LOCKBITS Search Results
LOCKBITS Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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lockbits
Abstract: FUSE 7
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Original |
1193D 09/01/xM lockbits FUSE 7 | |
lockbitsContextual Info: Errata • • • • • • Releasing Reset Condition without Clock Clearing Lockbits at High VCC or Temperature Wrong Latching of FSTRT Fuse Wrong Clearing of XTRF in MCUSR Reset during EEPROM Write Serial Programming at Voltages below 3.0 Volts 6. Releasing Reset Condition without Clock |
Original |
1192D 09/01/xM lockbits | |
Contextual Info: Errata • • • • • • Clearing Lockbits at High VCC or Temperature Wrong Latching of FSTRT Fuse Wrong Clearing of XTRF in MCUSR Reset during EEPROM Write Verifying EEPROM in System Serial Programming at Voltages below 3.0 Volts 6. Clearing Lockbits at High VCC or Temperature |
Original |
1192C 02/00/xM | |
Contextual Info: Errata • • • • • • • Clearing Lockbits at High VCC or temperature Wrong Clearing of XTRF in MCUSR Reset During EEPROM Write Verifying EEPROM in System Serial Programming at Voltages below 3.0 Volts High ICC in Power Down with External Clock Running |
Original |
1193C 02/00/xM | |
1601A-02Contextual Info: Errata • • • • • • Clearing Lockbits at High VCC or Temperature Wrong Clearing of XTRF in MCUSR Reset During EEPROM Write Verifying EEPROM in System Serial Programming at Voltages below 3.0 Volts Missing External Clock Option 6. Clearing Lockbits at High VCC or Temperature |
Original |
02/00/xM 1601A-02 | |
programmable storage deviceContextual Info: TMS29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE SMJS816B-NOVEMBER1990-REVISED JANUARY 1993 FM PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE'“ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible * Organization . . . 2048 x 8-Bit Flash Memory |
OCR Scan |
TMS29F816 384-BIT SMJS816B-NOVEMBER1990-REVISED 29F816-06 1024-Byte programmable storage device | |
TE28F640J3C-120
Abstract: 28F64J3 28f256j3c SL894 RC28F128J3C-150 SL897 28F128j3c TE28F640J3C120 sl896 28F320J3C
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256-Mbit 28F256J3, 28F128J3, 28F640J3, 28F320J3 TE28F640J3C-120 28F64J3 28f256j3c SL894 RC28F128J3C-150 SL897 28F128j3c TE28F640J3C120 sl896 28F320J3C | |
TE28F640J3C-120
Abstract: TE28F128J3C-120 INTEL 28F320J3 28F128J3 28F256K18 TE28F320J3C110 28F320J3 RC28F640J3C-120 28F640J3 28F640J3 reliability
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28F128J3, 28F640J3, 28F320J3 x8/x16) 32-Byte 128-bit --64-bit High-Densi8/x16 56-Lead TE28F640J3C-120 TE28F128J3C-120 INTEL 28F320J3 28F128J3 28F256K18 TE28F320J3C110 28F320J3 RC28F640J3C-120 28F640J3 28F640J3 reliability | |
Contextual Info: W28J320B/T 32M 2M x 16/4M × 8 BOOT BLOCK FLASH MEMORY Table of Contents1. GENERAL DESCRIPTION. 3 2. FEATURES . 3 |
Original |
W28J320B/T 16/4M | |
phase controller L120
Abstract: 1N914 28F008SA LH28F004SCB-L12 LHF04C10
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OCR Scan |
LHF04C10 LHF04C10 fbga048 AA2029 CSP48 0608TCMâ CV782 phase controller L120 1N914 28F008SA LH28F004SCB-L12 | |
PFC 5kw
Abstract: principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81
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Original |
8/16Kbytes 7734Q PFC 5kw principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81 | |
Contextual Info: SMJ29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE S G M S 0 5 3-N O V E M B E R 1 99 0-R E V IS E D JA N U A R Y 1993 FG PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE™ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible |
OCR Scan |
SMJ29F816 384-BIT 29F816-06 1024-Byte 32-Byte 18-Pin | |
Contextual Info: SEE NEW DESIGN RECOMMENDATIONS in te i REFERENCE ONLY 28F016SA FlashFile MEMORY Includes Commercial and Extended Temperature Specifications Revolutionary Architecture — Pipelined Command Execution — Program during Erase — Command Superset of Intel |
OCR Scan |
28F016SA 28F008SA 56-Lead, 28F016SA 28F032SA | |
Contextual Info: in te l 28F016XS 16-MBIT 1 MBIT x 16, 2 MBIT x 8 SYNCHRONOUS FLASH MEMORY Effective Zero Wait-State Performance up to 33 MHz — Synchronous Pipelined Reads Backwards-Compatible with 28F008SA Command-Set SmartVoltage Technology — User-Selectable 3.3V or 5V Vqc |
OCR Scan |
28F016XS 16-MBIT 28F008SA 56-Lead 128-Kbyte 16-Mbit | |
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Contextual Info: Ä M Ä K I I 0 M F @ [^ O ii]Ä ¥ 0 ® M VS28F016XS, MS28F016XS 16-MBIT 1 MBIT x 16, 2 MBIT x 8 SYNCHRONOUS FLASH MEMORY • VS28F016XS 40°C to +125°C — QML Certified — SE2 Grade ■ 0.25 MB/sec Write Transfer Rate ■ MS28F016XS 55°C to 125°C |
OCR Scan |
VS28F016XS, MS28F016XS 16-MBIT VS28F016XS MS28F016XS VE28F008, M28F008 28F016SA 56-Lead 128-Kbyte | |
Contextual Info: PRELIMINARY 5 VOLT FlashFile MEMORY 28F160S5 and 28F320S5 x8/x16 Two 32-Byte Write Buffers — 2 \is per Byte Effective Programming Time Operating Voltage 5 V Vcc — — 5 V V pp 70 ns Read Access Time (16 Mbit) 90 ns Read Access Time (32 Mbit) High-Density Symmetrically-Blocked |
OCR Scan |
28F160S5 28F320S5 x8/x16) 32-Byte 64-Kbyte 28F016SV 28F016SA AP-607 | |
Contextual Info: intei ADVANCED INFORMATION WORD-WIDE FlashFile MEMORY FAMILY 28F160S5, 28F320S5 Includes Extended Temperature Specifications Two 32-Byte Write Buffers — 2 us per Byte Effective Programming Time • Cross-Compatible Command Support — Intel Standard Command Set |
OCR Scan |
28F160S5, 28F320S5 32-Byte Re045 | |
Contextual Info: int ! PRELIMINARY BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT 28F004S5, 28F008S5, 28F016S5 Includes Commercial and Extended Temperature Specifications SmartVoltage Technology — Smart 5 Flash: 5 V Vcc and 5 V or 12 V V p p High-Performance |
OCR Scan |
28F004S5, 28F008S5, 28F016S5 40-Lead 44-Lead 64-Kbyte | |
Contextual Info: in te l A P iM ! O M IR S K E fflA T r iK S lR ] DD28F032SA 32-MBIT 2 MBIT X 16, 4 MBIT X 8 FlashFile MEMORY • User-Selectable 3.3V or 5V Vcc ■ User-Configurable x8 or x16 Operation ■ 70 ns Maximum Access Time ■ 0.43 MB/sec Write Transfer Rate |
OCR Scan |
DD28F032SA 32-MBIT 28F016SA 56-Lead, DD28F032SA 32-Mbit 3-30i | |
Contextual Info: intei 28F016SV 16-MBIT 1 MBIT x 16, 2 MBIT x 8 FlashFileTM MEMORY Sm artVoltage Technology — User-Selectable 3.3V or 5V V cc -U s e r-S e le c ta b le 5V or 12V Vpp 65 ns Access Time 1 Million Erase Cycles per Block 30.8 M B /sec Burst W rite Transfer Rate |
OCR Scan |
28F016SV 16-MBIT 28F016SA, 28F008SA 28F008SA 56-Lead 4fl2bl75 | |
Contextual Info: PRODUCT PREVIEW int ! VALUE SERIES 200 FLASH MEMORY CARD 8 - 6 4 MEGABYTES ¡MC008FLSG, ¡MC016FLSG, ¡MC024FLSG ¡MC032FLSG, ¡MC048FLSG, ¡MC064FLSG Low-Cost Linear Flash Card — Intel StrataFlash Memory Technology Automated Write and Erase Algorithms |
OCR Scan |
MC008FLSG, MC016FLSG, MC024FLSG MC032FLSG, MC048FLSG, MC064FLSG AP-374 AP-644 AP-646 AP-647 | |
Contextual Info: SERIES 2+ FLASH MEMORY CARDS 4-, 8-, 20- AND 40 MEGABYTES ÌM C004FLSP, ÌM C008FLSP, ÌM C020FLSP, ÌM C040FLSP • Revolutionary Architecture — Pipelined Command Execution — Write during Erase — Series 2 Command Super-Set 150 ns Maximum Access Time with 5 V |
OCR Scan |
C004FLSP, C008FLSP, C020FLSP, C040FLSP 28F016SA 16-Mbit 28F008SA | |
Contextual Info: PRODUCT PREVIEW BYTE-WIDE SMART 3 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT 28F004S3, 28F008S3, 28F016S3 Includes Commercial and Extended Temperature Specifications • SmartVoltage Technology — Smart 3 Flash: 2.7V Read-Only or 3.3V Vcc and 3.3V or 12V VPP |
OCR Scan |
28F004S3, 28F008S3, 28F016S3 40-Lead 44-Lead 64-Kbyte 16-Mbit 16-Mbit | |
Contextual Info: m A E W A M ! O M lF O K ß ffl/Ä T O ^ y 28F016XS 16-MBIT 1 MBIT x 16, 2 MBIT x 8 SYNCHRONOUS FLASH MEMORY Effective Zero Wait-State Performance up to 33 MHz — Synchronous Pipelined Reads SmartVoltage Technology — User-Selectable 3.3V or 5V Vcc |
OCR Scan |
28F016XS 16-MBIT 56-Lead 28F008SA 128-Kbyte 16-Mbit ER-33, |