LTPD Search Results

LTPD245

Abstract: IFD501-01SK-E LTPD345 CAPD345 CAPD245 PTD50P01-E IFD501-01UK-E auto-cutter
Contextual Info: LTPD/CAPD Series Low Voltage Printer Mechanisms Small LTPD/CAPD series mechanisms free up critical design real estate. The new mechanisms provide a smaller overall form factor, innovative angled paper guide requiring less depth, and a smaller pitch flexible print circuit FPC cable.

Y parameters of transistors

Abstract: SAMPLING PLAN
Contextual Info: Philips Semiconductors Product specification Microwave Transistors General BATCH RELEASE TESTS FOR GRADE “X” AND "Y” EQUIVALENTS Group B; note 1. INSPECTIONS MIL STD 750 METHOD CONDITIONS SAMPLING PLAN LTPD<2> SMALL LOT QUALITY CONFORMANCE INSPECTION

panasonic date code

Abstract: packaging label for panasonic
Contextual Info: １３ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION − ５ ＬＮ４１７ＹＰＨ ● 信頼性保証基準は MIL-STD-19500H LTPD: 15% です。 ● Reliability Guarantee Criterion (MIL-STD-19500H LTPD: 15%) 項 目 試 験 条 件 Item Test Condition

panasonic label

Abstract: LEAD FRAME SURFACE MOUNT MOUNTING OF SURFACE MOUNT COMPONENTS panasonic date code SCH5027E-NW ultrasonic distance circuit design Ultrasonic washing vco 3 output ULTRASONIC 1414C LED SPECIFICATION
Contextual Info: １３ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION − ５ ＬＮ３４２ＧＰＸ ● 信頼性保証基準は MIL-STD-19500H LTPD: 15% です。 ● Reliability Guarantee Criterion (MIL-STD-19500H LTPD: 15%) 項 目 試 験 条 件 Item Test Condition

Contextual Info: SMD TYPE LED Suntan Reliability Test Items And Conditions The reliability of products shall be satisfied with items listed below. Confidence level : 90% LTPD : 10% Test Items Test Conditions Quantity Judging Criteria 15 Solderable Area Over 95% 11 C=0 & I*

panasonic packing label

Contextual Info: ＬＮ２８９ＣＵＱ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION ● 信頼性保証基準は MIL-STD-19500H LTPD: 15% です。 ● Reliability Guarantee Criterion (MIL-STD-19500H LTPD: 15%) 項 目 試 験 条 件 Item Test Condition 連 続 動 作 寿 命

MOUNTING OF SURFACE MOUNT COMPONENTS

Abstract: panasonic label Matsua LED panasonic date code
Contextual Info: １３ − ２ ＬＮ３２４ＧＰＸ− Ｂ Jan 30, 2004 Panasonic 鹿児島松下電子株式会社／Kagoshima Matsushita Electronics Co.,Ltd. １３ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION − ５ ＬＮ３２４ＧＰＸ−(Ｂ) ● 信頼性保証基準は(MIL-STD-19500H LTPD: 15%)です。

Contextual Info: ７ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION − ５ ＬＮ２１７ＲＰＨ ● 信頼性保証基準は MIL-STD-19500H LTPD: 15% です。 ● Reliability Guarantee Criterion (MIL-STD-19500H LTPD: 15%) 項 目 試 験 条 件 Item Test Condition

MIL-STD-19500H

Abstract: diode 611
Contextual Info: １３ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION − ５ ＬＮ４５２ＹＰＸ ● 信頼性保証基準は MIL-STD-19500H LTPD: 15% です。 ● Reliability Guarantee Criterion (MIL-STD-19500H LTPD: 15%) 項 目 試 験 条 件 Item Test Condition

date code panasonic

Abstract: panasonic date code
Contextual Info: １３ − ２ ＬＮ４８ＹＣＰＸ Nov 27, 2003 Panasonic 鹿児島松下電子株式会社／Kagoshima Matsushita Electronics Co.,Ltd. １３ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION − ５ ＬＮ４８ＹＣＰＸ ● 信頼性保証基準は MIL-STD-19500H LTPD: 15% です。

th 20594

Abstract: ix 0640 93459 1515 38940 74*214 15351 75542 83450 2N 8904 jis z 0237
Contextual Info: ATTACHED TABLES IX. ATTACHED TABLES 1. ATTACHED TABLES 1.1 AQL SAMPLING TABLE 1.2 LTPD SAMPLING TABLE 1.3 PROBABILITY DENSITY OF NORMAL DISTRIBUTION 1.4 UPPER PROBABILITY OF NORMAL DISTRIBUTION 1.5 PERCENT POINTS OF NORMAL DISTRIBUTION 1.6 POISSON DISTRIBUTION PROBABILITY

MIL-STD-750 METHOD 2026

Abstract: high temperature reverse bias MIL-STD-750 MIL STD 750
Contextual Info: Continental Device India Limited An ISO/TS 16949, ISO 9001 and ISO 14001 Certified Company Table I : Types and Details of Reliability Tests Sl. Test Test Condition Reference Method Sample LTPD Size Acc No. No 1. High Temperature Storage Ta = Tj max. Time: 1000 hrs

panasonic packing label

Contextual Info: １３ − ２ ＬＮ８４２ＲＰＸ Jan 28, 2004 Panasonic 鹿児島松下電子株式会社／Kagoshima Matsushita Electronics Co.,Ltd. １３ 信頼性保証基準／RELIABILITY GUARANTEE CRITERION − ５ ＬＮ８４２ＲＰＸ ● 信頼性保証基準は MIL-STD-19500H LTPD: 15% です。

TY 2016 thyristor

Abstract: Toshiba thyristors TOSHIBA Thyristor
Contextual Info: 5. R ELIA BILITY OF SEM ICONDUCTOR 5.1 to pro ducts are evaluated and when quality and reliability are confirm ed, next step o f the trial mass production proceeds. At the trial mass production step, stability of m anufacturing processes is evaluated p repo n­

DSE12*101

Contextual Info: Technical Data Sheet Chip LED with Right Angle Lens 12-21UBC/C430/TR8 Features ԦPackage in 8mm tape on 7ϛdiameter reel. ԦCompatible with automatic placement equipment. ԦCompatible with infrared and vapor phase reflow solder process. ԦMono-color type.!!

75V 150mA Diode

Contextual Info: COMPUTER DIODE 1c i r 150mA Switching Diode vy i" 1N4153, JAN, JANTX & JANTXV I N 4153 1N4534, JAN, JANTX & JANTXV 1N4534 FEATURES • • • • DESCRIPTION This device is particularly suited to applications where tightly controlled forward characteristics and fast recovery

4N23

Contextual Info: 4N22A, 4N23A, 4N24A OPTOCOUPLERS D 3 0 5 5 , AUGUST 1987 JEDEC REGISTERED DEVICES GALLIUM ARSENIDE DIODE INFRARED SOURCE OPTICALLY COUPLED TO A HIGH-GAIN N-P-N SILICON PHOTOTRANSISTOR • Both Input and Output Circuits Are Isolated from the Can • JAN, JAN TX, JAN TXV Versions Available

SCP6G

Contextual Info: Specification: TS-S08D192A February, 2009 Technical specification for Small Form Factor Pluggable SFP OC-3 (155.52Mbps) Sumitomo Part Number Function SCP6G11-GL-# W E LR-1, 1310nm, 40km SCP6G61-GL-# W E LR-2, 1550nm, 80km Sumitomo Electric reserves the right to make changes in this specification without prior notice.

Contextual Info: Technical Data Sheet Reverse Package Chip LED 24-21/BHC-AP1Q2/2A Features ․Package in 8mm tape on 7〞diameter reel. ․Compatible with automatic placement equipment. ․Compatible with infrared and vapor phase reflow solder process. ․Mono-color type.

kt5050qb10zsrv

Abstract: lm product
Contextual Info: 5.0x5.0mm SMD LED WITH CERAMIC SUBSTRATE PRELIMINARY SPEC Part Number: KT-5050QB10ZS-RV Blue ATTENTION OBSERVE PRECAUTIONS FOR HANDLING ELECTROSTATIC DISCHARGE SENSITIVE DEVICES Absolute Maximum Ratings at TA = 25°C Parameter Symbol Value Unit IF 350 mA Peak Forward Current [2]

INCOMING RAW MATERIAL INSPECTION chart

Abstract: INCOMING RAW MATERIAL INSPECTION form INCOMING RAW MATERIAL INSPECTION INCOMING RAW MATERIAL INSPECTION method INCOMING RAW MATERIAL flowchart LINEAR TECHNOLOGY mark code INCOMING MATERIAL FLOW PROCESS INCOMING RAW MATERIAL aql incoming inspection mil-std-883 2015 Gold Ball Bond Shear
Contextual Info: Pg. 1 of 3 ATTACHMENT 2. ASSEMBLY FLOWCHART INCOMING Vendor: Product: Package: Location of Wafer Fab: Assembly: Final Test: Q.C. Test Source Accept Test: Quality Contact: Linear Technology BIPOLAR PROCESS TO-92 Linear Technology Carsem Maylasia Linear Technology

6948

Abstract: MAX3950 MAX3950EGK
Contextual Info: MAX3950EGK Rev. A RELIABILITY REPORT FOR MAX3950EGK PLASTIC ENCAPSULATED DEVICES October 14, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl

KT-5050ZG24ZS-RV

Contextual Info: 5.0x5.0mm SMD LED WITH CERAMIC SUBSTRATE PRELIMINARY SPEC Part Number: KT-5050ZG24ZS-RV Green ATTENTION OBSERVE PRECAUTIONS FOR HANDLING ELECTROSTATIC DISCHARGE SENSITIVE DEVICES Absolute Maximum Ratings at TA = 25°C Parameter Symbol Value Unit IF 150 mA

Contextual Info: 3.5X3.5mm SMD LED WITH CERAMIC SUBSTRATE PRELIMINARY SPEC Part Number: KT-3535SEL1ZS-RV Hyper Orange ATTENTION OBSERVE PRECAUTIONS FOR HANDLING ELECTROSTATIC DISCHARGE SENSITIVE DEVICES Absolute Maximum Ratings at TA = 25°C Parameter Symbol Value Unit IF