X0000001 Search Results

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

micro usb ID resistance values

Contextual Info: LP8727 www.ti.com SNVS898 – OCTOBER 2012 LP8727 Micro/Mini USB Interface with Integrated 28V Charger Check for Samples: LP8727 FEATURES 1 • 2 • • • USB Multiplexing Switches – High-speed USB on USB and UART inputs – Negative voltage rail on Audio inputs

BCT245

Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

V5050

Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

TLV990

Abstract: TLV990-21 TLV990-21PFB
Contextual Info: TLV990Ć21 3ĆV, 10ĆBIT, 21ĆMSPS AREA CCD ANALOG FRONT END SLAS299A − AUGUST 2000 − REVISED MARCH 2004 features application D Single-Chip CCD Analog Front-End D 10-Bit, 21-MSPS, Single 3-V Supply D D D D D D D 48-Pin TQFP Package STBY RESET CS SDIN SCLK

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

ATmega32H

Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
Contextual Info: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC

bct8240a

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

SN54BCT8244A

Abstract: SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­

Contextual Info: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid

NEC asu

Abstract: 13E3h 1442H
Contextual Info: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid

SN74BCT373

Abstract: SN74BCT8373 SN74F373
Contextual Info: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and

mbm27c1000a

Abstract: MBM27C512-20 str w 6554 df rr 3pin transistor MB89920 abcc MB89923 MB89925 MB89P928 MB89PV920
Contextual Info: FUJITSU SEMICONDUCTOR CONTROLLER MANUAL CM25-10127-1E F2MC-8L FAMILY MICROCONTROLLERS MB89920 SERIES HARDWARE MANUAL 1. The products described in this manual and the specifications thereof may be changed without prior notice. To obtain up-to-date information and/or specifications, contact your Fujitsu sales

74BCT8374

Abstract: D3641 TEX-E wire
Contextual Info: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW

f0208

Abstract: ad495 MBM27C512-20
Contextual Info: FUJITSU SEMICONDUCTOR DATA SHEET DS07-12555-1E 8-bit Proprietary Microcontroller CMOS F2MC-8L MB89560A Series MB89567A/567AC/P568/PV560 • DESCRIPTION The MB89560A series has been developed as a general-purpose version of the F2MC*1-8L family consisting of

ta2119

Abstract: diode S31C REJ09B0287-0110 fb p67 SMD CODE MARKING DIODE GOC 97
Contextual Info: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid

F504

Abstract: PDIP28 ST52F500 ic 4060 internal circuit afb3
Contextual Info: ST52F500/F503/F504 ST52F500/F503/F504  8-BIT INTELLIGENT CONTROLLER UNIT ICU Two Timer/PWMs, I2C, SPI TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 4 Kbytes Data EEPROM ■ In Situ Programming in Flash devices (ISP)

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: TLC5930 SLLS528 – MARCH 2002 12-CHANNEL LED DRIVER DESCRIPTION FEATURES D 0.2-mA to 40-mA Constant-Current Sink D D D D D Drive Capability x 12 Bits Output Count into 24-Pin HTSSOP Package 1024 Gray-Scale Display (PWM Control 1024 Steps) with Max 25-MHz Clock Frequency

TLC5930

Abstract: TLC5930PWP
Contextual Info: TLC5930 SLLS528 – MARCH 2002 12-CHANNEL LED DRIVER FEATURES D 0.2-mA to 40-mA Constant-Current Sink D D D D D DESCRIPTION Drive Capability x 12 Bits Output Count into 24-Pin HTSSOP Package 1024 Gray-Scale Display (PWM Control 1024 Steps) with Max 25-MHz Clock Frequency

Contextual Info: TLV990Ć21 3ĆV, 10ĆBIT, 21ĆMSPS AREA CCD ANALOG FRONT END SLAS299A − AUGUST 2000 − REVISED MARCH 2004 features application D Single-Chip CCD Analog Front-End D 10-Bit, 21-MSPS, Single 3-V Supply D D D D D D D 48-Pin TQFP Package STBY RESET CS SDIN SCLK

Contextual Info: TLV990Ć21 3ĆV, 10ĆBIT, 21ĆMSPS AREA CCD ANALOG FRONT END SLAS299A − AUGUST 2000 − REVISED MARCH 2004 application features D Digital Still Camera D Video Camcorder D Single-Chip CCD Analog Front-End D 10-Bit, 21-MSPS, Single 3-V Supply D D D D D D D 48-Pin TQFP Package