RELIABILITY DATA CAPACITOR Search Results

MIL-HDBK-217D

Abstract: sn 4002 MTTF HAMP-4001 HAMP-4002 hbic
Contextual Info: Description For applications requiring com ponent reliability estimation, H ew lett-P ackard provides reliability data for the High Speed C ircuit devices. Data is com plied from reliability tests to dem ­ onstrate that a product meets design criteria. T h e data on this

max785cai

Abstract: MAX6809 MAX232CPE MAX232CPE application sheet MAX232ACPE MAX232AEPE MAX691ACPE T 9722 MAX232ECPE MAX233 application notes
Contextual Info: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1

max785cai

Abstract: MAX232A SO-16 MAX232CPE application sheet MAX232CPE MAX232AEPE MAX785 MAX232ACPE MAX241CWI LH101 MAX724CCK
Contextual Info: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1

MAX785

Abstract: st 9635 DG302 to220 MAX232CPE MAX232 integrated chips IC 9637 MAX333 equivalent max232 MTBF calculation MAX232 mtbf st 9548
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard

DG302 to220

Abstract: MAX233 application notes zener 9514 MAX249 MAX238 9545 MAX232CPE application sheet max809 ICM7218AIPI MAX232 application notes
Contextual Info: November 1, 1996 RR-1J Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1995. It is separated into seven fabrication processes: 1 Standard

DG302 to220

Abstract: MAX724 equivalent 9532 zener MAX233 application notes MAX7219 equivalent MAX232CPE application sheet MAX238 MX7226 MAX249 MAX485 application notes
Contextual Info: November 1, 1996 RR-1J Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1995. It is separated into seven fabrication processes: 1 Standard

max785

Abstract: DG302 to220 DG301 to220 st 9635 st 9548 MAX232 integrated chips max232 MTBF calculation MAX232 mtbf MAX333 equivalent MAX232ACPE
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard

MAX202, MAX232

Abstract: LTC902 icl8069 equivalent MAX8212 equivalent MAX705 equivalent 7912 TO3 PACKAGE MAX832 MX7543 Ic 9430 MAX232
Contextual Info: May 1, 1995 RR-1I Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed in 1994. It is separated into six fabrication processes: 1

MAX7845

Abstract: MAX232 MAX232 mtbf mar 9109 MAX333 equivalent MAX9690 equivalent scr 9117 maxim 9114 max232 specification MAX252 8 pin
Contextual Info: RR-1G Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from 1990 to 1992. It is separated into four groups: Metal Gate

ic 9033

Abstract: MAX232 MAX333 equivalent max232 MTBF calculation MAX232 mtbf MAX7845 mar 9109 MAX9690 equivalent maxim 9114 MAX690CPA
Contextual Info: RR-1G Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from 1990 to 1992. It is separated into four groups: Metal Gate

MIL-HDBK-217D

Abstract: P4002
Contextual Info: Description For ap p lica tion s requiring com ponent reliability estimation, H ew lett-Packard provides reliability data for the H igh Speed C irc u it devices. Data is co m p lied from reliability tests to d em onstrate that a product meets design criteria. T he data on this

MAX232

Abstract: max232 specification MAX252 8 pin MAX9690 equivalent MAX584 max-232 38544 LTC902 max232 MTBF calculation MAX9687
Contextual Info: December 1, 1994 RR-1H Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from January 1990 to January 1994. It is separated into six

MAX232

Abstract: MAX1074 LTC902 MAX252 8 pin max232 MTBF calculation max232 specification MAX9687 38544 MAX9690 equivalent analog devices dg508 die
Contextual Info: December 1, 1994 RR-1H Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from January 1990 to January 1994. It is separated into six

68hc26

Abstract: 68HC05C4 68hc705p9 68HC05B6 JPC3400 68hc805b6 68705r3 68HC05C12 68HC705B5 68HC68SE
Contextual Info: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION . 1-1 RELIABILITY DATA BY TECHNOLOGY. 2-1

BHC Aerovox ALS10

Abstract: BHC AEROVOX ALC20 BHC Aerovox ALp22 BHC Aerovox ALS20 BHC Aerovox BHC Aerovox ALP20 ALC50 aerovox alc50 BHC ALS20 capacitor BHC TD002
Contextual Info: Reliability and Failure Rates Introduction The purpose of this technical data sheet is to give guidance on the reliability of the standard product ranges manufactured by BHC Aerovox Ltd by providing failure rate data for use in reliability calculations. It is not the intention to describe the mechanisms

Telcordia SR-332

Abstract: Telcordia SR-332 ISSUE 3 AFBR-5725PZ Transceiver MTTF SR332 sr-332 AVAGO afbr failure rate connector Telcordia c 5353
Contextual Info: AFBR-5725PZ 1.25GBd Ethernet, 850nm, 1000Base-SX SFP Transceiver Reliability Data Sheet Introduction FIT Rate Summary Avago Technologies Quality System includes an on-going Reliability Monitoring program to generate a database from which this reliability datasheet is published.

capacitor 1.50 MKT

Abstract: matsua capacitor uf B95037 B95020
Contextual Info: Metallized Polyester Capacitors High-Reliability for Aerospace Applications MKT-S B 95 037 Data Book Supplement Metallized Polyester Capacitors (MKT) Axial Leads B 95 037 High-reliability capacitor Encapsulated in metal tube Construction ● ● ● ●

design ideas

Abstract: hp 2800 MBR120VLSF CD74AC00 CDRH4D28-2R2 JMK316BJ226ML LTC3426 LTC4302 LTC4302-1 MBR120VLSFT1
Contextual Info: DESIGN IDEAS Redundant 2-Wire Bus for High Reliability Systems Introduction The effort to achieve high reliability in data processing, data storage and communication systems has necessitated the use of circuitry to monitor parameters such as temperature, fan

triac zd 107

Abstract: triac bcr BS08A BS08A TRANSISTOR equivalent SCR induction furnace circuit diagram 1000w inverter design and calculation TRIAC BCR 50 AM BCR 3A 400V CR3JM equivalent TRIACS EQUIVALENT LIST
Contextual Info: Low Power Applications and Technical Data Book A Guide to Using the Data Book 1.0 Numbering System 2.0 Symbols and Definitions of Major Parameters 3.0 Powerex Quality Assurance Program 4.0 Semiconductor Device Reliability 5.0 Reliability Test Methods 6.0 Designing Trigger Circuits

BR24S128

Abstract: BR24L01A-W BR24L02-W BR24L04-W BR24L08-W BR24L16-W BR24L32-W BR24L64-W BR24S256-W
Contextual Info: Serial EEPROM Series High Reliability Series EEPROMs I2C BUS BR24L□□-W Series,BR24S□□□-W Series No.09001EDT04 ROHM's series of serial EEPROMs represent the highest level of reliability on the market. A double cell structure provides a failsafe method of data reliability, while a double reset function prevents data miswriting. In addition, gold pads and gold

BR24L01A-W

Abstract: BR24L02-W BR24L04-W BR24L08-W BR24L16-W BR24L32-W BR24L64-W BR24L-W
Contextual Info: Serial EEPROM Series High Reliability Series EEPROMs I2C BUS BR24L□□-W Series,BR24S□□□-W Series No.09001EBT04 ROHM's series of serial EEPROMs represent the highest level of reliability on the market. A double cell structure provides a failsafe method of data reliability, while a double reset function prevents data miswriting. In addition, gold pads and gold

Contextual Info: Serial EEPROM Series High Reliability Series EEPROMs I2C BUS BR24L□□-W Series,BR24S□□□-W Series No.09001EDT04 ROHM's series of serial EEPROMs represent the highest level of reliability on the market. A double cell structure provides a failsafe method of data reliability, while a double reset function prevents data miswriting. In addition, gold pads and gold

marking code B2 NEC

Abstract: NEC tantalum capacitor 104 TANTALUM capacitor nec date code marking NEC 105M C105 SVHA1A225M SVHB21A475M SVHC1A156M DIP capacitor tantalum electronic corporation
Contextual Info: DATA SHEET TANTALUM CAPACITOR SV/H SERIES SURFACE MOUNT RESIN MOLDED TANTALUM CHIP CAPACITORS HIGH RELIABILITY NEC’s SV/H series solid tantalum capacitor has developed for automotive application. Comparing to the former type R Series , the higher reliability and the higher performance have been built in the

1N4148

Contextual Info: Operating Requirements January 1998, ver. 8 Introduction Data Sheet Altera devices combine unique programmable logic architectures with advanced CMOS processes to provide exceptional performance and reliability. To maintain the highest possible performance and reliability of