TEST UNIT Search Results

wireless motor speed control by rf

Abstract: smema GPIB/USB DSASW0010279 gpib rohwedder smema specifications
Contextual Info: 5830+ In-line Multi-Combinational Tester Key features Test capability • • ICT: In-Circuit Test Up to 3060 in-circuit test points, or • FCT: Functional Circuit Test Up to 1024 functional test points, or • FUT: Functional Unit Test Up to 19, 3U PXI cards

F-1352

Abstract: 016v 1352
Contextual Info: Turns Ratio + 2% F-1352 1:1:1:1 PARAMETER MIN. Open Circuit Inductance Test Level = .016V Test Frequency = 100.0 KHz MAX. COMMON MODE CHOKE UNITS µHy 36 Leakage Inductance Test Level = .016V Test Frequency = 1 MHz 0.3 µHy Interwinding Capacitance (CW/W)

104PEA/2X11N-452

Contextual Info: SUHNERâ TEST+MEASUREMENT TEST LEADS 50 9 Agilent Technologies VNAs 48 This range of test leads has been specially developed for applications involving network analyzers from Agilent Technologies. All test leads are provided at one end with the unit-specific, sturdy 3.5

UL20624

Abstract: UL2643 UL289X
Contextual Info: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:

UL2643

Abstract: UL20624 17546
Contextual Info: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:

UL20624

Abstract: UL2643
Contextual Info: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:

UL20624

Contextual Info: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:

ic 8255 PPI

Abstract: PPI 8255 interface data serial 8255 PPI Chip PPI 8255 interface word control Control word 8255 PPI ppi interface 1007 SC1114 NUM mnda
Contextual Info: Honeywell Advance Information TEST-BUS INTERFACE UNIT HTIU2100 FEATURES • Module Test and Maintenance Bus Interface - IEEE P1149.5 Compatible Backplane - Master or Slave Operation - Module Clock Generation Capability • Serial Chip-Level Test Interface

Contextual Info: www.avionteq.com 7700 Integrated Microwave Test Solution A complete test environment for automated production and integration test of RF components and modules A Complete RF Test Environment

NSG1003

Abstract: TCL24-124 TDS1002 TCL24-112 TCL060-112 TCL060-124 TCL060-148 TCL120-112 208VAC TCL24-105
Contextual Info: SEMI F-47 Test Compliance Test Report Standard: SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity Test Procedure Standard: Semi F42 : Test method for Semiconductor Processing Equipment. Voltage Sag Immunity 1. Test Setup

NSG1003

Abstract: TDS1002 TSP070-112 TSP090-124 TSP140-112 TSP180-124 TSP360-124 TSP600-124
Contextual Info: SEMI F-47 Test Compliance Test Report Standard: SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity Test Procedure Standard: Semi F42 : Test method for Semiconductor Processing Equipment. Voltage Sag Immunity 1. Test Setup

Willamette

Abstract: project transistor tester
Contextual Info: Intel Technology Journal Q1’99 Defect-Based Test: A Key Enabler for Successful Migration to Structural Test Sanjay Sengupta, MPG Test Technology, Intel Corp. Sandip Kundu, MPG Test Technology, Intel Corp. Sreejit Chakravarty, MPG Test Technology, Intel Corp.

B1093

Contextual Info: TEST POINTS TEST POINTS AND TEST SOCKETS • UNIQUE RETENTION MECHANISM ENHANCES RELIABILITY THROUGH LOW STRESS CONTACTS • LOW PROFILE WITH MINIMUM CONTACT RESISTANCE < 2mΩ • CONTACT TEST POINT SUITABLE FOR BED OF NAILS APPLICATIONS • TEST SOCKETS SUPPLIES LOOSE, TEST POINTS SUPPLIED ON TAPE AND REEL

EN-61010

Abstract: 6LR61 6F22 6F22 9V BATTERY en 61010 battery 6f22 IEC 6F22 acoustic 150 tester IEC-61010
Contextual Info: Continuity Tester UNITEST ® Continuity Tester UNITEST Ohmtest Technical Data Continuity Tester Continuity Test Test Current Test Voltage External Voltage Indication Protection Degree Safety complying with Power Supply Dimensions Weight Key Functions • Acoustic continuity tester

Contextual Info: SMD WIRE WOUND CERAMIC CHIP INDUCTORS 1008F SERIES CHIP INDUCTORS SMD WIRE WOUND CERAMIC Mechanical Dimensions: MECHANICAL DIMENSIONS Unit:mm (Unit:mm) 0.51 1.52 0.51 Electrical Specification ! Ind. Test Freq. Inductance Test Test Part No Ind. Freq. (uH) Inductance

Contextual Info: Agilent E1529B, E1539A and E1422A Strain, Voltage, and Temperature, Measurement System • Airframe structural and fatigue test • Rocket and satellite structural test • Wind tunnel flight load test Remote Strain Conditioning and Voltage Unit for Stress and

IDC CONNECTOR 50 pin male

Abstract: SCSI CONNECTOR 50 pin male 40 pin LCD cable scsi 68 connector pin assignment 40-pin male connector dsub 9 male idc connector manual test idc connector 10 pin pin connection lcd wire
Contextual Info: SCSI and Flat Cable Tester SCSI Cable Tester With this test device cable with up to 68 lines can be tested. Combined with the optional PC- or MAC cable test unit extendable to a Multi cable test device. The test units are connected by a 40-wire cable to the SCSI tester. An enclosed reference table shows

laptop ic list

Abstract: NS6040 contactor Amkor Technology handler
Contextual Info: data sheet TEST CONTACTOR FusionQuad Test Contactor Test Hardware List: Amkor FusionQuad® Test Contactor: Amkor Technology is now offering the FusionQuad® Test Contactor Amkor’s FusionQuad® represents a breakthrough in leadframe-based plastic packaging through the effective

MTTR,

Contextual Info: COMMUNICATIONS TEST & MEASUREMENT SOLUTIONS CAS-2000 Comprehensive Application System Compact High Density Remote Test Unit Key Features • Up to 16 simultaneous DS1 tests from a DS3 interface on a Digital Crossconnect System DSC or Test Access Unit (TAU)

cls0231mp-1

Contextual Info: Part No: CLS0231MP-1 Date: 7/09/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 23mm

Contextual Info: Part No: CLS0401MAE Date: 7/03/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 40 mm

Contextual Info: Part No: CLS0301MA Date: 7/03/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 30 mm

CLS0281-L152

Abstract: 24 ohm speaker
Contextual Info: Part No: CLS0281-L152 Date: 7/3/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 28mm

Contextual Info: Part No: CLS0281MAE-L152 Date: 7/5/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 28mm