MTTF CALCULATION Search Results

PKF 4111A SI

Abstract: PKF 5713 SI PKF 4110B SI 2113A 5617 PKF 2611 PI PKF 4121A SI PKF 4621 SI pkf 4910a PKF 4610A SI
Contextual Info: PKF series PKF series General information • SMD and through hole versions with ultra-low component height 8.0 mm 0.315 in. • Up to 87% efficiency at full load • Safety requirements in accordance with EN60950 • MTTF >10 million hours at +50°C case

MIL-HDBK-217

Contextual Info: 9810A Rev. B NEL CRYSTAL CLOCK OSCILLATORS SJ/HJ-X8XX series clock oscillators Reliability Calculations Based on MIL-HDBK-217 F 1 . .01 2.2 θjc 1 . .0035 .15 1 . .025 .64 1 . .025 .64 Silicon,epoxy,alumina,and alumina 0.05.0.05 θjc = 42.402 junction to case thermal resistance

Hp 2564

Abstract: DOD-HDBK-1686
Contextual Info: warn H E W L E T T miCM P A C K A R D Silicon Bipolar RFIC 900 MHz Driver Amplifier Reliability Data HPMX-3002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the relevant MIL-STD-883 or HP inter­

XLO8

Abstract: diode hp 5082-2080 hp 5082-2830 DOD-HDBK-1686A DOD-HDBK-1686 hp 5082-2900 diode
Contextual Info: WhoI H EW L E T T 1 "KM PA CK A R D Tri Metal Beam Lead Schottky Diodes Reliability Data HSCH-5300 Series HSCH-5500 Series Conclusion Hewlett-Packard’s beam lead diodes have successfully passed stringent environmental testing. Hewlett-Packard beam lead diodes may be used in military

AB-059

Contextual Info: APPLICATION BULLETIN Mailing Address: PO Box 11400 • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Tel: 602 746-1111 • Twx: 910-952-111 • Telex: 066-6491 • FAX (602) 889-1510 • Immediate Product Info: (800) 548-6132

AB-059

Abstract: burr-brown application bulletin selection
Contextual Info: APPLICATION BULLETIN Mailing Address: PO Box 11400 • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Tel: 602 746-1111 • Twx: 910-952-111 • Telex: 066-6491 • FAX (602) 889-1510 • Immediate Product Info: (800) 548-6132

K4500

Abstract: X5R activation energy MLCC MTTF BME MLCC 90705-F Minford Technology MTTF test data 140C 0805X5R106 2817 kemet capacitor
Contextual Info: Lifetime Modeling of Sub 2 Micron Dielectric Thickness BME MLCC Michael S. Randall, Abhijit S. Gurav, Daniel J. Skamser, James J. Beeson Fountain Inn, SC 29644. Phone: 864 409-5700, FAX: (864) 409-5665, e-mail: mikerandall@kemet.com Multilayer ceramic capacitor (MLCC) design is

Contextual Info: Low Noise Gallium Arsenide FET Reliability Data ATF-10XXX ATF-13XXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

MTTF

Abstract: AT-3XXXX wk 3 25 transistor DOD-HDBK-1686
Contextual Info: NPN Silicon Bipolar Transistor Reliability Data AT-3XXXX Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

HPMX-3002

Abstract: M2003 M2015
Contextual Info: Silicon Bipolar RFIC 900 MHz Driver Amplifier Reliability Data HPMX-3002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the relevant MIL-STD-883 or HP internal GSS methods. Data was

MTTF

Abstract: MTTF test data ina series
Contextual Info: Silicon Bipolar Monolithic Amplifier Reliability Data INA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

Contextual Info: NPN Silicon Bipolar Transistor Reliability Data AT-3XXXX Series Description The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883. Data was gathered from the

I 6506

Abstract: 5091-8326E HRS108
Contextual Info: Silicon Bipolar Monilithic Amplifiers Reliability Data MSA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-750. Data was gathered from the

ina-01

Contextual Info: Silicon Bipolar Monolithic Amplifier Reliability Data INA-01/02/03/10 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

JESD22-A114A

Abstract: HPMX-5001 JESD22-A114-A
Contextual Info: HPMX-5001, HPMX-5002 Integrated Circuits Reliability Data HPMX-5001 HPMX-5002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard. Data was gathered from the product qualification, reliability monitor, and engineering

AT-41511

Abstract: AT-41533
Contextual Info: NPN Silicon Bipolar Transistor Reliability Data AT-41511 AT-41533 The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability

Contextual Info: HPMX-2006, HPMX-2007 Integrated Circuits Reliability Data HPMX-2006 HPMX-2007 Description The following cumulative test results have been obtained from testing performed at HewlettPackard Company. Data was gathered from the product qualification, reliability monitor,

MTTF

Abstract: AT-41511
Contextual Info: NPN Silicon Bipolar Transistor Reliability Data AT-4xxxx The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability

Contextual Info: NPN Silicon Bipolar Transistor Reliability Data AT-41511 AT-41533 The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability

IAM-8XXXX

Abstract: MTTF
Contextual Info: Silicon Bipolar Active Mixer Reliability Data IAM-8XXXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability

IAM-82018

Abstract: IAM82018 IVA05218 M2016 M2004 IVA-05218
Contextual Info: Silicon Bipolar Vector Modulator Reliability Data HPMX-2003/5 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

MTTF

Contextual Info: Silicon Bipolar Variable Gain Amplifiers Reliability Data IVA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the

HPMX-5001

Abstract: MTTF test data
Contextual Info: HPMX-5001, HPMX-5002 Integrated Circuits Reliability Data HPMX-5001 HPMX-5002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard. Data was gathered from the product qualification, reliability monitor, and engineering

MTTF

Contextual Info: GaAs Schottky Diode Reliability Data HSCH-9XXX The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-750. Data was gathered from the product qualification, reliability