CD54HCT242 Search Results

74HCT243M

Contextual Info: Technical Data CD54/74HC242, CD54/74HCT242 CD54/74HC243, CD54/74HCT243 File Num ber 1488 High-Speed CMOS Logic F U N C TIO N A L DIAGRAM Quad-Bus Transceiver with 3-State Outputs Type Features: • Typical pro p a g a tio n delay A -— •B o f 7 ns @ Vcc = 5 V

Contextual Info: High-Reliabiiity High-Speed CMOS Logic ICs CD54HC240/3A CD54HCT240/3A Switching Speed Lim its with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (C l = 50 pF, Input t„ t, = 6 55 C to +125 1

74HCT242

Contextual Info: Technical Data CD54/74HC242, CD54/74HCT242 CD54/74HC243, CD54/74HCT243 File Num ber 1488 High-Speed CMOS Logic FUNCTIONAL DIAGRAM Quad-Bus Transceiver with 3-State Outputs Type Features: • Typ ical p ro p a g a tio n delay A-— -B o f 7 ns @ Vcc = 5 V

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC241/3A CD54HCT241/3A Burn-ln Test-Circuit Connections Static CD54HC/HCT241 Dynamic CD54HC/HCT241 OPEN 3,5,7,9,12, 14,16,18 Use Static II lo r /3A burn-in and Dynam ic for Life Test. STATIC BURN-IN I GROUND

54HC

Contextual Info: High-Reliability High-Speed C M O S Logic ICs CD54HC241/3A CD54HCT241/3A Burn-ln Test-Circuit Connections Static CD54HC/HCT241 Dynamic CD54HC/HCT241 OPEN 3,5,7,9,12, 14,16,18 Use Static II lo r /3A burn-in and Dynamic for Life Test. STATIC BURN-IN I GROUND

CD74HC242

Abstract: G0177 74HC242
Contextual Info: “ 5 Z -5 Ì-O C Technical Data. CD54/74HC242, CD54/74HCT242 CD54/74HC243, CD54/74HCT243 HARRIS SEMICOND SECTOR 27E D File Number 1488 I 4302271 G017711 2 ES HAS High-Speed CMOS Logic FUNCTIONAL DIAGRAM . , . l u 0 ^ 3 1 11 BO Quad-Bus Transceiver with

m3033

Contextual Info: 37E » • 4305271 OGaSTâb 0 IH AS .Hlgh-Reliability High-Speed CMOS Logic IÇs HARRIS SEHÏC0ND SECTOR Switching Sp@€d Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = SO pF, Input t, t, = 6 ns) 25° C CHARACTERISTIC SYMBOL

Contextual Info: 37E D - M303371 0GB5R3» •. «HAS HARRIS SEMICONS SECTOR Burn-In Test-Circuit Connections Static CD54HC/HCT241 Dynamic CD54HC/HCT241 -p s 2 -0 7 CD54HC241/3A T 'S i- S l CD54HCT241/3A Use Static II for /3A burn-in and Dynamic tor Life Test. STATIC BURN-IN 1

CD74HC4063E

Abstract: cd74hct192e C074HC377E CD74HC40S1E C074HC132E CD74HCT4017E CD74HC643E C074HC174E CD74HCT563e rca CD54HCT4094F
Contextual Info: The QMOS Product Line RCA also offers the QM OS series of high-speed CMOS logic integrated circuits which include an extensive line of products that are pin compatible with many existing bipolar 54/74LSTTL and CM OS 4000 series of digital logic types. The new QM OS IC ’s provide high-speed