Part Number
    Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    JESD17 Search Results

    JESD17 Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    Contextual Info: SN54AHC126, SN74AHC126 QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS SC LS257E-D EC EM BER 1995-R E V IS E D FEBRUARY 1998 Operating Range 2-V to 5.5-V Vqq EP/C Enhanced-Performance Implanted CMOS Process High Latch-Up Immunity Exceeds 250 mA Per JESD17


    OCR Scan
    sn54ahc126sn74ahc126ls257e-d1995-r+3jesd17300-milahc126 PDF

    Contextual Info: SN74AHCT1G08 SINGLE 2-INPUT POSITIVE-AND GATE S C LS 315E -M AR C H 1996-R E V IS E D FEBRUARY 1998 • Inputs Are TTL-Voltage Compatible • EP/C Enhanced-Performance Implanted CMOS Process • Latch-Up Performance Exceeds 250 mA Per JESD17 • Package Options Include Plastic


    OCR Scan
    sn74ahct1g081996-rjesd17 PDF

    Contextual Info: SN54AHCT126, SN74AHCT126 QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS SCLS265I-DECEMBER 1995-REVISED FEBRUARY 1998 * • Inputs AreTTL-VoltageCompatible EP/C Enhanced-Performance Implanted CMOS Process High Latch-Up Immunity Exceeds 250 mA Per JESD17


    OCR Scan
    sn54ahct126sn74ahct126scls265i-december1995-revised+3jesd17mil-std-883300-mil PDF

    Contextual Info: SN74AHC1G14 SINGLE SCHMITT-TRIGGER INVERTER GATE SCLS321E - MARCH 1996 - REVISED JANUARY 1998 • Operating Range 2-V to 5.5-V V qq • EP/C Enhanced-Performance Implanted CMOS Process • High Latch-Up Immunity Exceeds 250 mA Per JESD17 • ESD Protection Exceeds 2000 V Per


    OCR Scan
    sn74ahc1g14scls321ejesd17mil-std-883 PDF

    Contextual Info: SN74AHC1G32 SINGLE 2-INPUT POSITIVE-OR GATE SCLS317E - MARCH 1996 - REVISED JANUARY 1998 • Operating Range 2-V to 5.5-V V qq • EP/C Enhanced-Performance Implanted CMOS Process • High Latch-Up Immunity Exceeds 250 mA Per JESD17 • Package Options Include Plastic


    OCR Scan
    sn74ahc1g32scls317ejesd17 PDF

    322F-M

    Contextual Info: SN74AHCT1G14 SINGLE SCHMITT-TRIGGER INVERTER GATE S C LS 322F-M A R C H 1996-R E V IS ED FEBRUARY 1998 DBV PACKAGE TOP VIEW Inputs Are TTL-Voltage Compatible EP/C (Enhanced-Performance Implanted CMOS) Process High Latch-Up Immunity Exceeds 250 mA Per JESD17


    OCR Scan
    sn74ahct1g14322f-m1996-rjesd17 PDF

    Contextual Info: SN74AHC1G04 SINGLE INVERTER GATE SCLS318E - MARCH 1996 - REVISED JANUARY 1998 • • • • • Operating Range 2-V to 5.5-V Vqq EP/C Enhanced-Performance Implanted CMOS Process High Latch-Up Immunity Exceeds 250 mA Per JESD17 DBV OR DCK PACKAGES (TOP VIEW)


    OCR Scan
    sn74ahc1g04scls318ejesd17mil-std-883 PDF

    1996-R

    Abstract: sn74ahc1g08
    Contextual Info: SN74AHC1G08 SINGLE 2-INPUT POSITIVE-AND GATE SC LS 314D -M A R C H 1996-R E V IS E D FEBRUARY 1998 * Operating Range 2-V to 5.5-V V qq * EP/C Enhanced-Performance Implanted CMOS Process * Latch-Up Performance Exceeds 250 mA Per JESD17 * Package Options Include Plastic


    OCR Scan
    sn74ahc1g081996-rjesd17 PDF

    Contextual Info: SN74AHC1G00 SINGLE 2-INPUT POSITIVE-NAND GATE SCLS313D-MARCH 1996-REVISED FEBRUARY 1998 Operating Range 2-V to 5.5-V V qq DBV OR DCK PACKAGE TOP VIEW EP/C (Enhanced-Performance Implanted CMOS) Process Latch-Up Performance Exceeds 250 mA Per JESD17 Package Options Include Plastic


    OCR Scan
    sn74ahc1g00scls313d-march1996-revisedjesd17 PDF

    Contextual Info: SN74AHCT1G32 SINGLE 2-INPUT POSITIVE-OR GATE S C LS 320E -M AR C H 1996-R E V IS E D FEBRUARY 1998 • Inputs Are TTL-Voltage Compatible • EP/C Enhanced-Performance Implanted CMOS Process • Latch-Up Performance Exceeds 250 mA Per JESD17 • Package Options Include Plastic


    OCR Scan
    sn74ahct1g321996-rjesd17 PDF

    A1619A

    Abstract: b1241
    Contextual Info: SN54ABT32318, SN74ABT32318 18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS SCBS180A-JUNE 1 9 9 2 - REVISED JULY 1994 Members of the Texas Instruments Wldebus+ Family State-of-the-Art EPIC-IlB™ BICMOS Design Significantly Reduces Power Dissipation Typical V q l p Output Ground Bounce


    OCR Scan
    sn54abt32318sn74abt3231818-bitscbs180a-june+7jesd-17-32-ma64-ma80-pinfl1bl723a1619ab1241 PDF

    1d4 cb

    Contextual Info: SN54ABT16373A, SN74ABT16373A 16-BIT TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS S CB S160 - DE CE M B E R 1992 Members of the Texas Instruments Widebus Family SN54ABT16373A . . . WD PACKAGE SN74ABT16373A . . . DGG OR DL PACKAGE TOP VIEW State-of-the-Art EPIC-llB™ BiCMOS Design


    OCR Scan
    sn54abt16373asn74abt16373a16-bitjesd-17+3-32-ma64-ma1d4 cb PDF

    Contextual Info: SN74LVC540 OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS JA N U A R Y 1993 • Space-Saving Package Option: Shrink Small-Outline Package DB Features EIAJ 0.65-mm Lead Pitch DB, DW, OR PW PACKAGE (TOP VIEW) • EPIC (Enhanced-Performance implanted CMOS) Submicron Process


    OCR Scan
    sn74lvc54065-mmmil-std-883cjesd-17 PDF

    CO2V

    Contextual Info: SN74ALVC16600 18-BIT UNIVERSAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS JA N U A R Y 1993 Member of the Texas Instruments Widebus Family DGG OR DL PACKAGE TOP VIEW ÖEÄE [ LEAB [ A1 [ GND [ A2 [ A3 [ EPIC™ (Enhanced-Performance Implanted CMOS) Submicron Process


    OCR Scan
    sn74alvc1660018-bitmil-std-883cco2v PDF

    51A-2

    Contextual Info: SN54ABT16470, SN74ABT16470 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS S CBS085B - D3794, FEBR UARY 1991 - R EVISED JULY 1993 SN54ABT16470. . WD P ACKAG E SN74ABT16470. . DL P ACKAG E TOP VIEW Members of the Texas Instruments Widebus Family State-of-the-Art EPIC-UB ™ BiCMOS Design


    OCR Scan
    sn54abt16470sn74abt1647016-bitcbs085b+7d3794jesd-17-32-ma64-ma300-mil380-mil51a-2 PDF

    ABT16374A

    Contextual Info: SN54ABT16374A, SN74ABT16374A 16-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS MARCH 1993-R EV IS ED JULY 1993 Members of the Texas Instruments Widebus Family State-of-the-Art EPIC-HB" BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per


    OCR Scan
    sn54abt16374asn74abt16374a16-bit1993-r+7mil-std-883cjesd-17-32-ma64-ma300-mil380-milabt16374a PDF

    Contextual Info: SN74LVC841 10-BIT BUS-INTERFACE D-TYPE LATCH WITH 3-STATE OUTPUTS M ARCH 1993 OB, DW, OR PW PACKAGE TOP VIEW • Space-Saving Package Option: Shrink Small-Outline Package (DB) Features EIAJ 0.65-mm Lead Pitch • EPIC (Enhanced-Performance Implanted


    OCR Scan
    sn74lvc84110-bit65-mmmil-std-883c PDF

    SN54LV14

    Abstract: 2020CN
    Contextual Info: SN54LV14, SN74LV14 HEX SCHMITT-TRIGGER INVERTERS _ S C L S 1 8 7 B - FEBRUARY 1 9 9 3 - REVISED APRIL 1996 EPIC Enhanced-Performance Implanted CMOS 2-|i Process SN54LV14 . . . J OR W PACKAGE SN74LV14. . . D, DB, OR PW PACKAGE (TOP VIEW) TVplcal V q l p (Output Ground Bounce)


    OCR Scan
    sn54lv14sn74lv14mil-std-883cjesd-17+2300-mll2020cn PDF

    Contextual Info: SN74LVC74 DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET JANUARY 1993 D, DB, OR PW PACKAGE TOP VIEW • EPIC (Enhanced-Performance Implanted 1CCR [ 1 1D [ 2 CMOS) Submicron Process • 1CLK [ 3 Designed to Facilitate Incident Wave


    OCR Scan
    sn74lvc7465-mmmil-std-883c PDF

    Contextual Info: SN54LVU04, SN74LVU04 HEX INVERTERS S C L S 1 B 5 B - FEBRUARY 1993 - REVISED APRIL 1996 EPIC Enhanced-Performance Implanted CMOS 2-n Process Typical V q l p (Output Ground Bounce) < 0.8 V at V c c . Ta = 25°C Typical V q h v (Output V q h Undershoot)


    OCR Scan
    sn54lvu04sn74lvu04mil-std-883cjesd-17+1300-mil PDF

    Contextual Info: SN54ABT16501, SN74ABT16501 18-BIT UNIVERSAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS _ SCBS086C - FEBRUARY 1991 - REVISED JANUARY 1997 Members of the Texas Instruments Widebus Family SN54ABT16501 . . . W D PACKAGE SN74ABT16501 . . . DGG OR DL PACKAGE


    OCR Scan
    scbs086csn54abt16501sn74abt1650118-bit+2mil-std-883jesd-17 PDF

    Contextual Info: SN74ALVC16601 18-BIT UNIVERSAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS JANUARY 1993 DGG OR DL PACKAGE TOP VIEW UBT (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, Clocked, or Clock-Enabled Mode


    OCR Scan
    sn74alvc1660118-bitmil-std-883c PDF

    Contextual Info: SN74LVC00 QUADRUPLE 2-INPUT POSITIVE-NAND GATE SCAS279B-JANUARY 1993 - REVISED JULY 1995 I • EP/C Enhanced-Performance Implanted CMOS Submicron Process • ESD Protection Exceeds 2000 V Per MII-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)


    OCR Scan
    sn74lvc00scas279b-januarymii-std-883cjesd-17 PDF

    d3798

    Abstract: ABT16543
    Contextual Info: SN54ABT16543, SN74ABT16543 16-BIT REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS087A - D379B, FEBRUARY 1991 - R EVISED O CTO BER 1992 Members of the Texas Instruments Widebus Family State-of-the-Art EPIC-llB™ BiCMOS Design Significantly Reduces Power Dissipation


    OCR Scan
    sn54abt16543sn74abt1654316-bitscbs087a+8d379bjesd-17-32-ma64-ma300-mil380-mild3798abt16543 PDF