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    Samtec Inc PCIEC-036-0115-EC-EC-CP

    PCI Express Jumper Cable Assemblies - Bulk (Alt: PCIEC-036-0115-EC-EC-CP)
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    Avnet Americas PCIEC-036-0115-EC-EC-CP Bulk 1
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    Diodes Incorporated DDTC115ECA-7-F

    Trans Digital BJT NPN 100mA 3-Pin SOT-23 T/R - Tape and Reel (Alt: DDTC115ECA-7-F)
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    Avnet Americas DDTC115ECA-7-F Tape & Reel 48 Weeks 3,000
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    Newark () DDTC115ECA-7-F Tape & Reel 280 100
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    DDTC115ECA-7-F Cut Tape 280 5
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    TME DDTC115ECA-7-F 1
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    Avnet Silica DDTC115ECA-7-F 46 Weeks 3,000
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    Diodes Incorporated DDTA115ECA-7-F

    Trans Digital BJT PNP 100mA 3-Pin SOT-23 T/R - Tape and Reel (Alt: DDTA115ECA-7-F)
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    Avnet Americas DDTA115ECA-7-F Tape & Reel 44 Weeks 3,000
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    TME DDTA115ECA-7-F 1
    • 1 $0.35
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    Avnet Silica DDTA115ECA-7-F 46 Weeks 3,000
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    Vyrian DDTA115ECA-7-F 8,746
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    ROHM Semiconductor DTA115ECAT116

    Digital Transistor, -0.1A, Sot-23; |Rohm DTA115ECAT116
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    Newark () DTA115ECAT116 Cut Tape 5
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    DTA115ECAT116 Tape & Reel 100
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    Bristol Electronics DTA115ECAT116 8,769 1
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    ROHM Semiconductor DTC115ECAT116

    Digital Trans, 50V, 0.1A, Sot-23; |Rohm DTC115ECAT116
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    Newark () DTC115ECAT116 Cut Tape 5
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    DTC115ECAT116 Tape & Reel 100
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    115EC Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    R601-25

    Abstract: R600 R601 R610 R611
    Contextual Info: 72 9 4 6 2 1 POWEREX TL INC Standard Rectifiers D £ | 7 a T 4 b E l 0 0 0 1 7 5 1 5 J ”, I f av /RAM m 7c =100° C @ V rrm for 50% Duty and Fusing IFSM Cycle, Half Tj(Max) @8.3 ms Sine 60 Hz (Amps x 103) 50 Hz 60 Hz (A2sec x 10*) (mA) (Amps) 25 0 Tc=115eC


    OCR Scan     		7214b210001-7s11n4044-4055vt-16+61n4044r-4056rr601-25r600r601r610r611 PDF

    qml-38535

    Abstract: MIL-STD-973 Reliability Test Methods for Packaged Devices smd marking 1331 smd marking mp transistor E304 HS-1115RH
    Contextual Info: 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability device classes Q and M and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number


    Original     		5962-e304-96qml-38535mil-std-973reliability test methods for packaged devices+4smd marking 1331smd marking mptransistor e304hs-1115rh PDF

    qml-38535

    Abstract: HS1145RH QML-38534
    Contextual Info: 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system see 6.6 herein . Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines


    Original     		mil-std-8835962-e341-96qml-38535hs1145rh+1qml-38534 PDF