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Catalog Datasheet	Type	Document Tags	PDF
a2030 Abstract: 3CH100 Q030 PI3L110 PI3L301D PI3L301DA 3CH400 Contextual Info: Date: Subject: March 15, 2006 Update Hynix CMOS 0.5 m 1P3M Wafer Fab Reliability Report - PI3L301D A total of 134 units successfully completed Dynamic High Temperature Operating Life (DHTOL) test with no failures for the PI3L301D device type. The units were tested for 3000 hours at a temperature of 150°C. This	Original	pi3l301d pi3l110 3l500 3l510 +10pi3usb10 3usb20 3usb40 pi3dbv10 3dbv14 a2030 3ch100 q030 pi3l301da 3ch400	PDF

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a2030

Abstract: 3CH100 Q030 PI3L110 PI3L301D PI3L301DA 3CH400
Contextual Info: Date: Subject: March 15, 2006 Update Hynix CMOS 0.5 m 1P3M Wafer Fab Reliability Report - PI3L301D A total of 134 units successfully completed Dynamic High Temperature Operating Life (DHTOL) test with no failures for the PI3L301D device type. The units were tested for 3000 hours at a temperature of 150°C. This

Original

pi3l301d pi3l110 3l500 3l510 +10

PDF