corning 7575
Abstract: LCLV CCD FIBER OPTIC image sensor x-ray TMCP1005E03 sensor x-ray TMCP100
Contextual Info: OPTICAL DEVICE TO REPLACE LENS LOW DISTORTION HIGH TRANSMITTANCE SIMPLE AND COMPACT OPTICAL DESIGN COUPLED TO CCD AS INPUT WINDOW SECURITY CHECK FINGER PRINT IDENTIFICATION HIGH RESOLUTION VIDEO CAMERA SURVEILLANCE CAMERA MEDICAL X-RAY CAMERA etc. OPTICAL DEVICE TO REPLACE LENS
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Contextual Info: CIRCULAR MCP AND ASSEMBLY SERIES A microchannel plate MCP is a secondary-electron multiplier which detects and amplifies electrons in two-dimensions. The MCP is sensitive not only to electrons but to ions, vacuum ultraviolet light, X-rays and γ-rays, making it useful in
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hamamatsu F2226
Abstract: F1094 F2226 F2225 F1942 F1208 microchannel plate F2224 F2223 photomultiplier tube
Contextual Info: CIRCULAR MCP AND ASSEMBLY SERIES A microchannel plate MCP is a secondary-electron multiplier which detects and amplifies electrons in two-dimensions. The MCP is sensitive not only to electrons but to ions, vacuum ultraviolet light, X-rays and γ-rays, making it useful in
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SEM 2006
Abstract: F2223-21SH SUS304 TMCPF0020 beam mcp
Contextual Info: MCP ASSEMBLY F2223-21SH This MCP assembly is a suitable detector for an electron or ion beam in SEM, SIM or Lithography. It is possible to detect some signal from a sample with high sensitivity, that can be performed with the compactness and the center hole
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electron gun CRT
Abstract: x-ray F6492 microchannel plate
Contextual Info: LONG SCALE MICROCHANNEL PLATE F6492 Very Long Effective Area: 127 4mm This new long-scale MCP allows for continuous detection of wide range position information without dead space correction. This new configuration promises reliable measurement, and is well suited for double-focusing mass spectrometers. Assembled configurations are also available
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Contextual Info: MCP MCP ASSEMBLY F2223-21SH FEATURES ●High sensitivity ●High S/N ratio ●Wide dynamic range ●Center hole for beam line ●Compact and lightweight OVERVIEW APPLICATIONS This MCP assembly is a suitable detector for an electron or ion beam in SEM, SIM or Lithography.
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F4655-10
Abstract: F4655
Contextual Info: MCP MCPアッセンブリ F4655/-10 F4655：イオン・電子検出用／小型軽量汎用タイプ F4655-10：プラスイオンTOF（Time of flight）測定用／高速応答タイプ 概要 F4655はコンパクトで極性を限定しない汎用タイ
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