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    PROBABILITY DISTRIBUTION FUNCTION Search Results

    PROBABILITY DISTRIBUTION FUNCTION Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MHM411-21
    		Murata Manufacturing Co Ltd Ionizer Module, 100-120VAC-input, Negative Ion PDF
    TCTH022AE
    		Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Push-pull type / FLAG signal latch function Datasheet
    TCTH012AE
    		Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=1μA / IDD=1.8μA / Push-pull type / FLAG signal latch function Datasheet
    TCTH022BE
    		Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Open-drain type / FLAG signal latch function Datasheet
    TCTH012BE
    		Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=1μA / IDD=1.8μA / Open-drain type / FLAG signal latch function Datasheet

    PROBABILITY DISTRIBUTION FUNCTION Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    th 20594

    Abstract: ix 0640 93459 1515 38940 74*214 15351 75542 83450 2N 8904 jis z 0237
    Contextual Info: ATTACHED TABLES IX. ATTACHED TABLES 1. ATTACHED TABLES 1.1 AQL SAMPLING TABLE 1.2 LTPD SAMPLING TABLE 1.3 PROBABILITY DENSITY OF NORMAL DISTRIBUTION 1.4 UPPER PROBABILITY OF NORMAL DISTRIBUTION 1.5 PERCENT POINTS OF NORMAL DISTRIBUTION 1.6 POISSON DISTRIBUTION PROBABILITY


    Original     		PDF

    ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES

    Abstract: taiyo yuden hybrid Electromagnetic Technologies GSM ANTEN TPS62040 AWK107 AWK212 CM01series No809 BK 5811
    Contextual Info: Special Topic1 1 Special Topic 1 Utilizing Amplitude Probability Distribution Mapping Measurements in the assessment and suppression of electromagnetic compatibility issues in digital wireless devices 2 Utilizing Amplitude Probability Distribution Mapping


    Original     		CM01series ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES taiyo yuden hybrid Electromagnetic Technologies GSM ANTEN TPS62040 AWK107 AWK212 CM01series No809 BK 5811 PDF

    stremler

    Abstract: AN37 AN-37
    Contextual Info: AN37 Application Note Noise Histogram Analysis by John Lis NOISELESS, IDEAL CONVERTER OFFSET ERROR RMS NOISE σ PROBABILITY DISTRIBUTION FUNCTION HISTOGRAM OF SAMPLES X PEAK-TO-PEAK NOISE Crystal Semiconductor Corporation P.O. Box 17847, Austin, TX 78760 512 445-7222 FAX: (512) 445-7581


    Original     		AN37REV1 stremler AN37 AN-37 PDF

    HM-RAE103

    Abstract: RPG100 HM-RAE103-0403 4 bit pn sequence generator gi 9640
    Contextual Info: HM-RAE103-0403 FIPS 140-2 Change Notice 1 Random Number Tests －Distribution Functions and Observed values of RPG100－ Ananda Vithanage† Takakuni Shimizu‡ 2/10/2003 FDK CORPORATION RPG Business Promotion Dept. 1 Kamanomae, Kamiyunagaya-machi, Jyoban, Iwaki-shi, Fukushima 972-8322, Japan


    Original     		HM-RAE103-0403 RPG100 HM-RAE103 HM-RAE103-0403 4 bit pn sequence generator gi 9640 PDF

    sx1 17

    Abstract: Transistor Equivalent list all diode List TI-89 TI92 TI-92 q1y #143
    Contextual Info: Statistics with List Editor Application for the TI-89 / TI-92 Plus The Statistics with List Editor application Stats/List Editor adds inferential and more advanced statistics functionality to the TI-89 / TI-92 Plus through an easy-to-use list editor interface.


    Original     		TI-89 TI-92 sx1 17 Transistor Equivalent list all diode List TI92 q1y #143 PDF

    HP16500C

    Abstract: adc matlab code polyfit AN2085 APP2085 MAX1191 MAX1192 MAX1193 matlab source
    Contextual Info: Maxim > App Notes > A/D and D/A CONVERSION/SAMPLING CIRCUITS HIGH-SPEED SIGNAL PROCESSING Keywords: code density test, histogram testing, ADC, high-speed data converter, integral nonlinearity, INL, differential nonlienarity, DNL, sample record, code count, bin width, probability density function, confidence


    Original     		com/an2085 MAX1191: MAX1192: MAX1193: AN2085, APP2085, Appnote2085, HP16500C adc matlab code polyfit AN2085 APP2085 MAX1191 MAX1192 MAX1193 matlab source PDF

    Coffin-Manson Equation

    Contextual Info: "Reliability and MTBF Overview" Prepared by Scott Speaks Vicor Reliability Engineering Introduction Reliability is defined as the probability that a device will perform its required function under stated conditions for a specific period of time. Predicting with some degree of


    Original     		PDF

    MIL-STD-188-165

    Abstract: noise source
    Contextual Info: 1420E_MWRF_MICR 7/5/06 1:47 PM Page 70 MEASURING NOISE SOURCES DESIGN Properly Understanding Noise In Test Applications The output of a noise generator is usually assumed to follow a true Gaussian distribution but, even when not truly Gaussian, noise can make an excellent signal for communications tests.


    Original     		PDF

    face RECOGNITION ALGORITHM

    Abstract: 14AD face RECOGNITION face RECOGNITION project kalman adaptive filter
    Contextual Info: Computer Vision Face Tracking For Use in a Perceptual User Interface Gary R. Bradski, Microcomputer Research Lab, Santa Clara, CA, Intel Corporation Index words: computer vision, face tracking, mean shift algorithm, perceptual user interface, 3D graphics interface


    Original     		PDF

    Z9015-1

    Abstract: RAW MATERIAL INSPECTION procedure Z8115
    Contextual Info: [ 6 ] Appendix Contents 1. Sampling Inspection . 1 1.1 Sampling Inspection . 1 1.2 1.3 Sampling Inspection Methods . 1


    Original     		Z8115 MIL-HDBK-217F Z9015-1 RAW MATERIAL INSPECTION procedure Z8115 PDF

    AB-059

    Contextual Info: APPLICATION BULLETIN Mailing Address: PO Box 11400 • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Tel: 602 746-1111 • Twx: 910-952-111 • Telex: 066-6491 • FAX (602) 889-1510 • Immediate Product Info: (800) 548-6132


    Original     		PDF

    HFTA-05

    Abstract: wolaver measure error rates trial MAX3675 MAX3875 wolaver
    Contextual Info: HFTA-05.0 Rev 2; 11/07 Statistical Confidence Levels for Estimating Error Probability Note: This article has been previously published in Lightwave Magazine April 2000 , and in the Maxim Engineering Journal (volume 37). Maxim Integrated Products Statistical Confidence Levels


    Original     		HFTA-05 MAX3675 MAX3875, wolaver measure error rates trial MAX3875 wolaver PDF

    probability distribution function

    Abstract: AN2878 APP2878 Random
    Contextual Info: Maxim > App Notes > General engineering topics Nov 25, 2003 Keywords: circuit analysis, circuit analysis with Excel, simple statistical circuit analysis APPLICATION NOTE 2878 Use statistical circuit analysis with Excel for yield analysis Abstract: This article describes a simple technique for circuit designers to perform a comprehensive statistical analysis on virtually any


    Original     		com/an2878 AN2878, APP2878, Appnote2878, probability distribution function AN2878 APP2878 Random PDF

    AB-059

    Abstract: burr-brown application bulletin selection
    Contextual Info: APPLICATION BULLETIN Mailing Address: PO Box 11400 • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Tel: 602 746-1111 • Twx: 910-952-111 • Telex: 066-6491 • FAX (602) 889-1510 • Immediate Product Info: (800) 548-6132


    Original     		PDF

    wolaver measure error rates

    Abstract: HFTA-05 wolaver probability distribution function MAX3675 MAX3752 MAX3875 MAX3876 MAX3877 MAX3878
    Contextual Info: FIBER OPTIC CIRCUITS Application Note 703: Oct 26, 2000 HFTA-05.0: Statistical Confidence Levels for Estimating BER Probability When testing for bit error ratio BER , how many bits do you need to transmit through a system in order achieve reasonable confidence in the results? This article provides the answer. It starts with the theory of


    Original     		HFTA-05 bi995. MAX3752: MAX3875: MAX3876: MAX3877: MAX3878: com/an703 wolaver measure error rates wolaver probability distribution function MAX3675 MAX3752 MAX3875 MAX3876 MAX3877 MAX3878 PDF

    AN2878

    Abstract: IC Ensemble APP2878
    Contextual Info: Maxim > App Notes > GENERAL ENGINEERING TOPICS Keywords: circuit analysis, circuit analysis with Excel, simple statistical circuit analysis Nov 25, 2003 APPLICATION NOTE 2878 Statistical Circuit Analysis with Excel Abstract: This article describes a simple technique for circuit designers to perform a comprehensive statistical


    Original     		com/an2878 AN2878, APP2878, Appnote2878, AN2878 IC Ensemble APP2878 PDF

    MAG-15

    Abstract: AN-578 C1995 DP8459
    Contextual Info: INTRODUCTION This note explains in detail the Strobe Function incorporated on the DP8459 ALL-Code Data Synchronizer It is recommended that the reader reviews the data sheet prior to reading this note The Strobe Function within the DP8459 chip is considerably more intricate and versatile than any


    Original     		DP8459 DP8459 MAG-15 AN-578 C1995 PDF

    Reliability and Statistics Glossary

    Abstract: reliabil ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES
    Contextual Info: Reliability and Statistics Glossary Vishay Semiconductors Reliability and Statistics Glossary DEFINITIONS Bias: Accelerated Life Test: A life test under conditions that are more severe than usual operating conditions. It is helpful, but not necessary, that a relationship between test severity and


    Original     		27-Aug-08 Reliability and Statistics Glossary reliabil ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES PDF

    MIL-STD-750 METHOD 2036 CONDITION E

    Abstract: pro-electron
    Contextual Info: Quality and Reliability Assurance Quality and Reliability Assurance QUALITY Two programs are utilized by Fairchild's DPST Group to ensure product reliability: 1. Reliability Qualification Program - for new products and changes in manufacturing processes, locations or materials.


    Original     		PDF

    5793

    Abstract: c 5793 pseudo random noise sequence generator notes 1N1280 power amplifier for sonar Sigma 8643
    Contextual Info: CHAPTER 2 Statistics, Probability and Noise Statistics and probability are used in Digital Signal Processing to characterize signals and the processes that generate them. For example, a primary use of DSP is to reduce interference, noise, and other undesirable components in acquired data. These may be an inherent part of the signal


    Original     		PDF

    ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES

    Abstract: outgoing raw material inspection procedure RAW MATERIAL INSPECTION procedure
    Contextual Info: VISHAY Vishay Semiconductors Reliability & Statistics Glossary Definitions Accelerated Life Test: A life test under conditions those are more severe than usual operating conditions. It is helpful, but not necessary, that a relationship between test severity and the probability


    Original     		19-Mar-04 ELECTRO MAGNETIC INTERFERENCE CONTROL TECHNIQUES outgoing raw material inspection procedure RAW MATERIAL INSPECTION procedure PDF

    PMC-950820

    Abstract: 9508 false GR-253-CORE B3783 STS-32
    Contextual Info: APPLICATION NOTE PMC-950820 ISSUE 2 SONET/SDH BIT ERROR THRESHOLD MONITORING SONET/SDH BIT ERROR THRESHOLD MONITORING APPLICATION NOTE ISSUE 2: SEPTEMBER 1998 PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA, INC., AND FOR ITS CUSTOMERS’ INTERNAL USE APPLICATION NOTE


    Original     		PMC-950820 PMC-950820 9508 false GR-253-CORE B3783 STS-32 PDF

    HFAN-4

    Contextual Info: Application Note: HFAN-4.0.2 Rev 1; 2/03 Converting between RMS and Peak-to-Peak Jitter at a Specified BER MAXIM High-Frequency/Fiber Communications Group Maxim Integrated Products 5HFAN402.DOC 07/28/03 Table of Contents 1 Introduction .3


    Original     		5HFAN402 HFAN-4 PDF

    HFAN-4

    Contextual Info: Application Note: HFAN-4.0.2 Rev 0; 12/00 Converting between RMS and Peak-to-Peak Jitter at a Specified BER MAXIM High-Frequency/Fiber Communications Group Maxim Integrated Products 3HFAN402.DOC 12/07/00 Table of Contents 1 Introduction .3


    Original     		3HFAN402 HFAN-4 PDF