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PQFP160, Datasheets Context Search

Catalog Datasheet	Type	Document Tags	PDF
Denso L 918 8 Abstract: Denso L 918 P-PGA-132 MQFP-208 XC4000 XC4000E XC5000 XC1765D 145C XC1700D Contextual Info: The Reliability Data Program October 1, 1996 Expanded Version Index • • • • • • HTOL High Temperature Operating Life . 85/85 (Bias Moisture Life). PCT (Unbiased Pressure Pot).	Original	plcc-20 denso l 918 8 denso l 918 p-pga-132 +7mqfp-208 xc4000 xc4000e xc5000 xc1765d 145c xc1700d	PDF
121C-2 Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478 Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4	Original	xc4005xl pqfp-160 plcc-84 hqfp-304 +13vqfp-100 xc4044xl xc4013xla 121c-2 xc1765d xc95108 xl mp8000ch4 p103 pot datasheet reliability report pqfp240 xc95xxx 17256d d1 pga 478	PDF
XC95XXXL Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices Contextual Info: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4	Original	xc4005xl pqfp-160 plcc-84 hqfp-304 +13vqfp-100 xc4044xl xc4013xla xc95xxxl xc95xxx xc1765d pqfp240 c17s xc9536 a9903 xcv1000e fg ht 12e application reliability test methods for packaged devices	PDF
Sony CXA1191M Abstract: philips ecg master replacement guide FZK101 YD 803 SGS FZK 101 Siemens CMC 707 am radio receiver philips ecg semiconductors master replacement guide CXA1191M ym2612 ecg semiconductors master replacement guide Contextual Info: Untitled HAM RADIO FILE - Various pinouts saved from the Chipdir 2010 http://www.chipdir.org/ 0512d -0512d +-\/-+ 1 -\|5V in gnd in\|- 24 2 -\|5V in gnd in\|- 23 3 -\|5V in gnd in\|- 22	Original	0512d ------------------------------------0512d z86e04 sony cxa1191m +9philips ecg master replacement guide fzk101 yd 803 sgs fzk 101 siemens cmc 707 am radio receiver philips ecg semiconductors master replacement guide cxa1191m ym2612 ecg semiconductors master replacement guide	PDF
A9701 Abstract: MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4	Original	plcc-20 a9701 mil-prf38535 xc1700d +7xc7000 xc9500 xc4310 xc3390a vqfp100 package xc95xx xcs40 failure	PDF
306E-09 Abstract: MQFP-208 XC7000 XC4005E PHYSICAL HT 208 X9500 XC1700D XC2000 XC4000E XC5000 Contextual Info: Reliability Testing Summary High Temperature Life Test Qualification & Monitor Combined Technology: Device Type: Package Type: Actual Temperature Actual Voltage: Assumed Activation Energy: XC1700D Period: 26 Combined Started Lot: 26 Combined Completed Lots:	Original	xc1700d xc2000 xc3000/a xc3100/a +9xc4000 306e-09 mqfp-208 xc7000 xc4005e physical ht 208 x9500 xc4000e xc5000	PDF