SPICE PARAMETER SN74 Search Results

scba004

Abstract: Modified Coffin-Manson Equation Calculations transistor tt 2222 DIMM 1998 e1414 PC2100 Q13A SN74SSTV16859 SN74SSTV32852 original Coffin-Manson Equation
Contextual Info: Application Report SCEA025 - November 2001 Application of the SN74SSTV32852 in Stacked, Low-Profile 1U PC-1600/2100 DIMMs Frank Mortan, Tomdio Nana, and Stephen Nolan Standard Linear & Logic ABSTRACT Many memory-module manufacturers are turning to low-profile (1U) DIMM designs that

ABT18646

Abstract: SN74ABT18646 SN74ABT18646PM
Contextual Info: SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

SN74ABT18652

Abstract: SN74ABT18652PM
Contextual Info: SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Contextual Info: SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Contextual Info: SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Contextual Info: SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

ABT18646

Abstract: SN74ABT18646 SN74ABT18646PM SN74ABT18646PMG4
Contextual Info: SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Contextual Info: SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Contextual Info: SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

ABT18646

Abstract: SN54ABT18646 SN74ABT18646 SN74ABT18646PM SN74ABT18646PMG4
Contextual Info: SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

SN74ABT18652

Abstract: SN74ABT18652PM SN74ABT18652PMG4
Contextual Info: SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B – AUGUST 1992 – REVISED JANUARY 2002 D D D D Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

SN74TVC3010

Abstract: TVC16222
Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088A – APRIL 1999 – REVISED JUNE 1999 D D D D D Designed to be Used in Voltage-Limiting Applications 6.5-Ω On-State Connection Between Ports A and B Flow-Through Pinout for Ease of Printed Circuit Board Trace Routing

TVC16222

Abstract: SN74TVC16222
Contextual Info: SN74TVC16222 22-BIT VOLTAGE CLAMP SCDS087A – APRIL 1999 – REVISED JUNE 1999 D D D D D Designed to be Used in Voltage-Limiting Applications 6.5-Ω On-State Connection Between Ports A and B Flow-Through Pinout for Ease of Printed Circuit Board Trace Routing

Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088B – APRIL 1999 – REVISED MAY 2000 D Designed to be Used in Voltage-Limiting Applications DBQ, DGV, DW, OR PW PACKAGE TOP VIEW D 6.5-Ω On-State Connection Between Ports D D D GND A1 A2 A3 A4 A5 A6 A7 A8 A9 A10

ABT18646

Abstract: SN54ABT18646 SN74ABT18646
Contextual Info: SN54ABT18646, SN74ABT18646 SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS131–AUGUST 1992–REVISED OCTOBER 1992 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SN54ABT18652

Abstract: SN74ABT18652
Contextual Info: SN54ABT18652, SN74ABT18652 SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS SCBS132A – AUGUST 1992 – REVISED OCTOBER 1992 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

tms 160

Abstract: SN54ABT18652 SN74ABT18652
Contextual Info: SN54ABT18652, SN74ABT18652 SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS SCBS132A – AUGUST 1992 – REVISED OCTOBER 1992 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

ABT18646

Abstract: SN54ABT18646 SN74ABT18646
Contextual Info: SN54ABT18646, SN74ABT18646 SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS131–AUGUST 1992–REVISED OCTOBER 1992 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SN74TVC3010

Abstract: SN74TVC3010DBQR SN74TVC3010DGVR SN74TVC3010DW SN74TVC3010DWR SN74TVC3010PWR TVC3010
Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088C – APRIL 1999 – REVISED JANUARY 2001 D Designed to be Used in Voltage-Limiting DBQ, DGV, DW, OR PW PACKAGE TOP VIEW Applications D 6.5-Ω On-State Connection Between Ports D D GND A1 A2 A3 A4 A5 A6 A7 A8 A9 A10

Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088E – APRIL 1999 – REVISED NOVEMBER 2001 D D D D DBQ, DGV, DW, OR PW PACKAGE TOP VIEW Designed to be Used in Voltage-Limiting Applications 6.5-Ω On-State Connection Between Ports A and B Flow-Through Pinout for Ease of Printed

SN74TVC3010

Abstract: SN74TVC3010DBQR SN74TVC3010DGVR SN74TVC3010DW SN74TVC3010DWR SN74TVC3010PWR
Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088D – APRIL 1999 – REVISED MARCH 2001 D D D D DBQ, DGV, DW, OR PW PACKAGE TOP VIEW Designed to be Used in Voltage-Limiting Applications 6.5-Ω On-State Connection Between Ports A and B Flow-Through Pinout for Ease of Printed

Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088B – APRIL 1999 – REVISED MAY 2000 D Designed to be Used in Voltage-Limiting Applications DBQ, DGV, DW, OR PW PACKAGE TOP VIEW D 6.5-Ω On-State Connection Between Ports D D D GND A1 A2 A3 A4 A5 A6 A7 A8 A9 A10

Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088B – APRIL 1999 – REVISED MAY 2000 D Designed to be Used in Voltage-Limiting Applications DBQ, DGV, DW, OR PW PACKAGE TOP VIEW D 6.5-Ω On-State Connection Between Ports D D D GND A1 A2 A3 A4 A5 A6 A7 A8 A9 A10

Contextual Info: SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088B – APRIL 1999 – REVISED MAY 2000 D Designed to be Used in Voltage-Limiting Applications DBQ, DGV, DW, OR PW PACKAGE TOP VIEW D 6.5-Ω On-State Connection Between Ports D D D GND A1 A2 A3 A4 A5 A6 A7 A8 A9 A10