TEST Search Results

MP1470

Contextual Info: TH I S DRAW I NG I S U N P U B L I S H E D . COP Y R I GH T BY 20 REVISIONS R E L E A S E D POR P U B L I C A T I ON TYCO ELECTRONICS ALL CORPORATION RIGHTS RESERVED. LTR -TEST EAC CLAMP I NG SCREW 2 9.5 3 D E S C R I P T I ON DATE R E V I S E D PER 0 G 3 B - 0 I 19-01

Contextual Info: THIS DRAWING IS COPYRIGHT UNPUBLISHED. 20 RELEASED BY TYCO ELECTRONICS CORPORATION FOR ALL 20 PUBLICATION RIGHTS LOC RESERVED. REV I S IONS D I ST FT LTR DESCRIPTION REVISED -TEST C L A M P I NG SCREW­ / ^ DWN DATE P E R 0 G 3 B - 0 I 19-01 APVD EZ 3 I OCT 2 0 0 I

2SC2640

Abstract: pj 71
Contextual Info: SILICON NPN EPITAXIAL PLANAR TYPE 2SC2640 Unit in mm VHF BAND POWER AMPLIFIER APPLICATIONS. FEATURES : Output Power : Po=28W Min, ( f=175MHz, VCC=12.5V, Pi=4W ) 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR @ VCC=14.5V, Pj=4W, f=175MHz

Contextual Info: SAFETY DRGANIZATIDNS RELIABILITY SPECIFICATIONS: TH IS F ILT E R HAS BEEN FORMALLY RRCDONIZOD, C ER TIFIED DR APPROVED BY THE LIST ED AGENCY, THEREFORE, ALL TEST/REQUIREMENTS SP EC IFIED IN THE TEST REVISION OF TBE FOLLOWING AGENLY STANDARDS HAVE BEEN MET

2SC1955

Contextual Info: SILICON NPN EPITAXIAL PLANAR TYPE 2SC1955 Unit in mm VHF BAND POWER AMPLIFIER APPLICATIONS. 0S59MAX. g ja 4 5 M A X . FEATURES : Output Power : f=175MHz, Po=2.8W (Min. Vcc=13.5V, Pi=0.15W) 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR

p721f

Abstract: P721 TLP721F p72-1f VDE0303Part1
Contextual Info: TLP721 D4 series (T L P 7 2 H D 4 ) ATTACHMENT : SPECIFICATIONS FOR VDE0884 OPTION Types : TLP721, TLP721F Type designations for ‘ Option : (D4) ’ , which are tested under VDE0884 requirements. Ex. : TLP721 (D4-GR-LF4) D4 : VDE0884 option GR : CTR rank name

Contextual Info: TOSHIBA TLP3540 TOSHIBA PHOTOCOUPLER GaAs IRED & PHOTO-MOS FET T L P 3 540 Unit in mm M EM O R Y TESTERS LOGIC 1C TESTERS DATA RECORDING EQUIPMENT 7 6 5 CT1 n_ n l~P MEASURING EQUIPMENT TLP3540 is a photorelay and consists of a GaAs infrared emitting diode optically coupled to a photo-MOSFET in a 8-pin DIP package.

Contextual Info: TOSHIBA TLP3111 TOSHIBA PHOTOCOUPLER GaAs IRED & PHOTO-MOS FET T• I Pm v? 1■ 1■ 1■ MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS The TOSHIBA MINI FLAT PHOTO RELAY TLP3111 is a small outline photo relay, suitable for surface m ount assembly.

VDE0884

Contextual Info: TLP12KD4 T LPl 2 1 (0 4 ) ATTACHMENT : SPECIFICATIONS FOR VDE0884 OPTION Types : TLP121 Type designations for ‘Option : (D4)’ , which are tested under VDE0884 requirements. Ex. : TLP121 (D4-GR-TPR) D4 : VDE0884 option GR CTR rank name TPR : standard taping name

P104W

Abstract: 2SC2104
Contextual Info: SILICON NPN EPITAXIAL PLANAR TYPE 2SC2104 Unit in mm UHF BAND POWER AMPLIFIER APPLICATIONS. FEATURES: . Output Power : P0=3W Min. (f=470MHz, VCC=12.6V, P1=0.4W) . 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR @ VcC=15V, Pi=0.4W, f=470MHz

a1310a

Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS _ _ SCBS165A-AUGUST 1 9 9 3 - REVISED AUGUST 1994 Members of the Texas Instruments

TLP508

Abstract: thyristor 072 0043 sl 1008 transistor thyristor st 103
Contextual Info: 9. Reliability 9.1 General In recent years, as the application fields for photo couplers expand, more discussions are being made on reliability. For reliability improvement, it is insufficient to perform strinct process management and to have reliability tests such as life test and environmental tests. It is necessary to

Contextual Info: SAFETY ORGANIZATIONS RELIABILITY SPECIFICATIONS: THIS FILTER HAS BEEN FORMALLY RECOGNIZED, CERTIFIED DR APPROVED BY THE LISTED AGENCY. THEREFORE, ALL TEST/REQUIREMENTS SPECIFIED IN THE TEST REVISION DF THE FOLLOWING AGENCY STANDARDS HAVE BEEN MET: STORAGE TEMPERATURE: -40°C TO +85°C

74ABTH18646A

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O

programmable storage device

Contextual Info: TMS29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE SMJS816B-NOVEMBER1990-REVISED JANUARY 1993 FM PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE'“ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible * Organization . . . 2048 x 8-Bit Flash Memory

2SC2178

Abstract: copper wire
Contextual Info: SILICON NPN EPITAXIAL PLANAR TYPE 2SC2178 Unit in mm VHF BAND POWER AMPLIFIER APPLICATIONS. FEATURES : Output Power : Po=15W Min. ( f=175MHz, VCC=12.5V, Pi=1.3W ) 100% Tested for Load Mismatch Stress at All Phase Angles with 30:1 VSWR @ VCC=15V, Pl=1.3W, f=175MHz

tle2202

Contextual Info: TLC2202, TLC2202A JL C 2 2 0 2 B , TLC2202Y Advanced LinCM O S LOW-NOISE PRECISION DUAL OPERATIONAL AMPLIFIERS D3497, MAY 1990 - REVISED AUGUST 1991 TLC2202B Is 100% Tested for Noise: 25 nV/VHz Max at f = 10 Hz 12 nV/VRz Max at f = 1 kHz Low Input Offset Voltage . . . 500 jiV Max

Contextual Info: 4 THIS DRAWING IS UNPUBLISHED. COPYRIGHT - 2 3 RELEASED BY TYCO ELECTRONICS CORPORATION. FOR PUBLICATION LOC ALL RIGHTS RESERVED. HT DI5T 0 0 R E V IS IO N S H LTR DESCRIPTION NOTES: H I RO S E C O M P A T I B L E , 2 . 0 M M MATI NG HEI GHT. 1 0 0 % E L E C T R I CA L TEST I NG FOR:

3Y20

Contextual Info: SN75186 QUADRUPLE DRIVER/RECEIVER WITH LOOPBACK D3389. FEBRUARY 1990 FN PACKAGE Meets Standards RS-232-C, EIA-232-D, and CCITT V.28 TOP VIEW Four Independent Drivers and Receivers CM O Ü z S I—JI—] L J L J , A 3 2 1 1 LB ] 5 N < Loopback Mode Functionally Self-Tests

TLP3375

Contextual Info: TLP3375 Photocouplers Photorelay TLP3375 1. Applications • High-Speed Memory Testers • High-Speed Logic IC Testers • Radio-Frequency Measuring Instruments • ATE Automatic Test Equipment 2. General The TLP3375 photorelay consists of a photo MOSFET optically coupled to an infrared light emitting diode. It is

C3 marking code sot 223

Abstract: MMIC marking code C3 sot89 cs 1694
Contextual Info: TQP369182 DC-6 GHz Gain Block Applications •      Wireless Infrastructure CATV / SATV / MoCA Point to Point Defense & Aerospace Test & Measurement Equipment General Purpose Wireless Product Features          SOT-89 Package

Contextual Info: TQP4M9072 High Linearity 6-Bit, 31.5dB Digital Step Attenuator Applications •     Mobile Infrastructure LTE / WCDMA / CDMA / EDGE Test Equipments and Sensors IF and RF Applications General Purpose Wireless 24-pin 4x4mm leadless QFN package 3

Contextual Info: TLC1542C, TLC1542I, TLC1542M, TLC1542Q, TLC1543C, TLC1543I, TLC1543Q 10-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS SLAS052E – MARCH 1992 – OCTOBER 1998 10-Bit Resolution A/D Converter 11 Analog Input Channels Three Built-In Self-Test Modes

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE