MICROTECH POSITIONER Search Results

e5070

Contextual Info: WinCalXE High-performance RF calibration software DATA SHEET Cascade Microtech’s WinCalXE software is a comprehensive and intuitive on-wafer RF measurement calibration tool to achieve accurate and repeatable S-parameter measurement, which is crucial for precision device modeling/characterization and engineering RFIC test.

Contextual Info: QuadCard Cost-effective, versatile probe card solution DATA SHEET The QuadCard probe card is the industry’s irst conigurable, multi-quadrant probe adapter that employs innovative ine probe aligners - individual miniature positioners - to mount up to four Cascade Microtech probes on a single probe card. It is designed to accommodate

Contextual Info: CM300 300 mm semi-/fully-automated probe system DATA SHEET In device and process development, the right solution helps you handle test requirements that change from day to day. That’s why Cascade Microtech developed the CM300, a lexible on-wafer probe system that scales to meet your evolving needs. By capturing the

tsm 1250

Contextual Info: PA300BEP 300 mm Semi-automatic Backside Emission Probe System DATA SHEET The PA300BEP backside emission probe system is a versatile, high-performance probe system for use with upward-looking observation systems. The PA300BEP offers easy wafer handling, automatic stepping and simple vertical probe card alignment in one

Contextual Info: PAV200 200 mm Semi-automatic Vacuum Probe System DATA SHEET The PAV200 is the ideal solution for automatic testing of wafers and substrates up to 200 mm in a high vacuum environment up to 10-5 mbar. It supports a wide temperature range from -60°C to 300°C.

Contextual Info: PA300DSP 300 mm Semi-automatic Double-sided Probe System DATA SHEET The PA300DSP is the most precise and lexible semi-automatic double-sided test solution for wafers and substrates up to 300 mm. It is ideal for all applications requiring access to both the top and back sides of the wafer, such as failure analysis with emission

Contextual Info: PM8DSP 200 mm Manual Double-sided Probe System DATA SHEET The PM8DSP is the most precise and lexible manual double-sided test solution for wafers and substrates up to 200 mm. It is ideal for all applications requiring access from both the top and back sides of the wafer, such as failure analysis with emission microscopes,

Contextual Info: PAC200 200 mm Semi-automatic Cryogenic Probe System DATA SHEET The PAC200 is the ideal solution for automatic testing of wafers and substrates up to 200 mm in a cryogenic environment down to 77 K with liquid nitrogen or below 20 K with liquid helium. It supports a wide range of applications, including DC and RF measurements of the latest silicon, compound semiconductor and

Contextual Info: PM300 300 mm Manual Probe System DATA SHEET The PM300 probe system is the ideal solution for engineering tests of 300 mm wafers and substrates. Whatever your application, the versatility of the PM300 meets all requirements from failure analysis FA to device and wafer characterization (DWC) to

Contextual Info: PA200DS-BR 200 mm Semi-automatic Probe System with Blue Ray DATA SHEET The PA200DS-BR was speciically designed for measurements requiring backside access to the wafer. The design allows you free access to both sides of the wafer, as well as high throughput due to a lightweight chuck design. The wafer itself can be ixed by vacuum or mechanically clamped to allow testing

Contextual Info: PMC200 200 mm Manual Cryogenic Probe System DATA SHEET The PMC200 is the ideal solution for testing wafers and substrates up to 200 mm in a cryogenic environment. Specially designed for laboratory requirements, it supports a wide range of measurements, including I-V, C-V and RF, and can be used for probing down to

Contextual Info: PLC50 100 mm Manual Cryogenic Probe System DATA SHEET The PLC50 is the most cost-effective and simple, yet highly-precise probing solution for wafers and substrates up to 100 mm at cryogenic temperatures. Specially designed for laboratory requirements, it supports a wide range of applications, including I-V, C-V

Contextual Info: PA200BlueRay 200 mm Semi-Automatic Probe System with BlueRay Technology DATA SHEET The PA200 BlueRay sets a new standard for high-speed accuracy. Its precision ensures smooth probe landing with safe, repeatable electrical contact. In combination with the unique Z-profiling function, even extreme variation in height, such as the case with warped wafers, can be compensated. This test

Contextual Info: PA300PS-MA 300 mm Semi-Automatic Probe System DATA SHEET The PA300PS-MA is the world’s only analytical probe system for ine-pitch probing of pads down to 30 m x 30 μm, veriication of ball grid arrays and the most universal tool for wafer-level reliability WLR tests with 220 mm or 320 mm Celadon tiles. The semiautomatic probe system employs the powerful ProbeShield technology, enabling accurate low-noise measurements of atto amps

Contextual Info: Elite300 300 mm Semi-automatic Probe System DATA SHEET The Elite 300 is essential for characterizing devices at the 32 nm technology node and beyond. This probe systems uses PureLine™ technology to achieve one of the lowest noise levels available on the market. Patented AttoGuard and MicroChamber® technologies signiicantly improve

Contextual Info: PMV200 200 mm Manual Vacuum Probe System DATA SHEET The PMV200 is the ideal solution for testing wafers and substrates up to 200 mm in a high vacuum environment up to 10-5 mbar. It supports a wide temperature range from -60°C to 300°C. Specially designed for laboratory requirements, it supports a wide range of applications, including DC and RF measurements, MEMS

Contextual Info: PLV50 100 mm Manual Vacuum Probe System DATA SHEET The PLV50 is the most cost-effective and simple, yet highly-precise probing solution for wafers and substrates up to 100 mm in a vaccum environment. Specially designed for laboratory requirements, it provides a wide range of measurements, including

RPP305

Contextual Info: PM8 200 mm Manual Probe System DATA SHEET The PM8 is designed to provide a highly stable, ergonomic and lexible probing platform for precise analytical probing applications up to 200 mm, such as device and wafer characterizations, failure analysis FA , RF/mmW and sub-THz probing, opto-engineering

Contextual Info: EPS150RF A dedicated 150 mm manual probing solution for Rf applications Benefits Make everyone an Rf expert Best-known methods for highest measurement accuracy ensure calibration accuracy WinCal XE – the only RF on-wafer calibration software enable testing of cutting-edge technologies

Contextual Info: EPS150COAX A dedicated 150 mm manual probing solution for DC parametric test BENEFITS Make everyone a measurement expert Best-known methods for DC parametric test Ensure contact stability over time Compact and rigid mechanical design Test a wide variety of technologies

Contextual Info: Edge Flicker noise Measurement System and Module DATA SHEET By addressing the entire measurement path — from probe tip to data acquisition — the Edge is the world’s irst and only measurement solution that delivers accurate licker noise measurements from 1 Hz up to 40 MHz. As a module or a complete system, the

EPS-ACC-150-PCA

Contextual Info: EPS150TRIAX A dedicated 150 mm manual probing solution for low-noise measurements Benefits Make everyone a low-noise measurement expert Best-known methods for low-level I-V/C-V test enable i-V measurements at fA level Full triaxial design and high-quality cables

EPS-ACC-150MMW-MAU

Contextual Info: EPS150MMW A dedicated 150 mm manual probing solution for mmW, tHz and load pull applications The EPS150MMW is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum conidence. The system incorporates

DPP220-V-S

Contextual Info: EPS150FA A dedicated 150 mm manual probing solution for failure analysis BENEFITS The EPS150FA is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum conidence. The system incorporates