EEPROM RETENTION BAKE SCREENING Search Results

Contextual Info: EEPROM Reliability The reliability of AMD's NS-18 process used in the fabrication of 64K EEPROMs is described in this report. The reliability monitors used at AMD were designed to predict the future operating life results by accelerat­ ing failure rates. The monitors include data from endur­

RAD6000

Abstract: NA-GSFC-2005-04 HCN58C1001 EEPROM retention testing EEPROM retention bake screening GSFC SCS750 RAD6000 processor architecture 79LV0408RPFE-20 28C011TRPFS-12
Contextual Info: Review of GSFC NASA Advisory NA-GSFC-2005-04 Part Types: Models: Manufacturer: EEPROM All EEPROM Models Maxwell Technologies Lot Date Codes: All LDC’s Document: 1009322 Revision: Date: 2 March 24, 2006 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States |

AT28HC64B-W

Abstract: AT28BV64B-W AT28C16-W M2010 M5004
Contextual Info: Features • • • • • • • • • • • • • High Performance CMOS Technology Low Power Dissipation - Active and Standby Hardware and Software Data Protection Features DATA Polling for End of Write Detection High Reliability – Endurance:

EEPROM retention testing

Abstract: flash "high temperature data retention" mechanism ANH005 P1005 flash Activation Energy
Contextual Info: Hybrid Memory Products Ltd Floating Gate Memory Arrays Retention Issues Introduction This document reviews the nature of Data Retention, and presents approaches to its specification and verification based upon procedures defined in the following IEEE publication:

QNEE9801

Abstract: stmicroelectronics traceability
Contextual Info: QNEE9801 QUALITY NOTE High Reliability Certified Flow HRCF The High Reliability Certified Flow has been developed by STMicroelectronics for sensitive applications, such as security automotive and medical applications, that need a very high level of reliability (with the

EEPROM Die Products

Abstract: Atmel AT28C256-DWFM19104 EEPROM retention bake screening AT28HC256-DWFM19104 AT28BV256-DWF AT28BV64B-DWF AT28C16-DWF M2010 M5004
Contextual Info: Features • • • • • • • • • • • • High Performance CMOS Technology Low Power Dissipation – Active and Standby Hardware and Software Data Protection Features DATA Polling for End of Write Detection High Reliability – Endurance: • 104 Cycles

sugar centrifuge

Abstract: EEPROM retention bake screening
Contextual Info: Product Quality A CORPORATE COMMITMENT Microchip Technology Inc. has evolved a culture where a commitment to quality is an integral part. By empowering every employee to be responsible for the quality of their work, the entire corporation is involved in the

flash "high temperature data retention" mechanism

Abstract: EEPROM retention testing BEST BIOS PROGRAMMING AND DATA FOR EEPROM EEPROM retention bake screening SST superflash
Contextual Info: Reliability Considerations for Reprogrammable Nonvolatile Memories Technical Paper 1.0 INTRODUCTION When acquiring a microcircuit, many considerations above and beyond the purchase price are important. Among these are quality, reliability, delivery, service, and

BEST BIOS PROGRAMMING AND DATA FOR EEPROM

Abstract: TRANSISTOR A117 flash "high temperature data retention" mechanism EEPROM retention testing DSASW0016486
Contextual Info: Reliability Considerations for Reprogrammable Nonvolatile Memories Reliability Considerations for Reprogrammable Nonvolatile Memories INTRODUCTION When acquiring a microcircuit, many considerations above and beyond the purchase price are important. Among these are quality, reliability, delivery, service, and product

24XX256

Abstract: DK-2750 PIC18LF4320
Contextual Info: TB072 FLASH Memory Technology: Considerations for Application Design Author: Rodger Richey Microchip Technology Inc. INTRODUCTION Many times, choosing a FLASH memory device is driven by which manufacturer has the cheapest offering. Regardless of its use as a stand-alone device or as

transistor 2002b

Contextual Info: Configuration Elements & Reliability Introduction Altera's broad range of program m able logic devices incorporates four types of configuration elements: EPRO M , EEPROM , FLASH, and SRAM . To ensure the highest level of device perform ance and reliability, Altera

wafer incoming

Abstract: EEPROM retention bake screening
Contextual Info: Configuration Elements & Reliability June 1996, ver. 3 Data Sheet Introduction Altera’s broad range of programmable logic devices PLDs incorporates four types of configuration elements: EPROM, EEPROM, FLASH, and SRAM. To ensure the highest level of device performance and reliability,

Contextual Info: Configuration Elements & Reliability June 1996, ver. 3 Data Sheet Introduction Altera’s broad range of programmable logic devices PLDs incorporates four types of configuration elements: EPROM, EEPROM, FLASH, and SRAM. To ensure the highest level of device performance and reliability,

atmel 438

Abstract: Atmel 546 atmel 446 ATMEL 1230 atmel 735 atmel 532 ATMEL 745 ATMEL 920 atmel 1044 ATMEL 1237
Contextual Info: Features • • • • • • • • • • • • • High Performance CMOS Technology Low Power Dissipation - Active and Standby Hardware and Software Data Protection Features DATA Polling for End of Write Detection High Reliability – Endurance: 104 Cycles

Contextual Info: REVISIONS LTR APPROVED DESCnPTWN REV SHEET REV SHEET REV STATUS OF SHEETS REV SHEET 10 11 14 12 13 15 16 17 18 19 PMCN/A STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUITS, MEMORY, DIGITAL, CMOS 2K X 8 EEPROM, MONOLITHIC SILICON

28C513

Abstract: qml-38535 28C512 5962-E079-07
Contextual Info: REVISIONS LTR DESCRIPTION DATE YR-MO-DA APPROVED A Changes in accordance with NOR 5962-R114-92. glg 92-01-22 Michael A. Frye B Changes in accordance with NOR 5962-R160-98. glg 98-08-06 Raymond Monnin C Boilerplate update and part of five year review. tcr

4431B

Abstract: smd marking 4431b 60395 5962-38267 28C010 qml-38535
Contextual Info: _ REVISIONS_ _ LTR_ DESCRIPTION_ DATE YR-HO-PA _ APPROVED A Add packages T and W. Add vendor CAGE 60395 as 93-06-29 M. A. Frye source of supply. Increase data retention to

AC243003

Abstract: 24c16 EEPROM sample code 93XX66A 24C16 serial eeprom 24C16 24LCXX 25LCXX AEC-Q100 MICROWIRE eeprom interface PIC 24C16
Contextual Info: Automotive Memory Products Serial EEPROM Powered for Automotive www.microchip.com/memory Microchip Serial Memory Products Microchip Technology has developed industry-leading processes for each step in the design, manufacturing and testing phases of its serial EEPROMs, and has become one of the most respected leaders in supply of these devices to the automotive

25LCXX

Abstract: 24c16 EEPROM sample code PIC 24C16 2x3 transistor 23X256 AEC-Q100 24C16 24LCXX 11XX040 AC243003
Contextual Info: Automotive Memory Products Serial EEPROM Powered for Automotive www.microchip.com/memory Microchip Serial Memory Products Microchip Technology has developed industry-leading processes for each step in the design, manufacturing and testing phases of its serial EEPROMs, and has become one of the most respected leaders in supply of these devices to the automotive

Contextual Info: PS-AT28C010 revision C MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K x 8-Bit PARALLEL EEPROM, MONOLITHIC SILICON Revision Written by Approved by Date C S.JAMES C. FERRE 03/01/08 1/24 PS-AT28C010 Rev C DOCUMENTATION CHANGE NOTICE Date of update Revision letter

ATMEL 0828

Abstract: at28c010 ATMEL Packing method EEPROM retention bake screening AT28C010-12DK-MQ AT28C010-12DK-SV
Contextual Info: PS-AT28C010 revision C MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K x 8-Bit PARALLEL EEPROM, MONOLITHIC SILICON Revision Written by Approved by Date C S.JAMES C. FERRE 03/01/08 1/24 PS-AT28C010 Rev C DOCUMENTATION CHANGE NOTICE Date of update Revision letter

Contextual Info: APPLICATION NOTE QUALITY AND RELIABILITY INFORMATION by the Micro Divisions INTRODUCTION We think that maintaining an optimal quality level is very important but we also believe that our customers contribute to the quality chain when they handle or program

EPROM retention bake

Abstract: mass flow meter evaluation kit
Contextual Info: APPLICATION NOTE QUALITY AND RELIABILITY INFORMATION by the Micro Divisions INTRODUCTION We think that maintaining an optimal quality level is very important but we also believe that our customers contribute to the quality chain when they handle or program our MCU devices This

development trends in car manufacture

Abstract: EPROM retention bake VR02105B
Contextual Info: APPLICATION NOTE QUALITY AND RELIABILITY INFORMATION by the Micro Divisions INTRODUCTION We think that maintaining an optimal quality level is very important but we also believe that our customers contribute to the quality chain when they handle or program