NEC RELIABILITY 1995 Search Results
NEC RELIABILITY 1995 Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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LP395Z/LFT1 |
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Ultra Reliable Power Transistor 3-TO-92 |
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LP395Z/NOPB |
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Ultra Reliable Power Transistor 3-TO-92 -40 to 125 |
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LM395T/NOPB |
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Ultra Reliable Power Transistor 3-TO-220 0 to 125 |
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LM395T |
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Ultra Reliable Power Transistor 3-TO-220 0 to 125 |
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LM195H/883 |
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Military Grade Ultra Reliable Power Transistor 3-TO -55 to 125 |
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NEC RELIABILITY 1995 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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NEC 10F
Abstract: low-noise L-band tuner nec mmic Monolithic Amplifier NEC JAPAN TRANSISTORS 1981 nec book
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devic87 P12647EJ3V0PF00 NEC 10F low-noise L-band tuner nec mmic Monolithic Amplifier NEC JAPAN TRANSISTORS 1981 nec book | |
Contextual Info: NEC SEMICONDUCTOR DEVICE RELIABILITY/QUALITY CONTROL SYSTEM MICROCOMPUTER LSI MEMORY IC GATE ARRAY LOGIC LSI 1. BASIC PRINCIPLES OF THE RELIABILITY/QUALITY CONTROL SYSTEM . 3 2. MANUFACTURING PROCESS QUALITY CONTROL . |
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marking code B2 NEC
Abstract: NEC tantalum capacitor 104 TANTALUM capacitor nec date code marking NEC 105M C105 SVHA1A225M SVHB21A475M SVHC1A156M DIP capacitor tantalum electronic corporation
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DE0202 marking code B2 NEC NEC tantalum capacitor 104 TANTALUM capacitor nec date code marking NEC 105M C105 SVHA1A225M SVHB21A475M SVHC1A156M DIP capacitor tantalum electronic corporation | |
General Micro-electronics
Abstract: SMT pitch roadmap ansys darveaux ansys CP-01019-1 Electronic Arrays FR4 thermal expansion constant vs temperature neural network BGA cte amkor flip
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TR-NWT-001217
Abstract: IEC60107-4-104 001217 MIL-STD-202F101D
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IEC60107-4-104 TR-NWT-001217) MIL-STD-202F-101D TR-NWT-001217 IEC60107-4-104 001217 MIL-STD-202F101D | |
PA101B
Abstract: PA103 PA104 MICRO-X TRANSISTOR MARK Q6 4 npn transistor ic 14pin upa101g PA102B UPA101 P10944EJ2V0AN00
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PA101 PA102 PA103 PA104 P10944EJ2V0AN00 PA101B PA103 PA104 MICRO-X TRANSISTOR MARK Q6 4 npn transistor ic 14pin upa101g PA102B UPA101 P10944EJ2V0AN00 | |
Contextual Info: MICROCOMPUTER LSI MEMORY 1C GATE ARRAY LOGIC LSI The information In th is docum ent 1« »ubject to change w ith o u t notice. Document No. Cl0983EJ3V0tF00 3rd edition (Previous No. iEi-1203) Date Published December 1995 P Printed in Japan NEC Corporation 1986 |
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Cl0983EJ3V0tF00 iEi-1203) | |
smt 35rv
Abstract: smd code marking NEC tantalum capacitor DN0J101M1S NRA225M10 smd code marking NEC capacitor MARKING CODE SMD JW DN0J 35rv transistor horizontal c 5936 104 TANTALUM capacitor nec
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VIC3151, smt 35rv smd code marking NEC tantalum capacitor DN0J101M1S NRA225M10 smd code marking NEC capacitor MARKING CODE SMD JW DN0J 35rv transistor horizontal c 5936 104 TANTALUM capacitor nec | |
d 65632
Abstract: 65612 nec L302 CMOS Transmission gate Specifications nec cmos CMOS-5 NEC OPENCAD CMOS Block library 700-207
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gf200 form
Abstract: IR100 8B10B PF200 S100 S200 TP100
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IEEE1394 IEEE1394-1995 8B10B P1394b PF200, GF200) S14238EU1V0PB00 gf200 form IR100 8B10B PF200 S100 S200 TP100 | |
nec d 588
Abstract: nec naming rule nec product naming rule NEC CMOS-4
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35-MICRON 66MHz nec d 588 nec naming rule nec product naming rule NEC CMOS-4 | |
uPD65801
Abstract: UPD65812 uPD65800 PD65810 PD65811 CMOS Transmission gate Specifications uPD65806 UPD65804 uPD65802 uPD65813
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PD65800 uPD65801 UPD65812 uPD65800 PD65810 PD65811 CMOS Transmission gate Specifications uPD65806 UPD65804 uPD65802 uPD65813 | |
uPD65801
Abstract: uPD65800 UPD65804
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H27SSS uPD65801 uPD65800 UPD65804 | |
nec naming rule
Abstract: L302
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D17709
Abstract: SE-17709
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SE-17709 PD17704A PD17705A PD17707A PD17708A PD17709A PD17717 PD17718 PD17719 U10663EJ4V0UM00 D17709 SE-17709 | |
MF-1134
Abstract: SEMICONDUCTOR DEVICE MOUNTING TECHNOLOGY MANUAL gas detector NDL5405 NDL5405C NDL5430C NDL5430CR NDL5471RC NDL5490 NDL5490L
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NDL5430C NDL5430C NDL5430CR MF-1134 SEMICONDUCTOR DEVICE MOUNTING TECHNOLOGY MANUAL gas detector NDL5405 NDL5405C NDL5430CR NDL5471RC NDL5490 NDL5490L | |
detector apd nec
Abstract: NDL5405L NDL5490 NDL5490L NDL5500 NDL5510 NDL5520C NDL5530 NDL5530C NDL5531
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NDL5530C detector apd nec NDL5405L NDL5490 NDL5490L NDL5500 NDL5510 NDL5520C NDL5530 NDL5531 | |
NNCD6.8G
Abstract: NNCD3.9G NNCD5.6G IEC1000 IEC1000-42 IEC1000-4-2 NNCD27G C10535E C11531E D1164
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NNCD27G IEC1000-4-2 IEC1000-4- NNCD6.8G NNCD3.9G NNCD5.6G IEC1000 IEC1000-42 NNCD27G C10535E C11531E D1164 | |
induction cooker fault finding diagrams
Abstract: induction cooker schematic diagram EDS SHIELD DOMESTIC GAS DETECTOR schematic diagram induction cooker 3 gun sound generator UM 3562 NEC plasma tv schematic diagram ultrasonic flaw detector LS 2027 Final Audio LS 2027 audio Ultrasonic humidifier circuit
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C12769EJ2V0IF induction cooker fault finding diagrams induction cooker schematic diagram EDS SHIELD DOMESTIC GAS DETECTOR schematic diagram induction cooker 3 gun sound generator UM 3562 NEC plasma tv schematic diagram ultrasonic flaw detector LS 2027 Final Audio LS 2027 audio Ultrasonic humidifier circuit | |
2SJ460
Abstract: MEI-1202
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2SJ460 2SJ460 MEI-1202 | |
d1072
Abstract: 2SK2541 MEI-1202 MF-1134
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2SK2541 2SK2541 d1072 MEI-1202 MF-1134 | |
2SK2541
Abstract: MEI-1202 MF-1134 NEC reliability 1995
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2SK2541 2SK2541 25ndustrial MEI-1202 MF-1134 NEC reliability 1995 | |
d1072
Abstract: 2SJ460 MEI-1202
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2SJ460 2SJ460 d1072 MEI-1202 | |
nec laser diode OTDR
Abstract: C10535E MEI-1202 NDL7581P NDL7581PC NDL7581PD
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NDL7581P NDL7581P nec laser diode OTDR C10535E MEI-1202 NDL7581PC NDL7581PD |