MIL-STD 883D METHOD 1010 Search Results

Contextual Info: Reliability Test TEST ITEM 1.TEMPERATURE CYCLE TC 2. HIGH TEMP. STORAGE (HTS) 3.LOW TEMP. STORAGE (LTS) 4.MOISTURE RESISTANCE (MR) 5.PRESSURE COOKER TEST (PCT) 6.SOLDERABILITY TEST (ST) TEST METHOD MIL-STD (1)MIL-STD-883D 1010.C0ND.C (2)JIS C7021 A-4 (1)MIL-STD-750B1031

SE6211

Abstract: RSE635204 SE630505
Contextual Info: ma I H EW L E T T K firn P A C K A R D Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out

sd667

Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All

SE6211

Abstract: se6303
Contextual Info: W hatHEW LETT mL'HM PACKARD Interim Qualification Report 2000 hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extrem es as set out in

TA-NWT-000983

Contextual Info: Qualification Report Reliability Data XMT5x70x-155 XMT5170B-622 XMT5370x-622 Summary The XMT5x70x-155, XMT5170B-622 and XMT5370x-622 transmitter modules have been successfully qualified in accordance with the requirements of Bellcore Document TA-NWT-000983 under

Ablebond 71-1

Abstract: Ablebond pp 42 mos Stag Programmers TMS28F512A TEXAS INSTRUMENTS bytek TMS28F512A The Diode Data Book with Package Outlines 1993 BL1023 "B & C microsystems" Sn 0503
Contextual Info: TMS28F512A 512K Flash Memory Technical Brief 1993 MOS Memory Printed in U.S.A., November 1993 SMJA003 Book Type Two Lines Volume # Volume # Book Type Book Type Two Lines Book Type Book Type Title Two Lines Subtitle Line Two Title Two Lines Subtitle Title Two Lines

Contextual Info: MAX685EEE Rev. A RELIABILITY REPORT FOR MAX685EEE PLASTIC ENCAPSULATED DEVICES November 9, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

NSO package

Abstract: PW36 MAX8215
Contextual Info: MAX8215xxD Rev. A RELIABILITY REPORT FOR MAX8215xxD PLASTIC ENCAPSULATED DEVICES April 3, 2004 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

gold metal detectors

Abstract: metal detector plans MAX6808 MS22 SC143 Korea aluminum alloy production data
Contextual Info: MAX6808xxxx Rev. A RELIABILITY REPORT FOR MAX6808xxxx PLASTIC ENCAPSULATED DEVICES March 8, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

MAX8216

Abstract: PW36 PW36-1
Contextual Info: MAX8216xxD Rev. A RELIABILITY REPORT FOR MAX8216xxD PLASTIC ENCAPSULATED DEVICES January 18, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

Contextual Info: MAX825TExK Rev. B RELIABILITY REPORT FOR MAX825TExK PLASTIC ENCAPSULATED DEVICES August 14, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

MAX793

Abstract: MAX793T
Contextual Info: MAX793TxxE Rev. A RELIABILITY REPORT FOR MAX793TxxE PLASTIC ENCAPSULATED DEVICES May 29th, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

Contextual Info: MAX230 Rev. B RELIABILITY REPORT FOR MAX230xxP CERAMIC DEVICES August 16, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance

AH-02

Contextual Info: MAX4544xxx Rev. A RELIABILITY REPORT FOR MAX4544xxx PLASTIC ENCAPSULATED DEVICES October 10, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

Contextual Info: MAX4372TExx Rev. A RELIABILITY REPORT FOR MAX4372TExx PLASTIC ENCAPSULATED DEVICES December 3, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

1501 Dc to Dc converter

Abstract: MIL-STD-883 Method 3015.7 MAX972 silver-filled epoxy
Contextual Info: MAX972xxA Rev. A RELIABILITY REPORT FOR MAX972xxA PLASTIC ENCAPSULATED DEVICES July 29, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance

CM21

Abstract: MAX931
Contextual Info: MAX931xxA Rev. A RELIABILITY REPORT FOR MAX931xxA PLASTIC ENCAPSULATED DEVICES July 24, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance

oa47 diode

Abstract: OA47 diode OA47 MAX412
Contextual Info: MAX412xxxA Rev. A RELIABILITY REPORT FOR MAX412xxxA PLASTIC ENCAPSULATED DEVICES January 19, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

Contextual Info: MAX3222xxx Rev. A RELIABILITY REPORT FOR MAX3222xxx PLASTIC ENCAPSULATED DEVICES August 21, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

AH141

Contextual Info: MAX4582xxE Rev. B RELIABILITY REPORT FOR MAX4582xxE PLASTIC ENCAPSULATED DEVICES August 6, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

MIL-STD-883 Method 3015.7

Abstract: 1501 Dc to Dc converter CM211 CM21-1 MAX971
Contextual Info: MAX971xxA Rev. A RELIABILITY REPORT FOR MAX971xxA PLASTIC ENCAPSULATED DEVICES January 30, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

CM21

Abstract: MAX921
Contextual Info: MAX921xxA Rev. A RELIABILITY REPORT FOR MAX921xxA PLASTIC ENCAPSULATED DEVICES August 12, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

MAX973

Contextual Info: MAX973xxA Rev. A RELIABILITY REPORT FOR MAX973xxA PLASTIC ENCAPSULATED DEVICES July 29, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance

cmos 4518

Contextual Info: MAX521xxxx Rev. A RELIABILITY REPORT FOR MAX521xxxx PLASTIC ENCAPSULATED DEVICES November 28, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl