3H03 Search Results

20 Pin Molex Mini-Fit Jr

Contextual Info: 13 11 12 PART NUMBER ENGINEERING NUMBER 39-3H032 39-30-3031 39-30-4039 39-30-4037 39-30-4035 39-30-3033 39-30-3035 39-30-4033 39-30-4031 39-30-3039 39-30-3037 39-30-6039 39-30-7031 39-30-3032 39-30-5030 39-30-4038 39-30-4036 39-30-3034 39-30-3036 39-30-4034

Transistor y4n

Abstract: wy60 icpbqj 130U JQPB K9N6
Contextual Info: .30$%2E2&"0<.6" ".+ $$( F"&D"0<.7GG7 !"#$%$&'()*+$%$,($-./%(0".12')*345$0.6789:3*;<=$.>?4%"($-. 6@A.B"?$0.C4-D%$?. O=%2,"(24&? • ■ G'2'.*+1-".,3"*-<V S0?'-<'09?7 S0WXYZG[W?!0XU%I\B[WG7%TD S0Z]3'-;';0,-;0123(,2*-#0(',.$ S0N-;'(<',0<H<3'+< ?"#"3,20O";'*

EUPEC T828N

Abstract: T828N
Contextual Info: EUPEC SEE J> m 34D32T7 000G7TÖ 3TT •UPEC T828N "7 ^ 2 3 -^ 2 0 Typenreihe/Type range T 8 2 8 N_200_ 4 0 0 _ 6 0 0 _ 700 Elektrische Eigenschaften Electrical properties Höchstzulässige W erte

27C1024

Abstract: MIL-M-38535 2C9237 4B942 3B93
Contextual Info: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT

49F1024

Abstract: VSOP 40 7G9736 49f1025 7T9752 7G9730 9G9940 7J9747 7E9717 8J985
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-49F1025/49F1024 FLASH RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE - EXTENDED THERMAL SHOCK

27C4096

Abstract: 6B9635 3J0350 MIL-M-38535 40-VSOP
Contextual Info: PAGE 1 OF 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C4096 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE

television service manual firstline

Abstract: chips F8680 F8680 F8680 LCD Chips and Technologies lt08 oasi F8660 crt terminal interfacing in F8680 FIGARO ke 25
Contextual Info: F8680 PC/CHIP Data Sheet C opyright Notice Manual Copyright & 1993. Chips and Technologies, Inc. All Rights Reserved. n_j_. : _ milieur iu u.o.nt i c a T radem ark A cknow ladgem ant CHIPS and the CHIPS logotype «re registered trademarks of Chips sad Technologies. Inc.

Eupec TD18 N

Abstract: DT18F TD18F tt18f
Contextual Info: EUPEC b iE d m g o o u b s b i? « u p e c T T 18 F, TD 18 F, DT 18 F Elektrische Eigenschaften Electrical properties H öchstzulässige W erte M axim um rated values Periodische Vorwärts- und Rückwärts-Spitzensperrspannung repetitive peak forw ard off-state

Contextual Info: EUPEC blE D • 34G3EÌ7 G001135 bl? « U P E C TT 18 F, TD 18 F, DT 18 F Elektrische Eigenschaften Electrical properties Höchstzulässige Werte Maximum rated values Periodische Vorwärts- und Rückwärts-Spitzensperrspannung repetitive peak forward off-state

Contextual Info: L0 C1=41A40978C80A93:0>>C?A9=C L0D7F,0 =?DC L0D8D,0CA070C,0C80%><9=1;0&DC?DC L0*8A>D780>;50$>D=C9=7 L0#>F08<<0'A>69;5 &80"1+&30& -&.32030D00,)$"3)/.2 &80"1+&30&(-&.32030D00,)$"3)/.2 L0BFAA,01B930 B>;1C9>= *5BC020$51BDA5<5=C *5BC020$51BDA5<5=C

1P137

Abstract: 0H1075 45db041 3G0334 failure rate 0G0035 3H0348 1H0149 45DB041B 1E0120
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-45DB041B DATA FLASH RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - 125°C DYNAMIC OPERATING LIFETEST (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE - 131°C/85% RELATIVE HUMIDITY HAST TEST

4P0413

Abstract: 45DB161B TSOP50 1P0125 3G0338 5H0615
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-45DB161B DATA FLASH RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - 125°C OPERATING LIFETEST (PLASTIC) - 121°C/15PSI PRESSURE POT TEST - EXTENDED TEMPERATURE CYCLE - 131°C/85% RELATIVE HUMIDITY HAST TEST

mot 0517

Contextual Info: T 31 N Elektrische Eigenschaften Electrical properties H ö c h s tz u lä s s ig e W e rte M a x im u m rated va lu e s P e rio d is c h e V o rw ä rts- und R ü c k w ä rts -S p itz e n s p e rrs p a n n u n g re p e titiv e p e a k fo rw a rd off-state

EUPEC Thyristor

Abstract: AD180S diode wj MS4800
Contextual Info: LIE J> EUPEC m aHDBS1!? DDÜiaS? 421 BiUPEC AD 180 S Elektrische Eigenschaften Electrical properties H ochstzulässige Werte M axim um rated values Periodische VorwärtsS pitzensperrspannung repetitive peak forward off-state voltage Vorwärts-Stoßspitzenspannung

45DB081b

Abstract: AT-45DB081B 0T0108
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-45DB081B DATA FLASH RELIABILITY DATA* - 150°C RETENTION BAKE (PLASTIC) - 125°C DYNAMIC OPERATING LIFETEST (PLASTIC) - EXTENDED TEMPERATURE CYCLE (PLASTIC) - 121°C/15PSG PRESSURE POT TEST

B908

Contextual Info: K0 C1=41A40&)0) '0>>C?A9=C K09B8CF,0 =?DC K0B989,0&DC?DCB K0*8A>D780>;50$>D=C9=7 K0#>F0CE9<<0'A>69;5 K0%>=0 B>;1C540&DC?DC &90"3,&50& .&/54030D11-*$"5*0/4 *5;53><A1C3>< 1C13>< 'A>35BB0>=CA>; -9A5;5BB0%5CF>A: $51BDA5<5=C020*5BC 90)5A95B

T1B2

Abstract: D112
Contextual Info: ^ 01-23 D 2228 N EUPEC S2E D • 3 40 3 2 *1 7 OGOOTS^ 4 1 0 ■ UPEC Typen reihe/T ype range_ D 2228 N_ 200_ 400_ 600_800 Elektrische Eigenschaften Electrical properties Höchstzulässige Werte

atmel 89c52

Abstract: 89c52 of atmel 89C52 AT89C52 MICRO CONTROLLER AT89C52 AT 89C51 PLCC 9B9926 2H0235 5C0873 report on PLCC
Contextual Info: PAGE 1 OF 11 ATMEL CORPORATION Tel: 408 441-031 Fax: (408) 436-420 AT-89C52 CMOS FLASH MICRO CONTROLLER RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC)

7h2610

Abstract: 45DB081B AT-45DB081B 2R024
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-45DB081B DATA FLASH RELIABILITY DATA* - 150°C RETENTION BAKE (PLASTIC) - 125°C DYNAMIC OPERATING LIFETEST (PLASTIC) - EXTENDED TEMPERATURE CYCLE (PLASTIC) - 121°C/15PSG PRESSURE POT TEST

atmel 89c52

Abstract: 89c52 AT89C52 MICRO CONTROLLER 89c52 datasheet DATASHEET 89C52 89c52 controller AT 89C51 PLCC 89c51 datasheet atmel 89C51 datasheet of atmel 89C52
Contextual Info: PAGE 1 OF 11 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-89C52 CMOS FLASH MICRO CONTROLLER RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC)

27c512r

Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
Contextual Info: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)

cs11002

Abstract: tc51100a IA317 TC511002
Contextual Info: TOSHIBA MOS MEMORY PRODUCTS TC511002AP/AJ/AZ-70, TC511002AP/AJ/AZ-80 TC511002AP/AJ/AZ-10 DESCRIPTION The TC5110C2AP/AJ/AZ is the new generation dynamic RAM organized 1,048,576 words by 1 bit. The TC511002AP/AJ/AZ utilizes TOSHIBA'S CMOS Silicon gate process technology as

381561M

Abstract: 250A042 sangamo 5K012 100K03 Sangamo 066
Contextual Info: RADIAL LEADED CAPACITORS Rugged Snap-in PressLok , 105°C Type 381 — The longer life, higher ripple choice. CDE Type 381 brings I05°C capability and longer life to the rugged construction o f type 380. it's the snap-in o f choice for really high rip p le applications.

49F1024

Abstract: 49f1025 7T9752 7G9730 3H0344 7J9750 7G9736 7H9747 9H9943 8H9840
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-49F1025/49F1024 FLASH RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE - EXTENDED THERMAL SHOCK