SN74BCT8374A Search Results

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

F374

Abstract: SN54BCT8374A SN74BCT8374A
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

F374

Abstract: SN54BCT8374A SN74BCT8374A
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

F374

Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

GDS741S

Abstract: SN54BCT8374A SN74BCT8374A SCBS045D-JUNE BI72 74BCT8374
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS S C B S 0 4 5 D -J U N E 1 9 9 0 - REVISED A P R IL 1 99 4 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits SN54BCT8374A . . . JT PACKAGE

F374

Abstract: SN54BCT8374A SN74BCT8374A
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

F374

Abstract: SN54BCT8374A SN74BCT8374A
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

BCT8374A

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

BCT8374

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E - JUNE 1990 - REVISED JULY 1996 SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW M e m b e r s of the Texas I n s t r u m e nt s SC O PE F a mi l y of Testabil ity P r o d u c t s

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

shift register by using D flip-flop

Abstract: F374 SN54BCT8374A SN74BCT8374A
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

F374

Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

ABT245

Abstract: F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW SN74BCT8244A an7005 ti8245
Contextual Info: Using ispGDX to Replace Texas Instruments Boundary Scan Bus Devices TM sible, especially with 5.0 ns Tpd and Tco. After a brief overview of the ispGDX architecture, several examples illustrating the use of the ispGDX devices for boundary scan bus devices follow. For more detailed information

SN54LVT18502

Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
Contextual Info: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the