MTTF TEST DATA Search Results
MTTF TEST DATA Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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NFMJMPC226R0G3D | Murata Manufacturing Co Ltd | Data Line Filter, | |||
NFM15PC755R0G3D | Murata Manufacturing Co Ltd | Feed Through Capacitor, | |||
NFM15PC435R0G3D | Murata Manufacturing Co Ltd | Feed Through Capacitor, | |||
NFM15PC915R0G3D | Murata Manufacturing Co Ltd | Feed Through Capacitor, | |||
FO-50LPBMTRJ0-001 |
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Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m |
MTTF TEST DATA Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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MTTF
Abstract: VC-706 failure rate VC70 VC706
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VC-706 MTTF failure rate VC70 VC706 | |
VCC6
Abstract: MTTF MTTF test data
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VCC1
Abstract: MTTF MTTF test data
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Hp 2564
Abstract: DOD-HDBK-1686
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OCR Scan |
HPMX-3002 MIL-STD-883 DOD-HDBK-1686 MIL-STD-202, Hp 2564 | |
XLO8
Abstract: diode hp 5082-2080 hp 5082-2830 DOD-HDBK-1686A DOD-HDBK-1686 hp 5082-2900 diode
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OCR Scan |
HSCH-5300 HSCH-5500 MIL-STD-750 1051C DOD-HDBK-1686 XLO8 diode hp 5082-2080 hp 5082-2830 DOD-HDBK-1686A hp 5082-2900 diode | |
MTTFContextual Info: CMOS Phase Locked Loop Reliability Data HPLL-8001 Description The following cumulative test results have been obtained from testing performed for HewlettPackard Communication Semiconductor Solutions Division in accordance with the latest revi- sion of MIL-STD-883. Data was |
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HPLL-8001 MIL-STD-883. M2015 M2010 M2016 MIL-STD-883 M3015 5968-0321E MTTF | |
MTTF
Abstract: AT-3XXXX wk 3 25 transistor DOD-HDBK-1686
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MIL-STD-883. 10-9/hrs. MIL-STD-750 HPGSS-12-107 MIL-STD-202, DOD-HDBK-1686 AT-3XX11/3XX33 MTTF AT-3XXXX wk 3 25 transistor | |
mosfet mttf
Abstract: MRF6VP11KH MRF6VP11KHR6 tuo-4 AN1955 T491X226K035AT capacitor mttf FAIR-RITE 2743021447 EKME MCCFR
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MRF6VP11KH MRF6VP11KHR6 mosfet mttf MRF6VP11KH MRF6VP11KHR6 tuo-4 AN1955 T491X226K035AT capacitor mttf FAIR-RITE 2743021447 EKME MCCFR | |
HPMX-3002
Abstract: M2003 M2015
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HPMX-3002 MIL-STD-883 M1010 M1011 M2015 M2003 DOD-HDBK-1686 MIL-STD-202, HPMX-3002 M2003 M2015 | |
MTTF
Abstract: MTTF test data ina series
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MIL-STD-883. To-883 DOD-HDBK-1686 MIL-STD-202, MTTF MTTF test data ina series | |
Contextual Info: NPN Silicon Bipolar Transistor Reliability Data AT-3XXXX Series Description The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883. Data was gathered from the |
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MIL-STD-883. GSS-12-107 MIL-STD-202, DOD-HDBK-1686 AT-3XX11/3XX33 5963-3564E 5965-8917E | |
Contextual Info: Low Noise Gallium Arsenide FET Reliability Data ATF-10XXX ATF-13XXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the |
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ATF-10XXX ATF-13XXX MIL-STD-883. Ambie11 5966-0233E 5966-2942E | |
I 6506
Abstract: 5091-8326E HRS108
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MIL-STD-750. MIL-STD-202, DOD-HDBK-1686 I 6506 5091-8326E HRS108 | |
HFBr reliability
Abstract: HFBR-1521 MIL-STD-690 HFBR-2521 MTTF HFBR-0501 HFBR-15xx
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HFBR-0501 HFBR-1521, HFBR-2521, HFBR-1521 HFBR-2521 5988-4042EN HFBr reliability HFBR-1521 MIL-STD-690 HFBR-2521 MTTF HFBR-15xx | |
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Hp 2564
Abstract: M-1004 INA-51063 INA-52063 M2003 Hp+2564
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INA-51063 INA-52063 MIL-STD-883. M1004 M1010 M2003 M2031 MILSTD-202, DOD-HDBK-1686 Hp 2564 M-1004 INA-51063 INA-52063 M2003 Hp+2564 | |
JESD22-A114A
Abstract: HPMX-5001 JESD22-A114-A
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HPMX-5001, HPMX-5002 HPMX-5001 HPMX-5002 MIL-STD-202, EIA/JESD22-A114-A 5968-0215E JESD22-A114A JESD22-A114-A | |
250GX-0300-55-22
Abstract: CPF320R000FKE14 MRF6VP11KH 1812SMS-82NJLC ATC200B103KT50X ATC100B101JT500XT AN1955 JESD22-A114 MRF6VP11KHR6 T491X226K035AT
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MRF6VP11KH MRF6VP11KHR6 250GX-0300-55-22 CPF320R000FKE14 MRF6VP11KH 1812SMS-82NJLC ATC200B103KT50X ATC100B101JT500XT AN1955 JESD22-A114 MRF6VP11KHR6 T491X226K035AT | |
MCCFR0W4J0102A50
Abstract: MRF6VP11KH mccfr0w4j CPF32 MRF6VP11KHR6 MRF6VP11KGSR5
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MRF6VP11KH MRF6VP11KHR6 MRF6VP11KGSR5 MCCFR0W4J0102A50 mccfr0w4j CPF32 MRF6VP11KGSR5 | |
AT-41511
Abstract: AT-41533
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AT-41511 AT-41533 MIL-STD-883. MIL-STD-750 MIL-STD-202, DOD-HDBK-1686 AT-41511/41533 AT-41511 AT-41533 | |
Contextual Info: HPMX-2006, HPMX-2007 Integrated Circuits Reliability Data HPMX-2006 HPMX-2007 Description The following cumulative test results have been obtained from testing performed at HewlettPackard Company. Data was gathered from the product qualification, reliability monitor, |
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HPMX-2006, HPMX-2007 HPMX-2006 HPMX-2007 MIL-STD-202, DOD-HDBK-1686 5968-0731E | |
MTTF
Abstract: AT-41511
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MIL-STD-883. MIL-STD-202, DOD-HDBK-1686 AT-41511/41533 5966-0933E 5988-9788EN MTTF AT-41511 | |
Contextual Info: NPN Silicon Bipolar Transistor Reliability Data AT-41511 AT-41533 The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability |
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AT-41511 AT-41533 MIL-STD-883. VC200 MIL-STD-202, DOD-HDBK-1686 AT-41511/41533 5963-5127E 5966-0933E | |
IAM-8XXXX
Abstract: MTTF
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MIL-STD-883. DOD-HDBK-1686 MIL-STD-202, IAM-8XXXX MTTF | |
Contextual Info: Freescale Semiconductor Technical Data Document Number: MRF6VP11KH Rev. 7, 4/2010 RF Power Field Effect Transistor N-Channel Enhancement-Mode Lateral MOSFET MRF6VP11KHR6 Designed primarily for pulsed wideband applications with frequencies up to 150 MHz. Device is unmatched and is suitable for use in industrial, medical |
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MRF6VP11KH MRF6VP11KHR6 |