PA300BEP Search Results

tsm 1250

Contextual Info: PA300BEP 300 mm Semi-automatic Backside Emission Probe System DATA SHEET The PA300BEP backside emission probe system is a versatile, high-performance probe system for use with upward-looking observation systems. The PA300BEP offers easy wafer handling, automatic stepping and simple vertical probe card alignment in one

Contextual Info: 倒立型 エミッション顕微鏡 Inverted Emission Microscope ア イ フ ィ ー モ ス PHEMOS シリーズ -MP -TP -TD -SD ア イ フ ィ ー モ ス 特長 ● テスタへのダイレクトドッキングによりダイナミック解析が可能

C9215

Contextual Info: Inverted Emission Microscope R Tester direct docking type -SD series Tester direct docking type -TD Backside prober type -TP Features Options Multi-camera platform with high-precision stage NanoLens for high-resolution and high-sensitivity observation Flexible system design