PROTON SOURCE Search Results

Emcore solar cell

Abstract: GaAs tunnel diode multi-junction "solar cell" NIEL proton tunnel diode tunnel diode GaAs GAAS multi-junction solar cell" NIEL for solar cell inp
Contextual Info: PROTON AND ELECTRON RADIATION ANALYSIS OF GaInP2/GaAs SOLAR CELLS P. R. Sharps, C. H. Thang, P. A. Martin, and H. Q. Hou EMCORE Photovoltaics 10420 Research Road SE Albuquerque, NM 87112 ABSTRACT Electron and proton radiation damage analysis of solar cells is extremely important for predicting the response of

Contextual Info: 66193 PROTON RADIATION TOLERANT OPTOCOUPLER REPLACEMENT FOR 3C91C OPTOELECTRONIC PRODUCTS DIVISION 05/06/2013 Features: Applications: •          High Reliability Base lead eliminated for improved noise immunity Rugged package

Contextual Info: 66193 PROTON RADIATION TOLERANT OPTOCOUPLER REPLACEMENT FOR 3C91C OPTOELECTRONIC PRODUCTS DIVISION 05/06/2013 Features: Applications: •          High Reliability Base lead eliminated for improved noise immunity Rugged package

Contextual Info: Application Note 1938 Single Event Effects SEE Testing of the ISL71091SEHxx Precision Voltage References Family Introduction SEE Test Objectives The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects

vcsel spice model

Abstract: 1310nm led Modulating VCSELs 1310nm photodiode 6 Ghz 10Gbps TOcan
Contextual Info: APPLICATION NOTE Modulating Finisar Oxide VCSELs INTRODUCTION In the last decade, proton isolated VCSELs have become the industry standard for short wavelength 850nm gigabit data communications links on multimode fiber. As the speeds have increased beyond 2Gbps, however, the oxide isolated

3C91C

Abstract: proton 3C91
Contextual Info: 66193 Mii PROTON RADIATION TOLERANT OPTOCOUPLER REPLACEMENT FOR 3C91C OPTOELECTRONIC PRODUCTS DIVISION Rev A 1/11/08 Features: Applications: • • • • • • • • • • High Reliability Base lead eliminated for improved noise immunity Rugged package

Contextual Info: Application Note 1894 Author: Nick van Vonno Single Event Effects SEE Testing of the ISL71590SEH Temperature Sensor Introduction The intense proton and heavy ion environment encountered in space applications can cause a variety of destructive and nondestructive single-event effects in electronic circuitry,

prisma

Abstract: proton emv 7816 smartcard EMV CARDS DDA proton basic e purse R3BC proton source emv card "electronic purse"
Contextual Info: Proton PRISMA smartcard products Unique flexibility for every requirement STMicroelectronics has an extensive, modular offering to meet the needs of the smartcard supply chain and card issuers. Whatever your requirements - card specifications, masks, chips, finished cards or personalized cards - ST,

laser diode philips

Abstract: diode code ae
Contextual Info: Philips Components cql72a/d _ J _ DEVELOPMENT DATA This data sheet contains advance information and specifications which are subject to change without notice. HIGH POWER COLLIMATOR PEN The CQL72A/D is a high power collim ator pen containing a MOVPE proton bombarded laser. This

renesas Lot Code Identification

Abstract: 3M Touch Systems
Contextual Info: CYRS1543AV18 CYRS1545AV18 72-Mbit QDR II+ SRAM Four-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Four-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

Contextual Info: CYRS1542AV18 CYRS1544AV18 72-Mbit QDR II+ SRAM Two-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Two-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

Contextual Info: CYRS1543AV18 CYRS1545AV18 72-Mbit QDR II+ SRAM Four-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Four-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

5962F1120101QXA

Abstract: 5962F1120101VXA CYRS1544AV18-200GCMB 3M Touch Systems CYPT1542AV18-250GCMB CYRS1542AV18
Contextual Info: CYRS1542AV18 CYRS1544AV18 72-Mbit QDR II+ SRAM Two-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Two-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

5962F1120102QXA

Abstract: samsung Lot Code Identification samsung capacitance Lot Code Identification 3M Touch Systems
Contextual Info: CYRS1543AV18 CYRS1545AV18 72-Mbit QDR II+ SRAM Four-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Four-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

renesas Lot Code Identification

Abstract: 3M Touch Systems si 1225 hd
Contextual Info: CYRS1543AV18 CYRS1545AV18 72-Mbit QDR II+ SRAM Four-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Four-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

gemplus

Abstract: AT83C21GC SSOP24 emv 7816 smart card atmel tape and reel
Contextual Info: Features • Smart Card Interface • • • • – Compliance with Standards • ISO/IEC 7816-1, 2, 3 and 4 • EMV 2000 • CB • Mondex , Proton, ZKA, Other: Contact Gemplus® – Supported Smart Cards • Number of Smart Cards Supported: 1 • Asynchronous Cards: T=0 and T=1

4N50

Abstract: prescalers Upset
Contextual Info: W hat are Single Event Effects? Single Event Effects are caused by a single, energetic particle which can originate from the ions in a cosmic ray galactic or solar in origin or from a high energy proton. Two major types of Single Event Effects are described below; Single Event Upsets (SEU) are

AT83C5121

Abstract: AT83C21GC ISO/IEC 7816-1 QFN32 SSOP24 gemplus AT83C21GCxxx-PURUL gemplus and card qfn32 tray
Contextual Info: Features • Smart Card Interface • • • • – Compliance with Standards • ISO/IEC 7816-1, 2, 3 and 4 • EMV 2000 • CB • Mondex , Proton, ZKA, Other: Contact Gemplus® – Supported Smart Cards • Number of Smart Cards Supported: 1 • Asynchronous Cards: T=0 and T=1

mondex

Abstract: gemplus AT83C21GC SSOP24
Contextual Info: Features • Smart Card Interface • • • • – Compliance with Standards • ISO/IEC 7816-1, 2, 3 and 4 • EMV 2000 • CB • Mondex , Proton, ZKA, Other: Contact Gemplus® – Supported Smart Cards • Number of Smart Cards Supported: 1 • Asynchronous Cards: T=0 and T=1

ISO/IEC 7816-1

Abstract: "iso 7816-1" gemplus and card ATMEL smart card iso 7816-1 oscillator resonator capacitor resistor AT83C21GC SSOP24 gemplus
Contextual Info: Features • Smart Card Interface • • • • – Compliance with Standards • ISO/IEC 7816-1, 2, 3 and 4 • EMV V96 • CB • Mondex , Proton, ZKA, Other: Contact Gemplus® – Supported Smart Cards • Number of Smart Cards Supported: 1 • Asynchronous Cards: T=0 and T=1

cots fpga radiation

Abstract: Upset CREME96 fpga radiation COTS XQVR300 RAM SEU
Contextual Info: Radiation Characterization, and SEU Mitigation, of the Virtex FPGA for SpaceBased Reconfigurable Computing † Earl Fuller2, Michael Caffrey1, Anthony Salazar1, Carl Carmichael3, Joe Fabula 3 1 Los Alamos National Laboratory 2 Novus Technologies, Inc. 3 Xilinx, Inc.

CREME96

Abstract: cots fpga radiation 115641 fpga radiation COTS radiation cots cmos RAM SEU proton XQVR300
Contextual Info: Radiation Testing Update, SEU Mitigation, and Availability Analysis of the Virtex FPGA for Space Reconfigurable Computing † Earl Fuller2, Michael Caffrey1, Anthony Salazar1, Carl Carmichael3, Joe Fabula 3 1 Los Alamos National Laboratory 2 Novus Technologies, Inc.

TIBC

Abstract: advantis crypto smartcard visa TIBC 3.0 data access CEPS PKCS11 EMV CARDS DDA TIBC 3.0 implementation data access prisma carte moneo
Contextual Info: System-on-Chip solutions for finance Latest-generation smartcard solutions for banking STMicroelectronics is a world leader in the development and delivery of chip products and solutions for the banking sector. This is the result of over 20 years in the industry, delivering

rcl 3702

Abstract: Mii53250 B0847 davis scott fluke 8050a digital multimeter HSSR-7110 Model 434 jl 54123 HP34401A optocouplers
Contextual Info: 905 E. Walnut Street Garland, Texas 75040 TEL 972 272-3571 FAX (972) 494-2281 www.micropac.com Micropac Industries, Inc. MICROPAC INDUSTRIES, INC. HYBRID MICROELECTRONICS DIVISION RADIATION REPORTS 04/27/01 INTRODUCTION TO RADIATION TESTING REPORTS Micropac Industries Inc. (Mii) wishes to thank Ken Label of NASA Goddard Space Flight Center