dallas date code FOR DS1230Y
Abstract: dallas 25010
Contextual Info: RELIABILITY MONITOR DS1230AB-200 JAN '00 Monitor DEVICE REVISION DATE CODE LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1230A B1 Module w/SMT 720 Fastech 9952 114146 28 QUANTITY READPOINT UNITS NO OF FAILS JOB_NO DESCRIPTION CONDITION 25005 SOLDERABILITY
|
Original
|
DS1230AB-200
DS1230A
MIL-STD-883-2003
MIL-STD-883-2016
60C/90%
DS1230YL-100
DS1230Y
dallas date code FOR DS1230Y
dallas 25010
|
PDF
|
DS1230AB
Abstract: ds1230ab date code
Contextual Info: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1230AB Jul-96 9619 H DALLAS DA079619AAA N/A 28 MODULE STRESS/JOB NO. READPOINT Sample Size/No. of Fails Storage Life 85°C, No Bias P-17808 48 Hr
|
Original
|
DS1230AB
Jul-96
DA079619AAA
P-17808
P-17872
P-17873
P-17807
P-17806
DS1230AB
ds1230ab date code
|
PDF
|
transistor 16870
Abstract: transistor HR DS1230AB P-16870 hr/transistor 16870
Contextual Info: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1230AB Jan-96 9538 H DALLAS DA067510AAA N/A 28 MODULE STRESS/JOB NO. READPOINT Sample Size/No. of Fails Storage Life 85°C, No Bias P-16812 48 Hr
|
Original
|
DS1230AB
Jan-96
DA067510AAA
P-16812
P-16869
P-16870
P-16811
P-16810
transistor 16870
transistor HR
DS1230AB
P-16870
hr/transistor 16870
|
PDF
|
P21256
Abstract: P22102 P22154 P22149 ds1302 dallas h 9740 P22021 P21308
Contextual Info: RELIABILITY MONITOR STRESS: TEMP CYCLE CONDITIONS: -40 TO 85°C MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. PACKAGE READ POINT QTY FAIL DS2250T Y JUN 98 P22125 9814 DALLAS 101397 SIP STICK 100 11 DS2250T Y JUN 98 P22125 9814 DALLAS
|
Original
|
DS2250T
P22125
DS1000
DS1210
P21256
P22102
P22154
P22149
ds1302 dallas
h 9740
P22021
P21308
|
PDF
|
28256 eeprom
Abstract: dallas date code FOR DS1230Y EEPROM 28256 QS257 28256 DS1230AB A14C DS1230Y
Contextual Info: DALLAS SEMI CO NDUC TO R CORP GTE D | SblMlBG □□□55SG □ | ¡1 Dallas Semiconductor w 2 S 6 K N onvolatiie SRAM FEATURES ra iU M G M IiW PIN CO N N EC TIO N S • Data retention in the absence o f V cc • Data is autom atically protected dur ing power loss
|
OCR Scan
|
5L1413D
0DG52SD
-23-lt-f
DS1230Y
DS1230AB
28-pin
100pF
QS257
DS1230A3
28256 eeprom
dallas date code FOR DS1230Y
EEPROM 28256
28256
DS1230AB
A14C
|
PDF
|
ds1230ab date code
Abstract: DS1230 EEPROM 28256 DS1230AB DS1230AB-70 DS1230ABP-70 DS1230Y DS1230Y-70 DS9034PC DS9034PCI
Contextual Info: 19-5635; Rev 11/10 DS1230Y/AB 256k Nonvolatile SRAM www.maxim-ic.com FEATURES • • PIN ASSIGNMENT 10 years minimum data retention in the absence of external power Data is automatically protected during power loss
|
Original
|
DS1230Y/AB
DS1230Y)
DS1230AB)
28-pin
MDT28
ds1230ab date code
DS1230
EEPROM 28256
DS1230AB
DS1230AB-70
DS1230ABP-70
DS1230Y
DS1230Y-70
DS9034PC
DS9034PCI
|
PDF
|
h 9740
Abstract: dallas date code ds12887 P21256 9735 h P21490 P2070 P22149 B1 9742 dallas date code DS80320
Contextual Info: RELIABILITY MONITOR STRESS: TEMP CYCLE CONDITIONS: -40 TO 85°C MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. PACKAGE READ POINT QTY FAIL DS2250 na DEC 97 P21100 9743 DALLAS 096841 SIP STICK 100 11 DS2250 na DEC 97 P21100 9743 DALLAS
|
Original
|
DS2250
DS2290
P21100
P20430
DS80320
P20461
h 9740
dallas date code ds12887
P21256
9735 h
P21490
P2070
P22149
B1 9742
dallas date code
|
PDF
|
DS1230Y-200 DALLAS
Abstract: dallas date code ds1230 dallas date code FOR DS1230Y ds1230Y date code DS1230y-200 battery date codes DS1230y-200 date codes DS1230 DS1230AB DS1230Y-120 DS1230AB-70
Contextual Info: DS1230Y/AB 256k Nonvolatile SRAM www.maxim-ic.com FEATURES • • PIN ASSIGNMENT 10 years minimum data retention in the absence of external power Data is automatically protected during power loss Replaces 32k x 8 volatile static RAM,
|
Original
|
DS1230Y/AB
DS1230Y)
DS1230AB)
28-pin
DS1230Y-200 DALLAS
dallas date code ds1230
dallas date code FOR DS1230Y
ds1230Y date code
DS1230y-200 battery date codes
DS1230y-200 date codes
DS1230
DS1230AB
DS1230Y-120
DS1230AB-70
|
PDF
|
ds13d12
Abstract: 9933 c
Contextual Info: 09/16/2004 RELIABILITY REPORT FOR DS1230AB, 28 Pin Module w/SMT Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292
|
Original
|
DS1230AB,
J-STD20A)
94-V0
MIL-STD-883-2012
60C/90%
ds13d12
9933 c
|
PDF
|
P-16996
Abstract: p17531 dk52 P-16887 P-17318 P-16849 P-18414 P-16876
Contextual Info: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-96 Sep-96 Feb-96 Aug-96 Feb-96 May-96
|
Original
|
DS1302)
Mar-96
Sep-96
Feb-96
Aug-96
May-96
Jun-96
P-16996
p17531
dk52
P-16887
P-17318
P-16849
P-18414
P-16876
|
PDF
|
dk52
Abstract: P-15782 DK53 P15890 P-16795 148259 p16038 P-17201 C19517 P-15837
Contextual Info: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320
|
Original
|
DS1302)
DS1302
DS21S07A
dk52
P-15782
DK53
P15890
P-16795
148259
p16038
P-17201
C19517
P-15837
|
PDF
|
p15890
Abstract: P-16044 CARSEM
Contextual Info: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320
|
Original
|
DS1302)
Mar-96
Jan-95
Mar-95
May-95
Jul-95
Sep-95
Dec-95
p15890
P-16044
CARSEM
|
PDF
|
P1653
Abstract: P15890 dallas date code ds12887
Contextual Info: RELIABILITY MONITOR SUMMARY DATA STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320
|
Original
|
DS1302)
Mar-96
Jan-95
Mar-95
May-95
Jul-95
Sep-95
Dec-95
P1653
P15890
dallas date code ds12887
|
PDF
|
dk52
Abstract: P-16890 17872 p1908 P1875 P-18701
Contextual Info: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-96 Sep-96
|
Original
|
DS1302)
Mar-96
Sep-96
Feb-96
Aug-96
Nov-96
Feb-97
May-96
dk52
P-16890
17872
p1908
P1875
P-18701
|
PDF
|
|
|
DK53
Abstract: dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M
Contextual Info: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT MONITOR DATE DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 Mar-96 Sep-96
|
Original
|
DS1302)
DS1302
DS1868
DS21S07A
DS80C320
DK53
dk52
P-17422
P19500
P1908
P-17411
DN546229ATA
DS1000M
|
PDF
|
DS1868
Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
Contextual Info: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1
|
Original
|
DS1302
DS1868
DS21S07A
DL6-11
c19643
dallas date code ds12887
P1788
P-18182
dk52
|
PDF
|
dallas ds80c320 high speed micro guide
Abstract: transistor bf 175 DS1640
Contextual Info: TABLE OF CONTENTS Short-Form Catalog T im e kee pin g . 1 M emory P ro d u
|
OCR Scan
|
|
PDF
|
dallas ds80c320 high speed micro guide
Abstract: DS1640
Contextual Info: 'w - l J J t f °0 _72 , TABLE OF CONTENTS Short-Form Catalog T im e k e e p in g .1 M em ory P rodu cts .
|
OCR Scan
|
|
PDF
|
ELAP CM 72
Abstract: ELAP cm 76 fm transmitter 2KM documentation DDU-66F-XXX ELAP CM 140 hp laptop battery pack pinout semi catalog EB 203 D maxim evaluation kit touch dimmer TC 306 S
Contextual Info: Data B ook C o n t e n t s •S h o r t • F irst • S a l e s -Fo -Pa O rm g e C atalog Data S h e e t s ffic es CD •C ROM C o n ten ts: o m p l e t e Data S an d A pplication fo r A l l • U s e r 's G P h e e t s n o t e s r o d u c ts uides p. -••x;. < ~x3xxr r -> ~' ' fP 5 > g? 3
|
OCR Scan
|
|
PDF
|
DS1868
Abstract: LM 4440 AUDIO AMPLIFIER CIRCUIT DS1230y-200 battery date codes circuit diagram laptop motherboard Scans-049 texas instrument catalog 74ls DS1666-50 st c031 s1040 diode
Contextual Info: S ystem E x t e n s i o n Data Book CPU Supervisors Digital Potentiometers Silicon Timed Circuits Thermal Products DALLAS SEMICONDUCTOR Copyright 1994 Dallas Semiconductor Corporation, Dallas, Texas All Rights Reserved. Circuit diagrams are included to illustrate typical semiconductor applications. Complete information sufficient for
|
OCR Scan
|
28-PIN
DS9003
DS1868
LM 4440 AUDIO AMPLIFIER CIRCUIT
DS1230y-200 battery date codes
circuit diagram laptop motherboard
Scans-049
texas instrument
catalog 74ls
DS1666-50
st c031
s1040 diode
|
PDF
|