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    7320CR Search Results

    7320CR Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    121C-2

    Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478
    Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4


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    xc4005xlpqfp-160plcc-84hqfp-304+13vqfp-100xc4044xlxc4013xla121c-2xc1765dxc95108 xlmp8000ch4p103 pot datasheetreliability reportpqfp240xc95xxx17256dd1 pga 478 PDF

    J-STD-020

    Abstract: JSTD-020 JSTD020 235c J-STD020
    Contextual Info: 01/25/2006 RELIABILITY REPORT FOR DS21Q50, Rev C1, 100 LQFP, 14x14x1.4mm Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292


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    ds21q5014x14x130c/60j-std-020+4jstd-020jstd020235cj-std020 PDF

    JEDEC hast

    Contextual Info: 04/26/05 RELIABILITY REPORT FOR DS80C400, Rev B1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com


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    ds80c400jedec hast PDF

    XC95XXXL

    Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices
    Contextual Info: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4


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    xc4005xlpqfp-160plcc-84hqfp-304+13vqfp-100xc4044xlxc4013xlaxc95xxxlxc95xxxxc1765dpqfp240c17sxc9536a9903xcv1000e fght 12e applicationreliability test methods for packaged devices PDF

    Ablebond 84-1LMI

    Abstract: 84-1LMI JESD22 0/7C62126/7V
    Contextual Info: Cypress Semiconductor Qualification Report QTP# 97506, VERSION 1.0 May, 1998 1 Meg SRAM, R42 Technology, Fab 4 Qualification CY62126/7V 64K x 16 Static RAM, 2.7V - 3.6V Operation Cypress Semiconductor 1 Meg SRAM, R42 Technology, Fab 4 Devices:CY62126/7V Rev. A


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    cy62126/7v44-pincy7c1021v33-vc30c/60+4ablebond 84-1lmi84-1lmijesd220/7c62126/7v PDF

    C18045

    Contextual Info: 08/23/2004 RELIABILITY REPORT FOR DS80CH11, Rev A4 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    ds80ch1160c/60j-std-020c18045 PDF

    C18045

    Abstract: CDA151 9918 9936
    Contextual Info: 05/31/2005 RELIABILITY REPORT FOR DS80C390, Rev C3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    ds80c390reliab91830c/60c18045+3cda15199189936 PDF

    A9701

    Abstract: MIL-PRF38535 XC1700D XC7000 XC9500 xc4310 XC3390A vqfp100 package XC95XX XCS40 failure
    Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4


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    plcc-20a9701mil-prf38535xc1700d+7xc7000xc9500xc4310xc3390avqfp100 packagexc95xxxcs40 failure PDF

    Atmel LOT marking

    Abstract: Atmel 818 atmel part "marking" EIA-556-A atmel package marking ATMEL package qualification 8S02 eftec 64 AT558 Atmel MARKING CODE tqfp
    Contextual Info: AT55.8K Qual Pac ATMEL, Colorado Springs, Colorado 55.8 QualPack 1 ATMEL SEMICONDUCTORS Qualpack AT55.8K 1.0 Contents Cover Page………………………………………………………… 1 1.0 Contents……………………………………………………………. 2


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    atmel lot markingatmel 818atmel part "markingeia-556-a+6atmel package markingatmel package qualification8s02eftec 64at558atmel marking code tqfp PDF

    XcxxX

    Abstract: vqfp100 package PQFP160 XILINX mp8000ch4 marking 611 016 soic-8 XCS40 failure Xcs17 xc95144 XC95144 equivalent
    Contextual Info: The Reliability Data Program Expanded Version April. 1, 1999 Cover P1 TABLE OF CONTENTS Introduction .… 4 The Reliability Program. .… 4


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    plcc-20xcxxxvqfp100 packagepqfp160 xilinx+6mp8000ch4marking 611 016 soic-8xcs40 failurexcs17xc95144xc95144 equivalent PDF

    7320CR

    Abstract: Eftec 64t
    Contextual Info: 03/06/2003 RELIABILITY REPORT FOR DS21552, Rev B1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    ds21552jesd787320creftec 64t PDF

    AT56K

    Abstract: atmel 936 Atmel PART marking atmel 731 ATMEL flow soldering atmel TQFP Package 64 lead code date marking kla 431 atmel MSL 1 AT5622 at56700
    Contextual Info:  Semiconductors AT56K 1 QualPack AT56K  Semiconductors 1.0 Contents 1.0 Contents . 2 2.0 General Information . 3


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    at56katmel 936atmel part markingatmel 731+6atmel flow solderingatmel tqfp package 64 lead code date markingkla 431atmel msl 1at5622at56700 PDF

    8361J

    Abstract: mp8000ch4 Ablestik sumitomo crm EME-G700L g700l R6786-24 sumitomo EME G700L SUMITOMO g700l EME-G700
    Contextual Info: February 24, 2005 CN 022405 Customer Notification Assembly Subcontractor Change for QFP and PLCC Packaged Devices Dear Valued Customer: This notification is for the purpose of informing you of a change by Mindspeed Technologies in the packages used for the following devices:


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    cx28392-25cx28394-25cx28342-11cx28343-11+12cx28344-11r6786-2428xxx-pcn-002-a8361jmp8000ch4ablestiksumitomo crmeme-g700lg700lsumitomo eme g700lsumitomo g700leme-g700 PDF

    JEDEC JESD22-B116 free

    Abstract: SUMIKON EME-G700 EME-G700 ablebond 3230 SUMItomo EME-G700 Sumitomo EME-G700 material Ablebond 84-1*SR4 Ablebond 8390 sumitomo G700 Tg ablebond 8390 cure time
    Contextual Info: Integrated Device Technology, Inc. 2975 Stender Way, Santa Clara, CA - 95054 PRODUCT/PROCESS CHANGE NOTICE PCN PCN #: SR-0212-02 DATE: 12/20/2002 Product Affected: TSOP package family (see attachment for affected part #s). Date Effective: 3/20/2003 Contact: George Snell


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    sr-0212-02eme-g700jedec jesd22-b116 freesumikon eme-g700+7ablebond 3230sumitomo eme-g700sumitomo eme-g700 materialablebond 84-1*sr4ablebond 8390sumitomo g700 tgablebond 8390 cure time PDF

    9936

    Abstract: 9936 b EFTEC 64T Epoxy
    Contextual Info: 12/04/2002 RELIABILITY REPORT FOR DS21Q42 & DS21Q44 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


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    ds21q42ds21q4430c/609936+29936 beftec 64t epoxy PDF