D65012GF
Abstract: d65031 d65012 NEC JAPAN d65632 nec 2401 D65022L d65632 d65013gf d65025l D65025
Contextual Info: NEC ELECTRONICS INC. July 1999 TRQ-99-07-330 QUARTERLY ASIC RELIABILITY REPORT This report contains reliability data on the following Application-Specific Integrated Circuit families assembled by NEC Electronics Inc. in Roseville, California fabricated by NEC Japan or NEC Electronics Roseville as specified .
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trq-99-07-330d83901s1320-pind65012gf+9d65031d65012nec japan d65632nec 2401d65022ld65632d65013gfd65025ld65025
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MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR
Abstract: uPD65837 uPD65869 X17512 upd65839 RF Transistors Ceramic MARKING F25 marking code F302 535 D65841 uPD65851 X46358
Contextual Info: Design Manual CMOS-8L Family CMOS Gate Array Ver. 5.0 Document No. A12158EJ5V0DM00 5th edition Date Published June 1999 N CP(K) 1997, 1998 Printed in Japan 1 [MEMO] 2 Design Manual A12158EJ5V0DM00 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
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a12158ej5v0dm00semiconductor2/9044marking code n-channel mos field effect transistorupd65837+8upd65869x17512upd65839rf transistors ceramic marking f25marking code f302 535d65841upd65851x46358
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d65641gd
Abstract: D65656 D65801GD D65806 D65808 D65640GC nec 44-pin LQFP d65611gb D65625GC d65626gf D65672GL
Contextual Info: NEC ELECTRONICS INC. October 1999 TRQ-99-10-335 QUARTERLY ASIC RELIABILITY REPORT This report contains reliability data on the following application-specific integrated circuit families fabricated and assembled by NEC Japan BiCMOS-4/4A BiCMOS-5 ECL-2 ECL-3/3A/3B
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trq-99-10-335304-pind65641gdd65656+8d65801gdd65806d65808d65640gcnec 44-pin lqfp d65611gbd65625gcd65626gfd65672gl
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