74F40 Search Results

74F401

Abstract: 74F401PC 74F401SC CRC-12 CRC-16 M14A MS-001 N14A CRC 9401
Contextual Info: Revised August 1999 74F401 CRC Generator/Checker General Description Features The 74F401 Cycle Redundancy Check CRC Generator/ Checker provides an advanced tool for implementing the most widely used error detection scheme in serial digital data handling systems. A 3-bit control input selects one-ofeight generator polynomials. The list of polynomials

Contextual Info: Semico n d u August 1995 t o r 74F401 CRC Generator/Checker General Description Features The ’F401 Cycle Redundancy Check CRC Generator/ Checker provides an advanced tool for implementing the most widely used error detection scheme in serial digital data handling systems. A 3-bit control input selects one-ofeight generator polynomials. The list of polynomials in­

74F40

Abstract: N74F40D N74F40N
Contextual Info: Philips Semiconductors FAST Products Product specification Dual 4-input NAND buffer 74F40 TYPE TYPICAL PROPAGATION DELAY TYPICAL SUPPLY CURRENT TOTAL 74F40 3.5ns 6mA PIN CONFIGURATION D0a 1 14 VCC D0b 2 13 D1d NC 3 12 D1c D0c 4 11 NC D0d 5 10 D1b Q0 6 9

Contextual Info: R e v is e d A u g u s t 1 9 9 9 S E M I C O N D U C T O R TM 74F402 Serial Data Polynomial Generator/Checker General Description Features T h e 7 4 F 4 0 2 e x p a n d a b le S e ria l D a ta P o ly n o m ia l g e n e ra to r/ • G u a ra n te e d 3 0 M H z d a ta ra te

Contextual Info: & January 1995 54F/74F402 Serial Data Polynomial Generator/Checker General Description Features The ’F402 expandable Serial Data Polynom ial g en e ra to r/ ch ecke r is an expandable version o f th e ’F401. It provides an advanced tool fo r th e im plem entation o f th e m ost w idely

74F402

Abstract: polynomials CRC-16 ccitt 74F401 74F402PC CRC16 CRC-16 F402 MS-001 N16E
Contextual Info: Revised August 1999 74F402 Serial Data Polynomial Generator/Checker General Description Features The 74F402 expandable Serial Data Polynomial generator/ checker is an expandable version of the 74F401. It provides an advanced tool for the implementation of the most

IRF 950

Abstract: 74F403A 74F403ASPC N24C
Contextual Info: Revised May 1999 74F403A First-In First-Out FIFO Buffer Memory General Description Features The 74F403A is an expandable fall-through type highspeed First-In First-Out (FIFO) Buffer Memory optimized for high-speed disk or tape controllers and communication

diode f407

Contextual Info: 407 gH National Æ m Semiconductor 54F/74F407 Data Access Register General Description Features T h e ’F407 Data A ccess R egister DAR perform s m em ory address arithm e tic fo r RAM resident sta ck applications. It co ntains three 4-bit registers intended fo r Program C ounter

Contextual Info: gn National ÆÆ Semiconductor 54F/74F40 Dual 4-Input NAND Buffer General Description This device co ntains tw o ind ependent gates, each o f w hich perform s th e logic N AND function. Ordering Code: seesection5 Connection Diagrams Logic Symbol Pin A ssignm ent

Contextual Info: National Semiconductor 54F/74F401 CRC Generator/Checker General Description Features The ’F401 Cycle Redundancy Check CRC Generator/ Checker provides an advanced tool for implementing the most widely used error detection scheme in serial digital data handling systems. A 3-bit control input selects one-ofeight generator polynomials. The list of polynomials in­

74F403A

Abstract: 74F403ASPC MS-001 N24C
Contextual Info: Revised October 2000 74F403A First-In First-Out FIFO Buffer Memory General Description Features The 74F403A is an expandable fall-through type highspeed First-In First-Out (FIFO) Buffer Memory optimized for high-speed disk or tape controllers and communication

F402

Abstract: x25 fairchild
Contextual Info: 402 54F/74F402 Connection Diagrams T—T Serial Data Polynomial Generator/Checker cp 33 vcc [T P E « ] s0 MR [T D |~4~ Description The 'F402 expandable Serial Data Polynomial generator/checker is an expandable version of the 'F401. It provides an advanced tool for the

Contextual Info: 40 54F/74F40 Connection Diagrams Dual 4-Input N A N D B uffer A 'fy. Pin Assignment for DIP and SOIC @@s @s NC NC Ordering Code: See Section 5 NC Pin Assignment for LCC and PCC Input Loading/Fan-Out: See Section 3 for U.L. definitions 54F/74F U.L. Description

Contextual Info: tß Semiconductor National 74F401 CRC Generator/Checker General Description Features The ’F401 Cycle Redundancy Check CRC Generator/ Checker provides an advanced tool for Implementing the most widely used error detection scheme In serial digital data handling systems. A 3-bit control input selects one-ofeight generator polynomials. The list of polynomials in­

6ap3

Contextual Info: 54F 74F402 Serial Data Polynomial Generator Checker General Description Features The ’F402 expandable Serial Data Polynomial generator checker is an expandable version of the ’F401 It provides an advanced tool for the implementation of the most widely

74F40

Contextual Info: 40 54F/74F40 Connection Diagrams Dual 4-Input NAND B u ffe r A % P in A s s ig n m e n t fo r DIP a n d SO IC NC NC NC 0 1 B S I ® a , E NC 3 Vcc NC Ordering Code: See S e c t io n 5 Input Loading/Fan-Out: 54F/74F U .L. H IG H /L O W D e s c rip tio n

CRC 9401

Abstract: 311 pin diagram
Contextual Info: 401 54F/74F401 Connection Diagrams CRC Generator/Checker c p fT Z iN c c W | er p t r la Redundancy Check CRC Generator/Checker provides an lementing the most widely used error detection I data handling systems. A 3-bit control input 'g e n g jm j^ polynomials. The list of polynomials in­

NT 407 F

Abstract: 407E
Contextual Info: 407 54F/74F407 Connection Diagrams Data Access Register Description The ’F407 Data A ccess R egister DAR perform s m em ory address a rith m e tic fo r RAM resident stack ap plicatio ns. It co n ta in s three 4-bit registers intended fo r Program C ounter (R0), S tack P ointer (R,), and

74F403

Abstract: i*r 403a
Contextual Info: 403 54F/74F403 Connection Diagrams First-In First-Out FIFO Buffer Memory Dejfedption — ir f [~T EN cc PL [ T T h £ jp D 3 tifi an expandable fall-through type high-speed First-In First-Out (WFO) fp E fjp M v n o ry optimized fo r high-speed disk or tape controllers

Contextual Info: 403A National ÆM Semiconductor 54F/74F403A First-In First-Out FIFO Buffer Memory General Description Features The ’F403A is an expandable fall-through type high-speed First-In First-Out (FIFO) Buffer Memory optimized for high­ speed disk or tape controllers and communication buffer

Contextual Info: 54F402,74F402 54F402 74F402 Serial Data Polynomial Generator/Checker Literature Number: SNOS196A 54F 74F402 Serial Data Polynomial Generator Checker General Description Features The ’F402 expandable Serial Data Polynomial generator checker is an expandable version of the ’F401 It provides

Contextual Info: & National Semiconductor 74F401 CRC Generator/Checker General Description Features The 'F401 Cycle Redundancy Check CRC Generator/ Checker provides an advanced tool for implementing the most widely used error detection scheme in serial digital data handling systems. A 3-bit control input selects one-ofeight generator polynomials. The list of polynomials in­

n74f40n

Contextual Info: Philips Semiconductore-Signetics Document No. 853-0053 ECN No. 96314 Dale of issue April 1 1 ,1 9 8 9 Status Product Specification FAST 74F40 Buffer Dual 4-lnput NAND Buffer FAST Products FUNCTION TABLE INPUTS D„. D„b Dnc OUTPUT Dnd °n L X X X H X L X

Contextual Info: Philips Somlconductors-Signetlcs Document No. 853-0053 ECN No. 96314 Date of issue April 11,1989 Status Product Specification FAST 74F40 Buffer Dual 4-Input NAND Buffer FAST Products FUNCTION TABLE INPUTS OUTPUT D„a L Dnb X Dne X Dnd X H X X L X X L X X