Mr. Kurasawa ECS-3951M/3953M Reliability Report ECS-3953M-500 50.000 MHz Oscillator 1.1: Vibration Pre Vibration Stability Hz Stability (ppm) VOH (V)

SOP 8 200MIL

Contextual Info: TOSHIBA [13] Reliability Data 13. Reliability Data Intrinsic Failure Rate Estimation from Life Test Results 1995/3Q-1996/2Q Data Test Condition :Ta = 125°C, Vcc = 6.0V Operation 1000Hrs. Device 4120 Ta = 60°C Equivalent Device Hours Ea = 0.8V 391.15x106

13001 s

Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Contextual Info: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2

28HC64

Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.

Contextual Info: SMD TYPE LED Suntan Reliability Test Items And Conditions The reliability of products shall be satisfied with items listed below. Confidence level : 90% LTPD : 10% Test Items Test Conditions Quantity Judging Criteria 15 Solderable Area Over 95% 11 C=0 & I*