OCTAL D TYPE EDGE TRIGGERED FLIP FLOPS Search Results
OCTAL D TYPE EDGE TRIGGERED FLIP FLOPS Result Highlights (5)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
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| 54F273/QSA |
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54F273 - Flip-Flop, D-Type, 8-Bit, Edge-Triggered, With Asynchronous Master Reset - Dual marked (5962-8855001SA) |
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| 54F273/QRA |
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54F273 - Flip-Flop, D-Type, 8-Bit, Edge-Triggered, With Asynchronous Master Reset - Dual marked (5962-8855001RA) |
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| 54F273/Q2A |
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54F273 - Flip-Flop, D-Type, 8-Bit, Edge-Triggered, With Asynchronous Master Reset - Dual marked (5962-88550012A) |
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| 54F374/BRA |
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54F374 - Octal D-Type Flip-Flop with TRI-STATE Outputs |
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| 54AC175/Q2A |
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54AC175 - D Flip-Flop, AC Series, Positive Edge Triggered, 4-Bit, Complementary Output, CMOS - Dual marked (5962-89552012A) |
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OCTAL D TYPE EDGE TRIGGERED FLIP FLOPS Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
74ABT273A
Abstract: 74ABT273AD 74ABT273AN 74ABT373 74ABT374 74ABT377
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OCR Scan |
74ABT273A 74ABT377 74ABT373 74ABT374 OT36Q-1 SQT360-1 MO-153AC 74ABT273AD 74ABT273AN | |
LV374A
Abstract: SN54LV374A SN74LV374A
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Original |
SN54LV374A, SN74LV374A SCLS408B LV374A SN54LV374A SN54LV374A SN74LV374A | |
SA00052Contextual Info: Philips Semiconductors Product specification Octal D-type flip-flop 74ABT273A FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The common buffered Clock CP |
OCR Scan |
74ABT273A 74ABT377 74ABT373 74ABT374 74ABT273A 74ABT 500ns SA00057 SA00052 | |
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Contextual Info: Product specification Philips Semiconductors 74ABT273A Octal D-type flip-flop FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The common buffered Clock CP |
OCR Scan |
74ABT273A 74ABT273A 74ABT377 74ABT373 74ABT 500ns | |
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Contextual Info: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation. |
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SN54LV374A, SN74LV374A SCLS408B MIL-STD-883, Flat/05/1999) SCAA029, SN74LV374A, ////roarer/root/data13/imaging/BIT. /08032000/TXII/08022000/sn74lv374a SZZU001B, | |
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Contextual Info: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation. |
Original |
SN54LV574A, SN74LV574A SCLS412C MIL-STD-883, SN74LV574ADBR SN74LV574ADGVR SN74LV574ADW SN74LV574ADWR SN74LV574APWR SCEM146, | |
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Contextual Info: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation. |
Original |
SN54LV374A, SN74LV374A SCLS408B MIL-STD-883, SCEM142, | |
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Contextual Info: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation. |
Original |
SN54LV574A, SN74LV574A SCLS412C MIL-STD-883, SCBA004C SDYA010 SDYA012 SCAA029, SZZU001B, SDYU001M, | |
SN54LV574A
Abstract: SN74LV574A
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SN54LV574A, SN74LV574A SCLS412C LV574A SN54LV574A SN54LV574A SN74LV574A | |
LS273
Abstract: DM74ALS273N DM54ALS273J DM74ALS DM74ALS273WM J20A 11-CLEAR TTL 74ALS
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OCR Scan |
DM54ALS273/DM74ALS273 TL/F/6216-2 LS273 DM74ALS273N DM54ALS273J DM74ALS DM74ALS273WM J20A 11-CLEAR TTL 74ALS | |
033SContextual Info: March 1996 Semiconductor DM64ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flop with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct clear input. |
OCR Scan |
DM64ALS273/DM74ALS273 DM64ALS273 DM74ALS273 bSD1122 033S | |
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Contextual Info: ZWÀ National ÆjA Semiconductor DM54ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flop with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct |
OCR Scan |
DM54ALS273/DM74ALS273 DM54ALS273 DM74ALS273 TL/F/6216-2 | |
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Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability |
Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A | |
F374
Abstract: SN54BCT8374A SN74BCT8374A
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Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A | |
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F374
Abstract: SN54BCT8374A SN74BCT8374A
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SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A | |
F374
Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
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SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SN74BCT8374 | |
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Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability |
Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT374 | |
F374
Abstract: SN54BCT8374A SN74BCT8374A
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Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A | |
BCT8374AContextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability |
Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT374 SCBA004C SDYA010 SDYA012 SZZU001B, SDYU001N, SCET004, BCT8374A | |
shift register by using D flip-flop
Abstract: F374 SN54BCT8374A SN74BCT8374A
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SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A shift register by using D flip-flop F374 SN54BCT8374A SN74BCT8374A | |
F374
Abstract: SN54BCT8374A SN74BCT8374A
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Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A | |
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Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability |
Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT374 | |
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Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability |
Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT374 | |
F374
Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
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Original |
SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374 | |