ADATE304 Search Results

DAC16

Abstract: PRBS31 BC842
Contextual Info: 200 MHz Dual Integrated DCL with Level Setting DACs, Per Pin PMU, and Per Chip VHH ADATE304 FEATURES GENERAL DESCRIPTION Driver 3-level driver with high-Z mode and built-in clamps Precision trimmed output resistance Low leakage mode typically <10 nA Voltage range: up to −2.0 V to +6.0 V

Contextual Info: 200 MHz Dual Integrated DCL with Level Setting DACs, Per Pin PMU, and Per Chip VHH ADATE304 FEATURES GENERAL DESCRIPTION Driver 3-level driver with high-Z mode and built-in clamps Precision trimmed output resistance Low leakage mode typically <10 nA Voltage range: up to −2.0 V to +6.0 V

Contextual Info: 200 MHz Dual Integrated DCL with Differential Drive/Receive, Level Setting DACs and per pin PMU ADATE304 Preliminary Technical Data FEATURES GENERAL DESCRIPTION Driver 3 level driver with high-Z mode and built-in clamps Precision trimmed output resistance

ADG609

Abstract: ADATE207 ADATE303 ADATE209 AD53040 AD53500 ADATE205 ADATE206 AD5523 adr441
Contextual Info: Automatic Test Equipment Solutions Analog Devices provides a complete portfolio of ATE signal chain solutions to meet today’s demanding SOC, DRAM, and flash memory tester applications. At the same time, we continue to develop the technologies required for the

LFCSP-64

Abstract: ADATE207 ADATE209 ADR440 adg508f LFCSP ADATE303 AD5523 AD53500 ADATE205
Contextual Info: ATE（自動試験装置）ソリューション アナログ・デバイセズは今日の高度な SOC、DRAM、 フラッシュ・メモリ用テスタ・アプリケーション向けに ATE シグナル・チェーン・ソリューション製品を