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Contextual Info: Revision 16 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)
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tm1019mil-std-883b |
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w32 smd transistor
Abstract: rtax250sl RTAX2000S w32 smd transistor 143 41-bit Carry Look-ahead Adder RTAX2000SL RTAX4000S BY415 RTAX4000D LG1152
Contextual Info: Revision 14 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)
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tm1019mil-std-883bw32 smd transistorrtax250sl+8rtax2000sw32 smd transistor 14341-bit carry look-ahead adderrtax2000slrtax4000sby415rtax4000dlg1152
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RTAX2000D
Abstract: LG1152 CDB 455 C34
Contextual Info: Revision 14 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)
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tm1019rtax2000dlg1152cdb 455 c34 |
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624 CCGA
Abstract: CQ352 transistor prc 606 j rtax250 RTAX2000 rtax4000
Contextual Info: Revision 14 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)
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tm1019624 ccgacq352transistor prc 606 j+3rtax250rtax2000rtax4000
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RTAX250
Abstract: RTAX4000DL RTAX4000D CG624 RTAX4000S LG1152 TRANSISTOR TB 772 SL RTAX2000S ACTEL CCGA 624 mechanical transistor prc 606 j
Contextual Info: Revision 15 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)
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tm1019rtax250rtax4000dlrtax4000d+7cg624rtax4000slg1152transistor tb 772 slrtax2000sactel ccga 624 mechanicaltransistor prc 606 j
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