DIGITAL IC TESTER Search Results

ic 74138

Abstract: IC 7402, 7404, 7408, 7432, 7400 ic 74139 IC 74147 IC 74373 74148 IC IC 74374 ic 7408, 7432, 7404, 7400, 7433, 7486, 74266 IC 74245 74189
Contextual Info: LEAPER-1 HANDY DIGITAL IC TESTER Supported Devices Features EMC Standards 1.Easy-operating Tester, particularly per 89/336/EEC be designed for the Digital IC 2.Supported Device : 74 / 40 / 45 / 41 / 44 Serial. 3.Small, portable, light and powersaving, usable with batteries.

Digital IC tester

Abstract: MC140 Datasheet IC 244, 245, 373, 374 ic 8255 z80 8255 MC140 LIST OF 74 IC SERIES 8253/8254 IC 2816 IC 8155
Contextual Info: IC Testers VPL-DICT Digital IC Tester VPL-DICT is aHand-Held version, designed as a powerful tool for manufacturers, servicing engineers, R&D personnels to test a wide range of Digital IC's. FEATURES l Tests most of the 6 to 40 pin ICs in DIP package. The list

TCXO KSS 12,8 mhz

Abstract: KSS tcxo 12.8MHz TCXO KSS 1bw12 TA31183BFN
Contextual Info: TO SH IBA TA31183BFN TOSHIBA BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC T AB 1 1 8 3 B F N IF Digital Mobile Radio IC with Built-in Filter This intermediate frequency IF IC with built-in channel selection filter is designed for use in digital mobile radio

575A digital ic tester

Abstract: MC3400
Contextual Info: Data Sheet Handheld IC Testers Models 570A and 575A Model 570A analog and model 575A digital IC testers are compact, handheld, battery powered testers offering advanced functionality and ease of use. The 2-line x 16 character dot matrix LCD shows the result

IC-3426

Abstract: MIXER MARK 210 HP8447F RSSI mixer 455 IC-8949
Contextual Info: DATA SHEET BIPOLAR ANALOG INTEGRATED CIRCUIT µPC8001 IF AMPLIFIER IC WITH ON-CHIP MIXER FOR DIGITAL CELLULAR PHONES The µPC8001 is a 3-volt IF amplifier IC with an on-chip mixer developed for digital cellular phones. The µPC8001 consists of a high-sensitivity limiter amplifier with an input frequency of 455 kHz, a high-speed

32-PIN

Abstract: DS2172 PS24 PS26 PS27 PS28 PS29 PS30 335 PR10
Contextual Info: DS2172 1 DALLAS s e m ic o n d u c t o r DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT FEATURES • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica­ tions systems r • Operates at speeds from DC to 52 MHz

Contextual Info: DALLAS s e m ic o n d u c t o r DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT FEATURES • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica­ tions systems “û h ( 32 • Operates at speeds from DC to 52 MHz

Contextual Info: DS2172 PRELIMINARY D A LLA S DS2172 Bit Error Rate Tester BERT s e m ic o n d u c t o r PIN ASSIGNMENT FEATURES • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica­ tions systems QÛOWÛOÛQ H H H - > > ŒŒC C

RN21

Contextual Info: DA LLA S DS2172 Bit Error Rate Tester BERT s e m ic o n d u c t o r FEATURES PIN ASSIGNMENT • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communica­ tions systems hO hQ hO >C O> Oi iO r Ûi Qr J_LLLU JJ_

Contextual Info: Model 570 Linear IC Tester Now integrated circuits are easily identified and tested with B+K Precision’s new Handheld IC Testers. Two models, one for linear, one for digital ICs, are available, both with extensive built-in libraries. Small, handheld design is battery powered for portability in the field or

Contextual Info: n A I I A S s e m ic o n d u c to r FEATURES DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT • G enerates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica­ tions systems • O perates at speeds from DC to 52 MHz

Contextual Info: n A I I A S s e m ic o n d u c to r FEATURES DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT • G enerates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica­ tions systems • O perates at speeds from DC to 52 MHz

Contextual Info: . o o Ci »hI L10C23 64-bit Digital C orrelator □ FV IC E S IN C O R P Q R A T F D FEATURES □ High Speed 50 MHz , Low Power (125 mW ), CMOS 64-bit Digital Correlator □ Replaces Fairchild TDC1023 / TMC2023 □ Bit Can be Selectively Masked □ Three-State Outputs

Contextual Info: L10C23 64-bit Digital Correlator D E V IC E S IN C O R P O R A T E D FEATURES □ High Speed 50 MHz , Low Power (125 mW ), CMOS 64-bit Digital Correlator □ Replaces Fairchild TDC1023 / TMC2023 □ Bit Can be Selectively Masked □ Three-State Outputs □ Available 100% Screened to

BEC26

Abstract: BEC10 th02 DS2172 PS24 PS25 PS26 PS27 PS28 PS29
Contextual Info: DS2172 DALLAS s e m ic o n d u c t o r FEATURES DS2172 Bit Error R a te T e s te r B E R T PIN ASSIGNMENT 1G enerates/D etects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica­ tions system s 1 — < O Q O W O O O Q

schematic diagram atx Power supply 500w

Abstract: pioneer PAL 012A 1000w inverter PURE SINE WAVE schematic diagram 600va numeric ups circuit diagrams winbond bios 25064 TLE 9180 infineon smsc MEC 1300 nu TBE schematic diagram inverter 2000w DK55 circuit diagram of luminous 600va UPS
Contextual Info: QUICK INDEX NEW IN THIS ISSUE! Detailed Index - See Pages 3-24 Digital Signal Processors, iCoupler , iMEMS® and iSensor . . . . . 805, 2707, 2768-2769 Connectors, Cable Assemblies, IC Sockets . . . . . . . . . . . 28-568 RF Connectors . . . . . . . . . . . . . . . . . . . . . . Pages 454-455

TDC1023

Abstract: U/25/20/TN26/15/850/TDC1023/TM
Contextual Info: L ô Ô f Ô L 1 0 C 2 3 64-bit Digital Correlator D E V IC E S IN C O R P O R A T E D 'RIPTION □ H igh Speed 50 MHz , Low Pow er (125 mW), CMOS 64-bit Digital C orrelator □ Replaces TRW /R aytheon TDC1023/TMC2023 □ □ □ □ Bit Can be Selectively M asked

DIGITAL IC TESTER

Abstract: ic tester ttl IC TESTER ABI Electronics
Contextual Info: Analogue and Digital Handheld IC Testing of circu n O S2 R Extensive Built-in Test Libraries The LinearMaster Compact Professional includes all common analogue ICs including op-amps, comparators, voltage regulators, voltage references, analogue switches & multiplexers, optoisolators & couplers and audio ICs.

DIGITAL IC TESTER

Abstract: ic tester LinearMaster ttl IC TESTER
Contextual Info: Analogue and Digital Handheld IC Testing State of the Art Technology Very large scale integration allows advanced functionality and ease of use to be combined in the Compact Range’s hand-held, battery operated units. The 2 line x 16 character dot matrix LCD shows

DIGITAL IC TESTER

Abstract: ic tester LinearMaster ttl IC TESTER usb connector 2076 "ABI Electronics"
Contextual Info: Analogue and Digital Handheld IC Testing For DIL and SMT devices it n RS2 Extensive Built-in Test Libraries The LinearMaster Compact Professional includes all common analogue ICs including op-amps, comparators, voltage regulators, voltage references, analogue switches & multiplexers, optoisolators & couplers and audio ICs.

3z fuse

Abstract: PAL VIHH programming pulse PAL20L8A PAL20R4A MASK L-M-38510
Contextual Info: M I L - M - 38510/60 5 USAF 30 August 1984 M I LITARY SPECIFICATION MI CR OCIRCUITS, DIGITAL, BIPOLAR PR OG RAMMABLE LOGIC, MONO LI TH IC SILICON This specif ic at io n is approved for use by the De pa r t m e n t of the Air Force, and is available for use by all Departments and Agencies of the Depa rt me nt

5170 PH 51

Abstract: DD330 VES 470M ml232 ICL 4050 LTPD sm 126 ao 2FJ MARKING
Contextual Info: . M I L- M- 38 51 0/ 23 5C I JUALIF IC A T ION I 25 Mav 1984 I 1 S U P E R S E D ING-M I L- M- 38 51 0/ 23 5B 24 May 1982 REQU IR EM EM T I REMOVED I MILITARY SP ECIFICATION MICROCIRCUIT, DIGITAL, MOS, 4096 BIT RANDOM A C CE SS MEMORY M ONO LI TH IC SILICON

DB50 connector

Abstract: FB100 FB100A CD 4501 FB2000A IEEE488 RS-449 prbs noise generator OP210 IEEE-448
Contextual Info: Fastbit FB100A BER Test System Highly flexible BER test system for serial and parallel testing over a wide range of interfaces from TTL to optical. Addresses system, sub-system and component testing during development and compliance verification in IC, cable, satellite, cellular, terrestrial, CATV, digital TV and other physical

DB50 connector

Abstract: DB50 FB100 IEEE-448 RJ45 modular jack FB100A mds wireless broadband specifications tv pattern generator FB2000A IEEE488
Contextual Info: Fastbit FB100A BER Test System Highly flexible BER test system for serial and parallel testing over a wide range of interfaces from TTL to optical. Addresses system, sub-system and component testing during development and compliance verification in IC, cable, satellite, cellular, terrestrial, CATV, digital TV and other physical