ADC08D1000DEV
Abstract: AD677 WAVEVISION4 ADC08D1000WG-QV XC4VLX15 JESD57 for lvds ADC hard radiation
Contextual Info: The material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained fron the IEEE by writing to pubs-permissions.org.
|
Original
|
xc4vlx15com/xilinx/files/adc08d1000devrary/analogdialogue/archives/3906/chapter20sampled+1020data20systemsadc08d1000wg-qveia/jesd57org/download/search/jesd57adc08d1000devad677wavevision4jesd57 for lvdsadc hard radiation
|
PDF
|
A434 RF MODULE
Abstract: JESD31 TRANSISTOR SMD MARKING CODE A45 NCSL Z540.3 MIL-I-46058 part marking b36 smd diode tm-1017 B568 solar water pumping machine control schematic JEDEC JESD31
Contextual Info: DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS POST OFFICE BOX 3990 COLUMBUS, OH 43218-3990 IN REPLY REFER TO DSCC-VAC 20 April, 2010 MEMORANDUM FOR MILITARY/INDUSTRY DISTRIBUTION SUBJECT: Initial Draft of MIL-PRF-38535 Revision J: Project Number 5962-2010-006
|
Original
|
mil-prf-38535mil-prf-38535jrd-650a434 rf module+9jesd31transistor smd marking code a45ncsl z540.3mil-i-46058part marking b36 smd diodetm-1017b568solar water pumping machine control schematicjedec jesd31
|
PDF
|
3411G
Abstract: JC-13 MIL-STD-961 4813b a4611
Contextual Info: MIL-PRF-38535 Revision H Change Summary Paragraph Rev. H Major Changes Wording added/changed to make appendices requirements the performance benchmarks for QML devices, and that appendix a forms the basis for QML Q Preamble and V devices. Wording added that the QA is the approving authority for various certification
|
Original
|
mil-prf-38535mil-std-961ejc-133411g+3mil-std-9614813ba4611
|
PDF
|
JESD57
Abstract: DAC121S101WGRQV F-1192 DAC121S101QMLV DAC121S101 LM124
Contextual Info: This material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.
|
Original
|
jesd57dac121s101wgrqvf-1192dac121s101qmlv+2dac121s101lm124
|
PDF
|
ESD test plan
Abstract: vqe 14e IR 134E 463E-04 VQE 13E WE VQE 23 F 47AG mosfet 9420 vqe 24e WE VQE 11 E
Contextual Info: Single Event Effects Test Report R5, 100V, SE, N R5, 130V, SE, N R5, 150V, SE, N R5, 60V, N R5, 30V, N March 2000 - B.N.L. 233 Kansas Street El Segundo CA 90245 Fax-On-Demand 310 252 7100 Website WWW.irf.com International Rectifier Corp. SEE Test Report March 2000 - B.N.L.
|
Original
|
esd test planvqe 14eir 134e463e-04+6vqe 13ewe vqe 23 f47agmosfet 9420vqe 24ewe vqe 11 e
|
PDF
|
PRF38534
Abstract: MIL-PRF-38534 d452 TRANSISTOR equivalent d331 TRANSISTOR equivalent EQUIVALENT transistor D446 d472 TRANSISTOR equivalent D471 TRANSISTOR equivalent EQUIVALENT transistor D446 SMD transistor D613 equivalent transistor D331 circuit diagram application
Contextual Info: INCH-POUND This document and process conversion measures necessary to comply with this revision shall be completed by 13 March 2011 MIL-PRF-38534H 13 September 2010 SUPERSEDING MIL-PRF-38534G 9 March 2009 PERFORMANCE SPECIFICATION HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
|
Original
|
mil-prf-38534hmil-prf-38534g38534hprf38534+9mil-prf-38534d452 transistor equivalentd331 transistor equivalentequivalent transistor d446d472 transistor equivalentd471 transistor equivalentequivalent transistor d446 smdtransistor d613 equivalenttransistor d331 circuit diagram application
|
PDF
|
DNA-H-93-140
Abstract: DNA-H-95-61 e1309 JEP133 transistor 2N2222 F1262 FOTP-64 MOSFET DOSIMETER sensor 3414 cobalt-60
Contextual Info: N RADIATION OWNER’S MANUAL – RHA-Related Documents Military Performance Specifications 19500 – General Specification for Semiconductor Devices 38534 – Performance Specifications for Hybrid Microcircuits 38535 – General Specification for Intregrated Circuits Microcircuits Manufacturing
|
Original
|
p1156pss-01-609heisen9929dna-h-93-140+9dna-h-95-61e1309jep133transistor 2n2222f1262fotp-64mosfet dosimetersensor 3414cobalt-60
|
PDF
|
xilinx cross
Abstract: FLUKE 80T-IR LM98640 CDS1 LM98640QML thermister 332 80T-IR LM98640CVAL LM4050WG2.5RLQV JESD57 for lvds
Contextual Info: 1 SEE Testing of National Semiconductor’s LM98640QML System on a Chip for Focal Plane Arrays and Other Imaging Systems Kirby Kruckmeyer, Member, IEEE, Robert Eddy, Alex Szczapa, Bill Brown and Tom Santiago Abstract—National Semiconductor’s LM98640QML is a
|
Original
|
lm98640qmlf1192org/standards/f1192lm139a/lm139qml+11com/ds/lm/lm139acom/pf/lm/lm98640qmlxilinx crossfluke 80t-irlm98640cds1thermister 33280t-irlm98640cvallm4050wg2.5rlqvjesd57 for lvds
|
PDF
|
SRAM Cross References
Abstract: UT9Q512K8 SRAM SAMSUNG UT8Q512K8 36E-4 weibull test data 19E4
Contextual Info: Single Event Effects Qualification UT8Q512K8 RQ02 Lot 6ZVL04 4Mbit SRAM 7/21/03 Craig Hafer 719-594-8319 craig.hafer@aeroflex.com SUMMARY-Single event effects qualification testing was performed on the UTMC 4Mbit SRAM, (Samsung Rev C die), Lot 6ZVL04, at the Lawrence Berkeley Laboratory using
|
Original
|
ut8q512k86zvl0488-inch5e-11+109e-103e-097e-080e-11sram cross referencesut9q512k8sram samsung36e-4weibull test data19e4
|
PDF
|
systron Donner 410
Abstract: MIL-STD-750E Ultrasonic Atomizing Transducer systron donner accelerometer substitute diode PH 33D fastest finger first indicator synopsis emerson three phase dc motor driver service note tektronix 576 curve tracer MIL-STD-750E 1071 proximity detector sensor
Contextual Info: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES
|
Original
|
mil-std-750emil-std-750dsystron donner 410ultrasonic atomizing transducer+7systron donner accelerometersubstitute diode ph 33dfastest finger first indicator synopsisemerson three phase dc motor driver service notetektronix 576 curve tracermil-std-750e 1071proximity detector sensor
|
PDF
|
DAC121S101WGRQV
Abstract: Micro Linear cross DAC121S101 DAC121S101QML LM124 F-1192 DAC121S101QMLV output impedance calculation in LM124 JESD57
Contextual Info: Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter Kirby Kruckmeyer, Member, IEEE, James S. Prater, Bill Brown and Sandeepan DasGupta Abstract—The Single Event Effect SEE characterization of a Digital to Analog Converter (DAC) showed an unexpected Single
|
Original
|
dac121s101wgrqvmicro linear crossdac121s101dac121s101qml+5lm124f-1192dac121s101qmlvoutput impedance calculation in lm124jesd57
|
PDF
|
Samsung K6R4008C1D
Abstract: K6R4008C1D 317 mg K6R4008V1D SAMSUNG SRAM 110e4
Contextual Info: Single Event Latch-Up Testing on Samsung Rev. D 4M Fast Asynchronous SRAM Joseph Benedetto, Ph.D. Craig Hafer 719-594-8319 craig.hafer@aeroflex.com Summary—Single event latch-up SEL testing was performed on the Samsung K6R4008V1D and K6R4008C1D 3.3 and 5.0V 4M Asynchronous SRAMs (respectively) at the Texas A&M
|
Original
|
k6r4008v1dk6r4008c1deia/jesd57samsung k6r4008c1d+3317 mgsamsung sram110e4
|
PDF
|
tm-1017
Abstract: JESD31 marking code ny SMD Transistor npn JEDEC JESD31 Automated Guided Vehicles project A434 RF MODULE MIL-I-46058 ASTM E104 M38510 cross index semiconductors cross index
Contextual Info: The documentation and process conversion measures necessary to comply with this revision shall be completed by 13 September 2007. INCH-POUND MIL-PRF-38535H 16 March 2007 SUPERSEDING MIL-PRF-38535G 7July 2006 PERFORMANCE SPECIFICATION INTEGRATED CIRCUITS MICROCIRCUITS MANUFACTURING,
|
Original
|
mil-prf-38535hmil-prf-38535gmil-prf-3853591rd-650+10tm-1017jesd31marking code ny smd transistor npnjedec jesd31automated guided vehicles projecta434 rf modulemil-i-46058astm e104m38510 cross indexsemiconductors cross index
|
PDF
|
HP laptop schematic power supply circuit diagram
Abstract: mono mosfet amplifier diagram hp 520 schematic 20 pin lcd laptop 8ohm .5W speaker LX1701 LX1701CLQ hp laptop schematic diagram Monitor speaker schematic diagram of laptop hp Power H-Bridge Schematic
Contextual Info: LX1701 TM 2W Filterless Mono Class-D Audio Amplifier P RODUCTION D ATA S HEET KEY FEATURES DESCRIPTION The LX1701 family provides very low quiescent current consumption through the use of a proprietary output modulation scheme. This technology enables filter-less operation in many
|
Original
|
lx170116-pin200khz14db/8db+1020/300hzhp laptop schematic power supply circuit diagrammono mosfet amplifier diagramhp 520 schematic 20 pin lcd laptop8ohm .5w speakerlx1701clqhp laptop schematic diagrammonitor speakerschematic diagram of laptop hppower h-bridge schematic
|
PDF
|
|
|
8ohm .5W speaker
Abstract: HP laptop schematic power supply circuit diagram hp 520 schematic 20 pin lcd laptop hp laptop schematic diagram pc multimedia speaker pcb layout hp laptop battery pin definition LX1701 LX1701ILQ LX1701ILQTR Monitor speaker
Contextual Info: LX1701 TM 2W Filterless Mono Class-D Audio Amplifier P RODUCTION D ATA S HEET KEY FEATURES DESCRIPTION The LX1701 family provides very low quiescent current consumption through the use of a proprietary output modulation scheme. This technology enables filter-less operation in many
|
Original
|
lx170116-pin200khz14db/8db+1020/300hz8ohm .5w speakerhp laptop schematic power supply circuit diagramhp 520 schematic 20 pin lcd laptophp laptop schematic diagrampc multimedia speaker pcb layouthp laptop battery pin definitionlx1701ilqlx1701ilqtrmonitor speaker
|
PDF
|
MIL-STD-750E
Abstract: 1N21B diode cc 3053 MIL-PRF-680 D65019 rectifier 2037-1 TT 2076 SAE-ARP-743 1N21B diode 1N21* Diode Detector Holder
Contextual Info: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES
|
Original
|
mil-std-750emil-std-750d1n21bdiode cc 3053+7mil-prf-680d65019rectifier 2037-1tt 2076sae-arp-7431n21b diode1n21* diode detector holder
|
PDF
|