M4433 Search Results

STM4433

Contextual Info: S T M4433 S amHop Microelectronics C orp. MAY . 12 2004 P -C hannel E nhancement Mode MOS FE T F E AT UR E S P R ODUC T S UMMAR Y V DS S ID R DS ON ( m W ) Max R ugged and reliable. 35 @ V G S = -10V -30V 5 S uper high dense cell design for low R DS (ON ).

Contextual Info: S T M4433A S amHop Microelectronics C orp. J an.25 2005 P -C hannel E nhancement Mode Field E ffect Transistor F E AT UR E S P R ODUC T S UMMAR Y V DS S ID R DS ON ( m W ) Max R ugged and reliable. 35 @ V G S = -10V -30V 5 S uper high dense cell design for low R DS (ON ).

HP98622A

Abstract: C3434 PC9801 a3020 C2890 C4351 PC-9801 pc9801 nec NEC PC9801 M3863
Contextual Info: PERIPHERAL EQUIPMENT FOR MULTICHANNEL DETECTORS Hamamatsu provides a variety of peripheral equipment for MOS multichannel detectors to facilitate high-precision measurement using computers. They include a PDI-regulated temperature controller, a data processing unit, and various interconnection cables.

tca 785 application

Abstract: TCA 785 application note 102h cbe 001H 101H 200H PM7346 yl 223h relay
Contextual Info: PM7346 S/UNI-QJET PRELIMINARY DATA SHEET PMC-960835 ISSUE 4 SATURN QUAD USER NETWORK INTERFACE FOR J2, E3, T3 PM7346 TM S/UNI- QJET S/UNI-QJET SATURN QUAD USER NETWORK INTERFACE FOR J2/E3/T3 DATA SHEET PRELIMINARY ISSUE 4: JANUARY 1998 PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA., INC., AND FOR ITS CUSTOMERS’ INTERNAL USE

M4433002

Contextual Info: 16 14 15 13 12 11 10 8 SYMBOL D E F I N I T I O N A DIMENSION WITHOUT AN INSPECTION REPORT SYMBOL DOES NOT REQUIRE INSPECTION. IT MAY BE CONTROLLED ON THE INDIVIDUAL COMPONENT DRAWING. 5 ±1 M M IS S IN G SYMBOLS TOTAL NO OF INSPECTIONS REQUI RED LAST NO.