A12I Search Results

Contextual Info: LH53517 FEATURES CMOS 512K 64K x 8 MROM PIN CONNECTIONS • 65,536 words x 8 bit organization • Access time: 150 ns (MAX.) TOP VIEW 28-PIN DIP 28-PIN SOP S • Low-power consumption: Operating: 165 mW (MAX.) A15C 1• N 28 □ V qc A12IZ 2 27 Zl a 14 a 7C

Contextual Info: CMOS 8M 1M x 8 MROM FEATURES • 1,048,576 words x 8 bit organization • Access time: 120 ns (MAX.) PIN CONNECTIONS 32-PIN DIP 32-PIN SOP TOP VIEW 1 • 32 Zl Vcc A ^ IZ 2 31 Zl a 18 A1 5 C 3 30 □ A12IZ 4 29 □ A 14 A7C 5 28 Zl a 13 Aig IZ • Power consumption:

LVTH18514

Abstract: LVTH182514 SN54LVTH182514 SN54LVTH18514 SN74LVTH182514 SN74LVTH18514 78 hkc
Contextual Info: SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 D D D D D D D D D D Members of the Texas Instruments TI SCOPE  Family of Testability Products

Contextual Info: QPRO XQ4000XL Serles QML flX IU N X High-Reliablllty Field Programmable Gate Arrays May 19, 1998 Version 1.0 XG4QQQX Series Features • • • • • • • • • • • • • • Certified to MIL-PRF-38535 Appendix A QML (Qualified Manufacturer Listing)

Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B - JULY 1996 - REVISED JUNE 1997 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments

bv228

Abstract: S1C33210 S1C33L01 MF1517-01 CP4D
Contextual Info: MF1517-01 CMOS 32-BIT SINGLE CHIP MICROCOMPUTER S1C33210 Technical Manual S1C33210 PRODUCT PART S1C33210 FUNCTION PART NOTICE No part of this material may be reproduced or duplicated in any form or by any means without the written permission of Seiko Epson. Seiko Epson reserves the right to make changes to this material without notice.

Contextual Info: Advance Data Sheet June 1992 ^ B A T s iT ^ ^ ^ M ic ro e le c tro n ic s ATT3000 Series Military Field-Programmable Gate Arrays Features • User-programmable gate array ■ Low-power, CMOS, static memory technology ■ Standard product; 100% factory tested

Contextual Info: IM P O R T A N T N O TIC E All new designs should use XC3000A or XC3100A. Information on XC3000 and XC3100 is presented here as reference for existing designs. £ x il in x XC3000, XC3000A, XC3000L, XC3100, XC3100A Logic Cell Array Families Product Description

3771

Abstract: 3771 ic 8 pin
Contextual Info: LOW POWER 3V CMOS SRAM 1 MEG 64K x 16-BIT ADVANCE INFORMATION IDT71V016L Integrated Device Technology, Inc. FEATURES: DESCRIPTION: • • • • • • • The ID T71V016L is a 1,048,576-bit very low-pow er Static RAM organized as 64K x 16. It is fabricated using ID T’s highreliability CMOS technology. This state-of-the-art technology,

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SN54ABT18504

Abstract: SN74ABT18504
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

smd diode code a6I

Abstract: A1s smd TRANSISTOR 4c7 SMD grid tie inverters circuit diagrams ATT3000 grid tie inverter schematics n993 smd transistor A1s ATT3020 ATT3042
Contextual Info: Data Sheet October 1993 -— s u A T « T — M l * Microelectronics ATT3000 Series Field-Programmable Gate Arrays -50, -70, -100, -125, and -150 MHz Features Description • High performance—up to 150 MHz toggle rates The CMOS ATT3000 Series Field-Programmable Gate

SN54ABT18504

Abstract: SN74ABT18504 A14O
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

GM72V661641

Contextual Info: Preliminary G M 7 2 V 6 6 1 6 4 1 DI/DLI L G S e m ïc o n C o .,L td . Description TheGM72V661641 DI/DLIis a synchronous dynamic random access memory comprised of 67,108,864 memory cells and logic including input and output circuits operating synchronously by referring to the positive

Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B – JULY 1996 – REVISED JUNE 1997 D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

Contextual Info: CMOS 32-BIT SINGLE CHIP MICROCOMPUTER S1C33301 Technical Manual NOTICE No part of this material may be reproduced or duplicated in any form or by any means without the written permission of Seiko Epson. Seiko Epson reserves the right to make changes to this material without notice. Seiko Epson does not assume any

M3P1

Abstract: KD 2107 X3032
Contextual Info: XC3000, XC3000A, XC3000L, XC3100, XC3100A Logic Cell Array Families £ Product Description Features • Complete XACT Development System - Schematic capture, automatic place and route - Logic and timing simulation - Interactive design editor for design optimization

Contextual Info: YPQfiQflR K Military Logic Cell Array Product Specification. S e e Note 1. FEATURES Part Number • M IL-S T D -883 Class B Processing. Complies with paragraph 1.2.1 • Field-programmable gate array • Low power CMOS static memory technology Logic Capacity

A18I

Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

PLCC52

Abstract: 47a42
Contextual Info: U62H824 Fast 8K x 24 SRAM Description Features F 196 608 bit static CMOS RAM F 35 ns Access Time F Fully static Read and Write operations F Equal address and chip enable access times F Single bit on-chip address multiplexer F Active high and active low chip enable inputs