Part Number
    Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    EQR2012BA Search Results

    EQR2012BA Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    MAS-5010

    Abstract: 53368 62212 ETS500 119185
    Contextual Info: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA


    Original
    rm2012xw-qmlv6354ireqr2012baem16383e+8jcpac0107h4381g019e-128mas-50105336862212ets500119185 PDF

    Hi-rel 8936

    Abstract: 45288 2167.1 MAS50 MAS-5010 1764 689 74845 8195 82583 8533
    Contextual Info: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA


    Original
    rm2012xw-qmlv6354ireqr2012baem16372s1+12jcpac0107h4385k019hi-rel 8936452882167.1mas50mas-50101764 689748458195825838533 PDF