30SEP03 Search Results
30SEP03 Datasheets Context Search
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Contextual Info: 4 3 THIS DRAWING IS UNPUBLISHED. 2 RELEASED FOR PUBLICATION COPYRIGHT 19 BY AMP INCORPORATED. LOC ALL RIGHTS RESERVED. REVISIONS DIST 6 CE LTR C DESCRIPTION DATE REV PER EC OB60—0 0 6 1 —03 30SEP03 DWN APVD WS JH 1. DIMENSIONS IN [ ] ARE IN INCHES D 2\ MAXIMUM CONNECTOR LOSS IS EQUAL TO 0.50 dB |
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30sep0303jan035/125um23feb95 | |
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Contextual Info: 4 THIS DRAWING IS UNPUBLISHED. C COPYRIGHT 19 3 RELEASED FOR PUBLICATION BY AMP INCORPORATED. ,19 ALL RIGHTS RESERVED. D L C C ER AM IC B A AMP 1471-9 REV 23FEB95 FERRULE LOC REVISIONS DIST 6 CE LTR B DESCRIPTION DATE REV PER EC OB 6 O—0 0 6 1 —03 30SEP03 |
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23feb9530sep0301apr03 | |
TSAL6200
Abstract: TSOP21 TSOP2130MQ1 TSOP2133MQ1 TSOP2136MQ1
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tsop21d-7402530-sep-03tsal6200+3 | |
M2003Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TSOP−5/6 Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 520 260,000 200_C +N2 0.00 Die Shear 45 26,250 MIL - STD - 750 0.00 HAST 3,153 330,450 |
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10secm200330-sep-03 | |
130C
Abstract: RH 012C Vishay
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30-sep-03130crh 012cvishay | |
M2003Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR SSOP 20−28 LEAD Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 120 90,000 200_C + N2 0.00 HAST 400 40,000 130_C, 85%RH 0.00 Pressure Pot 1,365 |
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m200330-sep-03 | |
SF0070BA03028SContextual Info: 70 MHz Low Loss Filter 8 MHz Bandwidth Part Number SF0070BA03028S Micro Networks., 324 Clark Street, Worcester, MA 01606, USA tel: 508-852-5400, fax:508-852-8456, www.micronetworks.com TYPICAL PERFORMANCE Horizontal: 4.0 MHz/div Vertical from top : Magnitude |
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sf0070ba03028s30-sep-03 | |
609-2641 connector
Abstract: 609-5041 609-2041 609-2641 1658526-2 tyco ipm
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0s13-0117-0518apr05ul94v-0305ep03+8 | |
CAT5241
Abstract: linear potentiometer sda 5241 CAT5241WI-00-T1 CAT5241WI-10-T1 CAT5241WI-25-T1 CAT5241WI-50-T1 CAT5241YI-25-T2 MS-013
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cat524120-leadmd-2011linear potentiometer+7 | |
linear potentiometer
Abstract: sda 5241 current 5241 datasheet CAT5241 CAT5241WI-00 CAT5241WI-10 CAT5241WI-25 CAT5241WI-50 CAT5241YI-25 MS-013
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cat524120-leadmd-2011linear potentiometer+8 | |
SSOT-23
Abstract: M2003
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ssot-2310secm200330-sep-03 | |
on5134
Abstract: philips ON5134 transistor tda3612 OM8838ps BT 804 triac on5134 Transistor on5217 triacs bt 804 600v D203B SMD Transistor W02
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dn48aon5134philips on5134 transistortda3612+7 | |
M2003Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR SC−75A Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage HAST 165 13,750 130_C, 85%RH 0.00 Pressure Pot 365 35,040 121_, 15 PSIG 0.00 Solder DUNK 40 240 |
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sc-75a10secm200330-sep-03 | |
72555
Abstract: Si3440DV
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si3440dv0-to-10v30-sep-0372555 | |
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Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR SOT−23 Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 620 395,000 200_C + N2 0.00 HAST 4,457 419,100 130_C, 85%RH 0.00 Pressure Pot 5,335 544,670 |
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ot-2310sec30-sep-03 | |
459 tssop-8 vishay
Abstract: M2003
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10secm200330-sep-03459 tssop-8 vishay | |
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Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR 1206−8 ChipFETr Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 40 20,000 200_C + N2 0.00 HAST 300 27,500 130_C, 85%RH 0.00 Pressure Pot 100 |
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30-sep-03 | |
SQFP-48
Abstract: M2003
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m200330-sep-03sqfp-48 | |
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Contextual Info: TCLT11. Series VISHAY Vishay Semiconductors Optocoupler, Phototransistor Output, SOP-6L5, Half Pitch, Long Mini-Flat Package Features • • • • • • • SMD Low profile 5 pin package Isolation Test Voltage 5000 VRMS CTR flexibility available see order information |
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tclt11e76222e-76222en600950+2 | |
CAT5221
Abstract: CAT5221WI-00 CAT5221WI-10 CAT5221WI-25 CAT5221WI-50 CAT5221YI-25 MS-013
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cat522120-leadmd-2113cat5221wi-00+5 | |
M2003Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO−92 Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 80 20,000 200C + N2 0.00 HAST 1205 120,500 130_C, 85%RH 0.00 LEAD INT 125 345 883M2004 |
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883m2004m200330-sep-03 | |
M2003Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR PDIP 8−28 LEAD Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage 85/85 250 60,000 85_C, 85%RH 0.00 BOND INT 40 30,000 200_C + N2 0.00 HAST 555 55,500 130_C, 85%RH |
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m200330-sep-03 | |
M2003Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO−262/263 D2PAK Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage 85/85 1,690 1,419,504 85_C, 85%RH 0.00 BOND INT 1,640 820,000 200_C + N2 0.00 HAST |
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o-262/26310secm200330-sep-03 | |
M1009
Abstract: M2003
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m100910secm200330-sep-03 | |