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    IEEE 1149 Search Results

    IEEE 1149 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    BLA1011-300
    		Rochester Electronics LLC BLA1011-300 - 300W LDMOS Avionics Power Transistor PDF Buy
    CLF1G0035-100P
    		Rochester Electronics LLC CLF1G0035-100 - 100W Broadband RF power GaN HEMT PDF Buy
    LXMSJZNCMH-225
    		Murata Manufacturing Co Ltd Ultra small RAIN RFID chip tag PDF
    LXMS21NCMH-230
    		Murata Manufacturing Co Ltd Ultra small RAIN RFID chip tag PDF
    LBAA0QB1SJ-295
    		Murata Manufacturing Co Ltd SX1262 MODULE WITH OPEN MCU PDF

    IEEE 1149 Datasheets (1)

    Part ECAD Model Manufacturer Description Datasheet Type PDF PDF Size Page count
    IEEE 1149.1 (JTAG)
    		Altera IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices Application Note 39 Original PDF 325.38KB 44

    IEEE 1149 Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    SCAN18245T

    Abstract: SCAN182245A SCAN182373A SCAN182374A SCAN18373T SCAN18374T SCAN18540T SCAN18541T teradyne national semiconductor handbook
    Contextual Info: Information on IEEE Standards The IEEE Working Group developed the IEEE Std 1149 11990 IEEE Standard Test Access Port and Boundary-Scan Architecture To purchase this book $50 please call one of the following numbers and ask for SH13144 In the USA 1-800-678-IEEE


    Original     		SH13144 1-800-678-IEEE 1-800-CS-BOOKS) SCANPSC110) SCANPSC110 x4500 SCAN18245T SCAN182245A SCAN182373A SCAN182374A SCAN18373T SCAN18374T SCAN18540T SCAN18541T teradyne national semiconductor handbook PDF

    RF Power Insensitive Varactors

    Contextual Info: 418 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, VOL. 22, NO. 8, AUGUST 2012 RF Power Insensitive Varactors Koen Buisman, Member, IEEE, Cong Huang, Member, IEEE, Peter J. Zampardi, Senior Member, IEEE, and Leo C. N. de Vreede, Senior Member, IEEE Abstract—In this letter, the influence of the RF voltage swing


    Original     		PDF

    GIGA090

    Abstract: "network interface cards"
    Contextual Info: GIGA090 90nm Single Port Embeddable Gigabit Ethernet Transceiver Data Brief Main features • Fully standards compliant: IEEE 802.3, IEEE 802.3u, IEEE 802.3z and IEEE 802.3ab ■ Advanced Cable Diagnostic Features: – hard fault detection – Inter pair short


    Original     		GIGA090 1000BASE-T 100BASE-TX GIGA090 "network interface cards" PDF

    SIEMENS BST

    Abstract: ericsson bsc manual LVTH18245 ericsson bscs manual BSDL Files siemens data transistor scans LVTH18502 tbc 541 7923 eprom ieee 1149
    Contextual Info: IEEE Std 1149.1 JTAG Testability Primer 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group IEEE Std 1149.1 (JTAG) Testability 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group Primer IEEE Std 1149.1 (JTAG) Testability Primer i IMPORTANT NOTICE


    Original     		SSYA002C SIEMENS BST ericsson bsc manual LVTH18245 ericsson bscs manual BSDL Files siemens data transistor scans LVTH18502 tbc 541 7923 eprom ieee 1149 PDF

    ericsson bsc manual

    Abstract: LVTH18245 ieee 1149 siemens handbook JEP106 LVTH18502 BCT8244 LVTH18504 SSYA002C Turner plus 3
    Contextual Info: IEEE Std 1149.1 JTAG Testability Primer 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group IEEE Std 1149.1 (JTAG) Testability 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group Primer IEEE Std 1149.1 (JTAG) Testability Primer i IMPORTANT NOTICE


    Original     		SSYA002C Index-10 ericsson bsc manual LVTH18245 ieee 1149 siemens handbook JEP106 LVTH18502 BCT8244 LVTH18504 SSYA002C Turner plus 3 PDF

    4DPA

    Abstract: "network interface cards"
    Contextual Info: GIGA090 90nm Single Port Embeddable Gigabit Ethernet Transceiver Data Brief Main features • Fully standards compliant: IEEE 802.3, IEEE 802.3u, IEEE 802.3z and IEEE 802.3ab ■ Advanced Cable Diagnostic Features: – hard fault detection – Inter pair short


    Original     		GIGA090 1000BASE-T 100BASE-TX 100BASETX 10BASE-T GIGA090 4DPA "network interface cards" PDF

    SNLS161

    Abstract: SCANSTA112
    Contextual Info: SCANSTA112 SCANSTA112 7-Port Multidrop IEEE 1149.1 JTAG Multiplexer Literature Number: SNLS161H SCANSTA112 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer General Description Features The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a


    Original     		SCANSTA112 SCANSTA112 SNLS161H IEEE1149 SNLS161 PDF

    SCANSTA112SM/NOPB

    Contextual Info: SCANSTA112 SCANSTA112 7-Port Multidrop IEEE 1149.1 JTAG Multiplexer Literature Number: SNLS161H SCANSTA112 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer General Description Features The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a


    Original     		SCANSTA112 SCANSTA112 SNLS161H IEEE1149 SCANSTA112SM/NOPB PDF

    WL60010

    Abstract: WL6001 802.11a Controller MAC Data Sheet WaveLAN WaveLAN WL54040 WL60040 modem MMI sdi capture card AD27 AD29
    Contextual Info: Product Brief August 2003 WaveLAN TM WL60040 Multimode Wireless LAN Media Access Controller MAC 1 Features ! Full implementation of the IEEE 802.11 WMAC protocol including the following: ― IEEE 802.11a, IEEE 802.11g, and IEEE 802.11h standards, supporting all mandatory and optional


    Original     		WL60040 PB03-164WLAN WL60010 WL6001 802.11a Controller MAC Data Sheet WaveLAN WaveLAN WL54040 WL60040 modem MMI sdi capture card AD27 AD29 PDF

    AN-890

    Contextual Info: Fairchild Semiconductor Application Note February 1994 Revised May 2001 P1149.1A Extensions to IEEE-STD-1149.1-1990 Abstract 1, 2, 3 Since publication of IEEE-1149.1-1990/ANSI , extensions and requests for clarifications have been adopted by the IEEE 1149.1 Working Group. The original standard


    Original     		P1149 IEEE-STD-1149 IEEE-1149 1-1990/ANSI AN-890 PDF

    JTAG

    Abstract: TRST AN242
    Contextual Info: 242 IEEE 1149.1 JTAG Test Access Port Reset Requirement Application Note Introduction A number of Pericom’s bridge and packet switch devices support built-in IEEE 1149.1 JTAG Test Access Port TAP controller for debugging and testing purposes. The IEEE Standard Test Access Port and


    Original     		AN242 JTAG TRST PDF

    equivalent bc 517

    Abstract: bc 312 equivalent Controller BC 415 MPC561 MPC563 BC2 373 EQUIVALENT BC 309 26vf 3410Z BC 247
    Contextual Info: SECTION 25 IEEE 1149.1-COMPLIANT INTERFACE JTAG 25.1 IEEE 1149.1 Test Access Port (TAP) and Joint Test Action Group (JTAG) The chip design includes user-accessible test logic that is compatible with the IEEE 1149.1-1994 Standard Test Access Port and Boundary Scan Architecture. The


    Original     		MPC561/ MPC563 MPC561/MPC563 equivalent bc 517 bc 312 equivalent Controller BC 415 MPC561 MPC563 BC2 373 EQUIVALENT BC 309 26vf 3410Z BC 247 PDF

    SN74BCT8244

    Abstract: symposium ABT18502 electronics parts tutorial SATV002 P-1149 ieee embedded system papers free ieee 1149.1 jtag boundary scan
    Contextual Info: JTAG IEEE 1149.1/P1149.4 Tutorial - Introductory JTAG (IEEE 1149.1/P1149.4) Tutorial Introductory AL 10Sept.-97 1149.1(JTAG)-Tut.I-1 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory Agenda • ■ ■ ■ ■ ■ What Is JTAG? The Increasing Problem of Test


    Original     		1/P1149 10Sept SN74BCT8244 symposium ABT18502 electronics parts tutorial SATV002 P-1149 ieee embedded system papers free ieee 1149.1 jtag boundary scan PDF

    C896

    Abstract: flexible de 12 pines PA96 application circuit MD500 LRD 14 st d83
    Contextual Info: CRLŒIUBS CA91C897 OCTOBER 1990 FUTUREBUS+ INTERFACE UNIT • Fully compatible with IEEE P896.1 -1 9 9 0 • IEEE 1149.1 JTAG testability port • TTL input/output levels • Low power CMOS implementation • The CA91C897 is a high performance IEEE P896.1-1990


    OCR Scan     		OCTOBER199Â CA91C897 CA91C896 C896 flexible de 12 pines PA96 application circuit MD500 LRD 14 st d83 PDF

    MCF5206

    Contextual Info: SECTION 1S IEEE 1149.1 TEST ACCESS PORT JTAG The MCF5206 includes dedicated user-accessible test logic that is fully compliant with the IEEE standard 1149.1 Standard Test Access Port and Boundary Scan Architecture. Use the following description in conjunction with the supporting IEEE document listed above. This


    OCR Scan     		MCF5206 PDF

    tqfp208

    Abstract: BC 227 jtag 14 S 1149 212 MCF5307
    Contextual Info: SECTION 17 IEEE 1149.1 TEST ACCESS PORT JTAG The MCF5307 includes dedicated user-accessible test logic that is fully compliant with the IEEE standard 1149.1 Standard Test Access Port and Boundary Scan Architecture. Use the following description in conjunction with the supporting IEEE document listed above. This


    Original     		MCF5307 MCF5307; tqfp208 BC 227 jtag 14 S 1149 212 PDF

    motorola sc38

    Abstract: sc38* motorola SC236 vhdl code for traffic light control motorola 88000 motorola sc49 SC188 SC135 SC183 SC107
    Contextual Info: C fíLM W "" CA91C896 OCTOBER 1990 FUTUREBUS+ ARBITER • Fully compatible with IEEE P896.1 -1 9 9 0 • IEEE 1149.1 JTAG testability port • TTL Input/output levels • Low power CMOS implementation • Futurebus+ Interface The CA91C896 is a high performance IEEE P896.1-1990


    OCR Scan     		OCTOBER199Â CA91C896 CA91C896 motorola sc38 sc38* motorola SC236 vhdl code for traffic light control motorola 88000 motorola sc49 SC188 SC135 SC183 SC107 PDF

    analog multiplexor

    Abstract: A3-12 analog ups circuit diagram datasheet multiplexor high voltage analog multiplexer ieee 1149 national semiconductor databook MTC20 STA400EP STA400MTEP
    Contextual Info: STA400EP Enhanced Plastic Dual 2:1 Analog Mux with IEEE 1149.4 General Description Features This Dual 2 to 1 Analog Mux with IEEE 1149.4 incorporates many features of the IEEE 1149.4 Test Standard. The device provides access to up to 9 Analog test points and can be


    Original     		STA400EP STA400EP analog multiplexor A3-12 analog ups circuit diagram datasheet multiplexor high voltage analog multiplexer ieee 1149 national semiconductor databook MTC20 STA400MTEP PDF

    MC68060

    Abstract: M68060 MC68060 version XBS2
    Contextual Info: SECTION 9 IEEE 1149.1 TEST JTAG AND DEBUG PIPE CONTROL MODES This section describes the IEEE 1149.1 test access port (normal Joint Test Action Group (JTAG) mode and the debug pipe control mode, which are available on the MC68060. 9.1 IEEE 1149.1 TEST ACCESS PORT (NORMAL JTAG) MODE


    OCR Scan     		MC68060. MC68060 M68060 MC68060 version XBS2 PDF

    MCF5204

    Contextual Info: SECTION 11 JTAG SPECIFICATION 11.1 IEEE 1149.1 STANDARD JTAG SPECIFICATION The MCF5204 processors include dedicated user-accessible test logic that is fully compliant with the IEEE standard 1149.1 test access port and boundary-scan architecture. The following description should be used in conjunction with the supporting IEEE document


    OCR Scan     		MCF5204 conne5204 MCF5204, PDF

    SCANSTA101

    Abstract: SCANSTA101SM SCANSTA101SMX
    Contextual Info: SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master General Description Features The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.


    Original     		SCANSTA101 SCANSTA101 SCANPSC100. SCANSTA101SM SCANSTA101SMX PDF

    ppi interface

    Abstract: SCANSTA101 SCANSTA101SM SCANSTA101SMX
    Contextual Info: SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master General Description Features The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.


    Original     		SCANSTA101 SCANSTA101 SCANPSC100. ppi interface SCANSTA101SM SCANSTA101SMX PDF

    5SGX

    Abstract: SV51012-1 jtag receiver Stratix V
    Contextual Info: 11. JTAG Boundary-Scan Testing in Stratix V Devices SV51012-1.0 This chapter describes the boundary-scan test BST features that are supported in Stratix V devices. Stratix V devices support IEEE Std. 1149.1 and IEEE Std. 1149.6. The IEEE Std. 1149.6 is only supported on the high-speed serial interface (HSSI) transceivers in Stratix V


    Original     		SV51012-1 5SGX jtag receiver Stratix V PDF

    mdo 365

    Abstract: MPC566 motorola 2443 MPC565 504 BC equivalent bc 517 4700Z BC 213 Motorola
    Contextual Info: SECTION 24 IEEE 1149.1-COMPLIANT INTERFACE JTAG 24.1 IEEE 1149.1 Test Access Port (TAP) and Joint Test Action Group (JTAG) The chip design includes user-accessible test logic that is compatible with the IEEE 1149.1-1994 Standard Test Access Port and Boundary Scan Architecture.The implementation supports circuit-board test strategies based on this standard. An overview


    Original     		MPC565 MPC566 MPC566 mpio32b8 mpio32b9 MPC565/MPC566 mpio32b10 mdo 365 motorola 2443 504 BC equivalent bc 517 4700Z BC 213 Motorola PDF