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    CC251X

    Abstract: DN114 cc1110 CC2430 CC2431 CC2510 CC2511
    Contextual Info: Design Note DN114 Test Signals for debug purpose By Kjetil Holstad Keywords • • • • • 1 • • • • SoC Debug Test signals CC1110 CC1111 CC2510 CC2511 CC2430 CC2431 Introduction The LPRF SoCs from Texas Instruments contains a few test signals useful to debug


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    dn114cc1110cc1111cc2510+5cc2511cc2430cc2431swra241acc251x PDF