D87C257
Abstract: ic 41315 D27256 US94V D2732A intel 2708 eprom intel 4308 intel EPROM RR-35 D27C256
Contextual Info: in ter RELIABILITY REPORT RR-35 November 1990 EPROM RELIABILITY DATA SUMMARY Order Number: 210473-007 5-287 5 RR-35 INTEL EPROM RELIABILITY DATA SUMMARY CONTENTS page The Importance of Reliability. 5-289 EPROM Reliability Data Summary . 5-289
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2391
Abstract: 603EV
Contextual Info: Tuesday, July 24, 2001 603ev Reliability Data 603ev Reliability & Qualification Data This is the reliability & qualification data for the PowerPC 603ev microprocessor. The FIT and MTBF graphs for this device are located at the bottom of this page. Stress Results
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603ev/-200mac/1501000vents+4c/10021x21mmc/1252391
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106 10k 804
Abstract: 106F 213B
Contextual Info: CTS ClearONE Terminator Reliability Test Data RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN &
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4932
Abstract: 7086 generic failure rate D2863 JESD47 M2003 M2004 JESD-47 HTGB
Contextual Info: Reliability Information Vishay Siliconix Reliability at Vishay Siliconix This document provides a general description of Vishay Siliconix’s reliability program. The reliability data for specific products is available from the information page associated with each part. The general reliability description provided below and the reliability
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17-nov-05ul-94d2863j-std-020c+849327086generic failure ratejesd47m2003m2004jesd-47htgb
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max785cai
Abstract: MAX6809 MAX232CPE MAX232CPE application sheet MAX232ACPE MAX232AEPE MAX691ACPE T 9722 MAX232ECPE MAX233 application notes
Contextual Info: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1
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max785caimax6809max232cpemax232cpe application sheet+6max232acpemax232aepemax691acpet 9722max232ecpemax233 application notes
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max785cai
Abstract: MAX232A SO-16 MAX232CPE application sheet MAX232CPE MAX232AEPE MAX785 MAX232ACPE MAX241CWI LH101 MAX724CCK
Contextual Info: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1
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Sumitomo CRM 1033B
Abstract: sumitomo 1033B CRM1033B MOTOROLA POWER TRANSISTOR lc 945 sumitomo crm-1033B 8361J
Contextual Info: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Reliability Information Motorola Reliability and Quality Assurance Reliability Motorola has a long standing reputation for manufacturing products of excellent Quality and Reliability since the introduction of the first car
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br1339sumitomo crm 1033bsumitomo 1033bcrm1033b+3motorola power transistor lc 945sumitomo crm-1033b8361j
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MAX785
Abstract: st 9635 DG302 to220 MAX232CPE MAX232 integrated chips IC 9637 MAX333 equivalent max232 MTBF calculation MAX232 mtbf st 9548
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard
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DG302 to220
Abstract: MAX233 application notes zener 9514 MAX249 MAX238 9545 MAX232CPE application sheet max809 ICM7218AIPI MAX232 application notes
Contextual Info: November 1, 1996 RR-1J Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1995. It is separated into seven fabrication processes: 1 Standard
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dg302 to220max233 application noteszener 9514max249+6max2389545max232cpe application sheetmax809icm7218aipimax232 application notes
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DG302 to220
Abstract: MAX724 equivalent 9532 zener MAX233 application notes MAX7219 equivalent MAX232CPE application sheet MAX238 MX7226 MAX249 MAX485 application notes
Contextual Info: November 1, 1996 RR-1J Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1995. It is separated into seven fabrication processes: 1 Standard
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max785
Abstract: DG302 to220 DG301 to220 st 9635 st 9548 MAX232 integrated chips max232 MTBF calculation MAX232 mtbf MAX333 equivalent MAX232ACPE
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard
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P21256
Abstract: p21464 411K intel 21256 p21010
Contextual Info: intei RELIABILITY REPORT RR-62 September 1989 Dynamic RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240543-001 3-158 DRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 OVERVIEW . 3-160
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MAX202, MAX232
Abstract: LTC902 icl8069 equivalent MAX8212 equivalent MAX705 equivalent 7912 TO3 PACKAGE MAX832 MX7543 Ic 9430 MAX232
Contextual Info: May 1, 1995 RR-1I Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed in 1994. It is separated into six fabrication processes: 1
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ST 9427
Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Contextual Info: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and
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ic 9033
Abstract: MAX232 MAX333 equivalent max232 MTBF calculation MAX232 mtbf MAX7845 mar 9109 MAX9690 equivalent maxim 9114 MAX690CPA
Contextual Info: RR-1G Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from 1990 to 1992. It is separated into four groups: Metal Gate
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XC2018 PC84
Abstract: xc4300 XC4020 HQFP208 HQFP34 XC1765D XC3342 XC4305 XC4005E PHYSICAL XC500 356E-09
Contextual Info: The Reliability Data Program Expanded Version April 1, 1998 Cover TABLE OF CONTENTS Introduction .3 The Reliability Program. .3
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L504XXX
Abstract: transistor 9427 m507xxx 9437 transistor CLCC 100 1550371 9434 8 pin integrated circuit
Contextual Info: March 1996 RR-B1A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and July 1,
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MAX232
Abstract: max232 specification MAX252 8 pin MAX9690 equivalent MAX584 max-232 38544 LTC902 max232 MTBF calculation MAX9687
Contextual Info: December 1, 1994 RR-1H Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from January 1990 to January 1994. It is separated into six
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121C-2
Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478
Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4
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XC95XXXL
Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices
Contextual Info: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4
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MAX232
Abstract: MAX1074 LTC902 MAX252 8 pin max232 MTBF calculation max232 specification MAX9687 38544 MAX9690 equivalent analog devices dg508 die
Contextual Info: December 1, 1994 RR-1H Product Reliability Report This report presents the product reliability data for Maxim’s analog products. This data is a result of extensive reliability stress testing that we performed from January 1990 to January 1994. It is separated into six
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68hc26
Abstract: 68HC05C4 68hc705p9 68HC05B6 JPC3400 68hc805b6 68705r3 68HC05C12 68HC705B5 68HC68SE
Contextual Info: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION . 1-1 RELIABILITY DATA BY TECHNOLOGY. 2-1
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A9701
Abstract: MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure
Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4
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XcxxX
Abstract: vqfp100 package PQFP160 XILINX mp8000ch4 marking 611 016 soic-8 XCS40 failure Xcs17 xc95144 XC95144 equivalent
Contextual Info: The Reliability Data Program Expanded Version April. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4
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