4142B Search Results
4142B Datasheets (1)
| Part | ECAD Model | Manufacturer | Description | Datasheet Type | PDF Size | Page count | |
|---|---|---|---|---|---|---|---|
| 4142-B | Brady Worldwide | 4142-B TOWER WATER/GRN/STY B | Original | 101.4KB |
4142B Price and Stock
Hammond Manufacturing 1441-42BK3Enclosure: enclosure base; X: 356mm; Y: 432mm; Z: 127mm; 1441; steel |
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1441-42BK3 | 1 | 1 |
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1441-42BK3 | 2 |
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1441-42BK3 | Bulk | 44 | 1 |
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1441-42BK3 | Bulk | 1 |
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1441-42BK3 | 1 |
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1441-42BK3 | 24 | 1 |
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TDK Corporation B84142B0025R000Filter: anti-interference; single-phase; 250VAC; Ioper.max: 25A |
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B84142B0025R000 | 3 |
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B84142B0025R000 |
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B84142B0025R000 | Bulk | 4 | 1 |
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TDK Corporation B84142B0016R000Filter: anti-interference; single-phase; 250VAC; Ioper.max: 16A |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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B84142B0016R000 | 1 |
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B84142B0016R000 | 33 |
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B84142B0016R000 | Bulk | 1 |
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TDK Corporation B84142B8RPower Line Filter 50Hz/60Hz 8A 250VAC Terminal Block Flange Mount - Boxed Product (Development Kits) (Alt: B84142B0008R000) |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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B84142B8R | Box | 26 Weeks | 8 |
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B84142B8R |
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B84142B8R | 27 Weeks | 8 |
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Vishay Intertechnologies RNC50J4142BSRE7- Tape and Reel (Alt: RNC50J4142BSRE7) |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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RNC50J4142BSRE7 | Tape & Reel | 28 Weeks | 1,500 |
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4142B Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
404829
Abstract: HD404829FS HD404829 441L204 06E 906 051 K
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OCR Scan |
hd404829hmcs400-series32-khzhd404828+8 | |
SE 7889 LFContextual Info: Agilent E5240A I/CV Automation Software Data Sheet Overview Agilent I/CV software provides automated test solutions for semiconductor characterization. I/CV supports semiconductor parameter analyzers, C-V meters, low leakage switch matrices, and popular wafer probers. It also |
Original |
e5240a4085me5240au5988-4399en+1 | |
accretech UF3000
Abstract: UF3000
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Original |
e5240ce5241ce5240cu5989-1408en+2 | |
High Volume Test Methodology for HBT Device Ruggedness Characterization
Abstract: kopin
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17th-20thhigh volume test methodology for hbt device ruggedness characterizationkopin | |
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Contextual Info: S Agilent 4157A Modular Semiconductor Parameter Analyzer Data Sheet Introduction The Agilent 4157A Modular Semiconductor Parameter Analyzer combines the hardware flexibility of the Agilent E5270A 8-Slot Parametric Measurement Mainframe with the software versatility of I/CV 2.1 Lite Automation Software. |
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e5270a2357a5988-9162en | |
"asynchronous Dual-Port RAM"
Abstract: RAM SEU IO33 32K 4K x 8 Synchronous Dynamic RAM
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Original |
25-mbit4142basynchronous dual-port ramram seu+2 |