SJ02 Search Results
SJ02 Price and Stock
TAIYO YUDEN MSASJ021SB5103MWNA01CAP CER 10000PF 6.3V X5R 008004 |
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MSASJ021SB5103MWNA01 | Cut Tape | 48,500 | 1 |
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MSASJ021SB5103MWNA01 | Reel | 10 Weeks | 50,000 |
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MSASJ021SB5103MWNA01 | Reel | 17 Weeks | 50,000 |
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TAIYO YUDEN MSASJ021SB5103KWNA01CAP CER 10000PF 6.3V X5R 008004 |
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MSASJ021SB5103KWNA01 | Digi-Reel | 47,710 | 1 |
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MSASJ021SB5103KWNA01 | Reel | 7 Weeks | 50,000 |
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MSASJ021SB5103KWNA01 | Reel | 17 Weeks | 50,000 |
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TAIYO YUDEN MSASJ021SB5472MWNA01CAP CER 4700PF 6.3V X5R 008004 |
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MSASJ021SB5472MWNA01 | Digi-Reel | 30,000 | 1 |
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MSASJ021SB5472MWNA01 | Reel | 7 Weeks | 50,000 |
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MSASJ021SB5472MWNA01 | Reel | 17 Weeks | 50,000 |
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Zilog Inc Z8F1232SJ020EGIC MCU 8BIT 12KB FLASH 28SOIC |
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Z8F1232SJ020EG | Tube | 6,618 | 1 |
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Zilog Inc Z8F043ASJ020EGIC MCU 8BIT 4KB FLASH 28SOIC |
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Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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Z8F043ASJ020EG | Tube | 6,401 | 1 |
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SJ02 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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Diode SMD SJ02
Abstract: sj02 MM013 UT69151DXE MM012 UT69151 UT69151XTE5 1553 SUmmit 1553bus UT69151XTE15
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SJ01/SJ02 Diode SMD SJ02 sj02 MM013 UT69151DXE MM012 UT69151 UT69151XTE5 1553 SUmmit 1553bus UT69151XTE15 | |
jtag sequence
Abstract: Tbb 38 PC10 PC11 SJ02
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EXI22) EXI23) EXI24) EXI25) EXI26) EXI27) EXI28) EXI29) EXI30) EXI31) jtag sequence Tbb 38 PC10 PC11 SJ02 | |
Contextual Info: O O F - o - 2 1 2 F 05.08 JK ft 5-ñ B REV. D ATE SECT. (SCALE (N0TE1 ) DON W. R ft « NO. SI Ü DR. DESCRIPTION a üs CHK. $ m APPD. * R APPD. A-A 5:1) > V CNOTEB) ^ 2. J W' Æ\ tb*. 3. # í N o . £•>¥■§ dj'i'. 4. ^n°p(á XI L— AG 5 — 16S-D3C1-A(SJ022876)¿íiÉtfi¿'W¿:£, |
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16S-D3C1-A SJ022876) IL-A05-1 | |
DCF-C-E206-2C
Abstract: connector specification
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JACS-1266-0 SJ021769, SJ021832 SJ021770 SJ021771 DCF-C-E206-2C JACS-1266-0 connector specification | |
Contextual Info: b 9S59Z0PS m DON NO. m m ^55 92. 5. 2C 3 0 5 3 5 92. 6. 2S 3 0 6 9 9 8 3. 5 3. 5 « -^ < -> « - => ^ ^ 3 3798 * i - \ V i i i I i ii * i i * — - 1 ' Ì y* 94. 5. 16 |
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9S59Z0PS SJ026556 | |
FBM-L11-201209-221LMAT
Abstract: k 2761 FBM-L11-322513-151LMAT SP020011410 ls-2761 FBM-L11-201209-221-LMAT C65 004 C65 - 004 p 01 k 2761 BGA-708
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BO001 BO002 BO003 BO004 455919BO001 LS-2761 EFL50 455919BO002 FBM-L11-201209-221LMAT k 2761 FBM-L11-322513-151LMAT SP020011410 FBM-L11-201209-221-LMAT C65 004 C65 - 004 p 01 k 2761 BGA-708 | |
Contextual Info: HS-6664RH-T Data Sheet July 1999 File Number Radiation Hardened 8 K x 8 CMOS PROM Features Harris’ Satellite Applications Flow SAF devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended |
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HS-6664RH-T 100kRAD MIL-PRF-38535 HS-6664RH-T 1-800-4-HARRIS | |
Contextual Info: ACTS541T D a ta s h e e t Ju ly 1999 Radiation Hardened Octal Three-State Buffer/Line Driver Harris’ Satellite Applications Flow SAF devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended |
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ACTS541T 100kRAD MIL-PRF-38535 1-800-4-HARRIS | |
Truth Table 74160
Abstract: Truth Table 74161
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HCTS160T MIL-PRF-38535 100kRAD HCTS160T 1-800-4-HARRIS Truth Table 74160 Truth Table 74161 | |
Contextual Info: HCTS374T Semiconductor January 1999 Data Sheet File Number Features Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered • QM L Class T, Per MIL-PRF-38535 • Radiation Performance Harris’ Satellite Applications Flow SAF devices are fully |
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HCTS374T MIL-PRF-38535 100kRAD HCTS374T 1-800-4-HARR | |
Contextual Info: L & *0N B DATE * REV. E93Z30PS 11 0 N IM V H Q ±0. 1 B ^ ± 0 . 03 A <t> 0 . 5 8 (N O T E ± 0 .1 5 5 ±0 • 0 3 0 0.78 3) in Lft *• <N o A O ■H ^ S " in 21.No v. 1 9 9 5 F 37073 ADDED 2 0 3 0 -1 5 M I A D D ED 30 C O N T A C T S 3 OfëTfcMfëCgEjÇ |
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E93Z30PS SJ027263 | |
AC300V
Abstract: RH07 AW62
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SJ032049 AC300V RH07 AW62 | |
Contextual Info: 5-RB JR £ E fró sz o n s REV. -ON ON IMVdQ ##fflül $ 80 he-=H DESORIPTION fi DR. ÜÉ OHK. & U A PPD. A PP D. 7.Feb.1997 39530 REDRAW! AND ADDED ITB4 AND REVISED PART No. dto N.ONODERA H.OBIKANE K.IBARAKI T.MORINO 9.0c t .1997 40786 ADDED ITEM eto. |
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Contextual Info: SYM. Z S E 9 Z 0 P S V *on o n iMvaa ( R E F . 3 DCN 3682 4 DATE B DE S C R I P T I ON ^ M 1*1 & NO. ft DRAWN SI M CHECKED 20. Oot '95 M. OOWA RE DR AWN T. OKA APP ’D & fg APP ’D s n 'T^o Tq K! .Qmw. ^ -e- > |
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SJ026357 | |
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Contextual Info: %-n b DATE J& & REV. SO L 6 E 0 P S ‘ ON 0NI MVHa - ^#M DON W. ñ & M D ESCRIPTIO N NO. M M $ H APPD. & s CHK. DR. & APPD. m P . C . B. H O L E P A T T E R N S ( R E F. Ji/U'tr — /In— a > ( ) ) ±0 . 2 (CONTACT NO. 1 4 0,15, ±0.05 2 —0 2 . 2 : |
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Contextual Info: JREV. R & 6 I 16£0PS %-n B DON D AT E t i ñ § D E S C R I P T I ON NO. M DR.m £ a ñ m APPD. CHK. & m APPD. ‘ON ö N I M V Ü Q ^ § M ü CONTACTS No. :40, 60, 80, 100. 120 ±0.05 2 -02.2 I-! POLARIZING m\±^ CONTACTS No. :BO, 50, 70 ±0.05 N— 0 0 . 8 |
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TX14-100R- TX14-120R- | |
Contextual Info: W. M ft & D E S C R I PT I ON NO. No. :40, 60, 80, 100, 120 I"! POLARIZING m ± ^ $i m DR. CONTACTS il N- 0 0.8 POLARIZING U APPD. ±0 . 0 5 KEY N - <f> 0 . 8 i -TTTTi - <H- H- -o— oN/o 1 i 1 —HH-( - ±0 . 2 èü CHK. No. :30, BO, 70 ±0.05 KEY |
OCR Scan |
DOF-O-213D | |
102-080Contextual Info: V Û 8 Û Z 0 IPS ' ON $-ñ B DATE REV. 2 9N I MVÜQ DCN 7.D e c . 2004 M F*l § DESCRIPTION NO. 0 5 6 346 C lerical error m s íi É C HK. DR. - - S.HARA Y.SATOU correction & IS APPD. APPD. o y 41 Lfl ±0.2 7 ±0.05 2 . 5 X 5= 1 2.5 6 - ±0.05 1.1 / 1 |
OCR Scan |
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Contextual Info: HCS244T Semiconductor December 1998 Data Sheet Radiation Hardened Octal Buffer/Line Driver, Three-State Harris’ Satellite Applications Flow SAF devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended |
OCR Scan |
HCS244T 100kRAD MIL-PRF-38535 HCS244T 1-800-4-HARR | |
Contextual Info: HCTS244T Semiconductor December 1998 Data Sheet Radiation Hardened Octal Buffer/Line Driver, Three-State Harris’ Satellite Applications Flow SAF devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended |
OCR Scan |
HCTS244T 100kRAD MIL-PRF-38535 HCTS244T 1-800-4-HARRIS | |
Contextual Info: HCTS74T Semiconductor January 1999 Data Sheet Radiation Hardened Duai-D Flip-Flop with Set and Reset Harris’ Satellite Applications Flow SAF devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended |
OCR Scan |
HCTS74T 100kRAD MIL-PRF-38535 HCTS74T 1-800-4-HARR | |
Contextual Info: CD4015BT Semiconductor January 1999 Data Sheet CMOS Dual 4-Stage Static Shift Register With Serial Input/Parallel Output Harris’ Satellite Applications Flow SAF devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended |
OCR Scan |
CD4015BT 100kRAD MIL-PRF-38535 12MHz CD4015BT 1-800-4-HARR | |
Contextual Info: HCTS74T Data Sheet July 1999 Radiation Hardened Duai-D Flip-Flop with Set and Reset Harris’ Satellite Applications Flow SAF devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended |
OCR Scan |
HCTS74T 100kRAD MIL-PRF-38535 HCTS74T 1-800-4-HARRIS | |
Contextual Info: %-n b DON NO. 2 19.Aug.200B 53072 3 8. Sep.2003 053208 të. & REV. 60ZŸZ0PS ’ON ONIMVdQ ±o. 5 25. 8 DATE K M P3 S m E a Üâ CHK. DR. DE S C R I PT I ON R ED RA W N AND A D D E D P.O.B. HOLE P A T T E R N S ( REF. e t c . S.HARA CHANGED TO B I L I N G U A L |
OCR Scan |
60ZYZ0PS JACS-1309 SJ024209 |