28C17 Search Results
28C17 Datasheets (388)
| Part | ECAD Model | Manufacturer | Description | Datasheet Type | PDF Size | Page count | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 28C17-10 | General Instrument | 16K ELECTRCALLY ERASABLE PROM | Scan | 406.19KB | 14 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15 | General Instrument | 16K ELECTRCALLY ERASABLE PROM | Scan | 406.19KB | 14 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15I/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15I/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15I/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15I/L | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15I/P | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15I/S | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15I/W | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15/L | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15M/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15M/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15M/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15MR/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15MR/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15MR/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 28C17-15M/S | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | 263.37KB | 8 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17 Price and Stock
Amphenol Corporation QWLD05R28C17P- Bulk (Alt: QWLD05R28C17P) |
|||||||||||
| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
|
QWLD05R28C17P | Bulk | 24 Weeks | 1 |
|
Buy Now | |||||
Amphenol Corporation MS17344R28C17P- Bulk (Alt: MS17344R28C17P) |
|||||||||||
| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
|
MS17344R28C17P | Bulk | 24 Weeks | 2 |
|
Buy Now | |||||
Amphenol Corporation MS17343R28C17S- Bulk (Alt: MS17343R28C17S) |
|||||||||||
| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
|
MS17343R28C17S | Bulk | 24 Weeks | 2 |
|
Buy Now | |||||
Amphenol Corporation MS17346C28C17P- Bulk (Alt: MS17346C28C17P) |
|||||||||||
| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
|
MS17346C28C17P | Bulk | 24 Weeks | 2 |
|
Buy Now | |||||
Amphenol Corporation MS17343C28C17S- Bulk (Alt: MS17343C28C17S) |
|||||||||||
| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
|
MS17343C28C17S | Bulk | 24 Weeks | 2 |
|
Buy Now | |||||
28C17 Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
|
Contextual Info: b3E I> • bl032Gl QGG7S33 E46 IP1CHP MICROCHIP TECHNOLOGY INC 28C17A Microchip 16K 2K X 8 CMOS Electrically Erasable PROM FEATURES need of external components. During a “byte write”, the address and data are latched internally, freeing the microprocessor address and data bus for other opera |
OCR Scan |
bl032glqgg7s3328c17apols11127d-page+4 | |
|
Contextual Info: M 28C16B M 28C17B 16 Kbit 2K x 8 Parallel EEPROM With Software Data Protection PRELIMINARY DATA • Fast Access Time: 90 ns at Vcc=5V ■ Single Supply Voltage: - 4.5 V to 5.5 V for M28CxxB - 2.7 V to 3.6 V for M28CxxB-W ■ Low Power Consumption ■ Fast BYTE and PAGE WRITE (up to 64 Bytes) |
OCR Scan |
28c16b28c17bm28cxxbm28cxxb-w+3 | |
|
Contextual Info: $ M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM PACKAGE TYPE FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Pow er Dissipation - 30 m A Active - 100 (iA Standby • Fast Byte Write Time— 200 us or ms • Data Retention >10 years |
OCR Scan |
28c17ads11127e-page | |
|
Contextual Info: 28C17A M icro c h ip 16K 2K x 8 CMOS Electrically Erasable PROM FEATURES DESCRIPTION • Fast Read Access Time— 150ns Maximum • CMOS Technology for Low Power Dissipation — 30mA Active — 100|xA Standby • Fast Byte Write Time— 200n.s or 1ms • Data Retention >10 years |
OCR Scan |
28c17a150nsds11127c-6ds11127c-8+1 | |
|
Contextual Info: M $ 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 |iA Standby • Fast Byte Write Time—200 ¡is or 1 ms • Data Retention >200 years • High Endurance- Minimum 104 Erase/Write Cycles |
OCR Scan |
roy/b57c1/01c28c17atime--200+2 | |
200B
Abstract: 28C17A
|
OCR Scan |
28c17a32-pinms-016aeds00049m-page+1 | |
M28C16
Abstract: M28C17 PDIP28 S028
|
OCR Scan |
m28c17pdip28plcc32m28c16+1 | |
200B
Abstract: 28C17A DK-2750 RG41
|
Original |
28c17a200bdk-2750rg41 | |
|
Contextual Info: M i c r o c h i p 28C17A » 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 nA Standby • Fast Byte W rite Time— 200 us or 1 ms • Data Retention >200 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28c17a32-pins-016ds00049m-page | |
c17fContextual Info: 3890002 QENL 83 D 0 3 3 9 6 ÏNSTR/ M I C R O C H I P MI CROCHIP TECHNOLOGY INC GENERAL INSTRUMENT A3 D 28C16/28C17 blGBSDl 0 0 0 3 3 ^ ÜTf 7 PBELDH01N1ÂRV DIM FO M ATDO IN] 16K 2K X 8 CMOS Electrically Erasable PROM FEATURES • Fast Read Access Time — 150 ns |
OCR Scan |
28c16/28c17pbeldh01n128c17ds11110a-8+1 | |
|
Contextual Info: M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM PACKAGE TYPE FEATURES • Fast Read A ccess Time— 150 ns • CMOS Technology fo r Low P ow er Dissipation - 30 m A Active - 100 (iA S tandby • Fast Byte W rite Time— 200 |xs o r 1 ms • Data Retention >10 years |
OCR Scan |
28c17ads11127e-page | |
|
Contextual Info: M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time—150 ns • CMOS Technology for Low Power Dissipation — 30 mA Active — 100 (iA Standby • Fast Byte Write Time—200 us or 1 ms • Data Retention >10 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28c17a28c17afds11127e-page8x20mm | |
|
Contextual Info: 28C17A M ic r o c h ip 16K 2K x 8 CMOS EEPROM PACKAGE TYPE FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 jiA Standby • Fast Byte Write Time— 200 ps or 1 ms • Data Retention >200 years |
OCR Scan |
28c17a32-updatesds11127fl103201 | |
|
Contextual Info: 28C17A M icro ch ip 16K 2K x 8 CMOS Electrically Erasable PROM FEATURES DESCRIPTION • Fast Read Access Time— 150ns Maximum • CMOS Technology for Low Power Dissipation — 30mA Active — 100|oA Standby • Fast Byte Write Time— 200ns or 1 ms • Data Retention >10 years |
OCR Scan |
28c17a150ns200nsds11127c-7+1 | |
|
|
|||
tce 1994Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 29 A8 28 A9 27 NC 26 NC PLCC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 21 I/O6 17 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 NC 12 I/O6 I/O0 13 I/O5 I/O4 I/O3 16 DIP/ SOIC |
Original |
28c17atime--150time--200ds11127f-page+1 | |
28C17AContextual Info: Obsolete Device 28C17A 16K 2K x 8 CMOS EEPROM 2004 Microchip Technology Inc. 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 4 A7 3 NC 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 |
Original |
28c17ad-85737nl-5152 | |
|
Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 1998 Microchip Technology Inc. 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 4 A7 3 NC 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 |
Original |
28c17atime--150time--20032-pin+1 | |
|
Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 NC 12 I/O6 I/O0 13 I/O5 I/O4 I/O3 14 28 27 |
Original |
28c17ads11127g-page | |
|
Contextual Info: 28C17A DICE FORM Microchip 16K 2K X 8 CMOS Electrically Erasable PROM FEATURES DESCRIPTION • 250ns Access Time • CMOS Technology for Low Power Dissipation — 30mA Active — 100|iA Standby • Fast Byte Write Time— 1ms • Automatic Write Operation |
OCR Scan |
28c17a250nsthe28c17ads11134a-6+1 | |
10F-1CContextual Info: JÊ Ë Ê È L * & 28C17A M ig z r o n c h ip i 16K 2K X 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 |^A Standby • Fast Byte W rite Time— 200 |^s or 1 ms • Data Retention >200 years |
OCR Scan |
32-pinds111271-page10f-1c | |
28C17AContextual Info: M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 |iA Standby • Fast Byte Write Time—200 us or 1 ms • Data Retention >10 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28c17a32-pin28-pin | |
|
Contextual Info: 28C17A M ic r o c h ip 16K 2K X 8 CMOS Electrically Erasable PROM need of external components. During a “byte write”, the address and data are latched internally, freeing the microprocessor address and data bus for other opera tions. Following the initiation of write cycle, the device |
OCR Scan |
28c17a28c17afds11127d-page | |
|
Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 1998 Microchip Technology Inc. 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 4 A7 3 NC 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 |
Original |
28c17atime--150time--20032-pin | |
|
Contextual Info: $ 28C17A M ic r o c h ip 16K 2K x 8 CMOS EEPROM • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation — 30 mA Active — 100 nA Standby • Fast Byte Write Time— 200 |is or 1 ms • Data Retention >10 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28c17a32-pin28c17af8x20mm+1 | |