LOGIC11 Search Results

Contextual Info: IBM Microelectronics ? Standard cell/gate array value ASIC for high-function, high-density applications H ig h lig h ts ¥ Embedded DRAM, fully supported by IBM Blue Logic11 Design Methodology, with integrated built-in self test and redundancy ¥ C opper metallurgy for price/perfor­

SN54LVT18502

Contextual Info: SN54LVT18502 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS669-JULY 1996 M e m b e r of the Te x a s I n s t r u m e n t s S C O P E F a mi l y o f Testabil ity P r o du c t s C o m p a t i b l e With the I EEE S t a n d a r d 11 4 9 . 1 - 19 9 0 J T A G Test A c c e s s P o r t and

Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B - JULY 1996 - REVISED JUNE 1997 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SC B S 164E -A U G U S T 1993-R E V IS E D DECEMBER 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O

LVTH182504A

Abstract: LVTH18504A SN54LVTH182504A SN54LVTH18504A SN74LVTH182504A SN74LVTH18504A scbs667a
Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS S C B S 667A - JU LY 1996 - REVISED D ECE M B ER 1996 • • • • • • • Members of the Texas Instruments SCOPE Family of Testability Products

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS S C BS 166D -A U G U ST 1993 - REVISED JULY 1996 M e m b e r s of the Texas I n s t r u m e nt s S C O P E F a mi l y of Testabil ity P r o d u c t s

Contextual Info: AT88SC54C Features • Enhanced Intel 80C31 Microcontroller Offers Maximum Security for High Security Smart Card Applications • 8 Kbytes E2PROM Program Memory Provides Higher Level of Security than Traditional ROM • 8 Kbytes E2PROM Application/Data Memory

Contextual Info: SN74LVT18504 3.3-V ABT SCAN TEST DEVICE WITH 20-BIT UNIVERSAL BUS T R A N SC EIV E R S S C B S 163F-A U G U S T 1993 - REVISED JULY 1996 Mem ber of th e Te x a s In strum e nt s S C O P E F a mi l y o f Testabil ity P r o d u c t s C o m p a t i b l e With the I EEE S t a n d a r d

Contextual Info: SN74LVT18502, SN74LVT182502 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS S C B S 162F-A U G U S T 1993 - REVISED JULY 1996 C o m p a t i b l e With the I EEE S t a n d a r d 1 1 4 9 . 1 - 19 9 0 J T A G Test A c c e s s P or t and B o u n d a r y - S c a n Ar c h i t e c t ur e

Texas Instruments TTL data book

Abstract: SN54ABTH182502A SN54ABTH18502A SN74ABTH182502A SN74ABTH18502A
Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A, SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS S C B S164D - AU G U S T 1993 - R EVISED S E PTE M BE R 1996 Members of the Texas Instruments S C O P E Family of Testability Products

AT59C11

Contextual Info: ATHEL CORP M3E D 1074 17 7 DGDISOM 1 fflATM A T 5 9 C 1 1 /1 2 /1 3 7 -V 6 -/3 -2 7 Features • Low V oltage and S tandard V oltage O peration 5.0 V V c c = 4.5 V to 5.5 V 3.0 V (V cc = 2.7 V to 5.5 V) U ser S electab le Internal O rganization 1K: 1 2 8 x 8 o r 6 4 x 1 6

Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCO PBMFamily of Testability Products One Boundary-Scan Cell Per I/O

3 phase ic ncl 055

Contextual Info: SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS SCBS167D-AUGUST 1993 - REVISED JULY 1996 M e m b e r s of the Texas I n s t r u m e nt s S C O P E F a mi l y of Testabil ity P r o d u c t s

transistor bf 175

Abstract: smd marking gc diode gc ob
Contextual Info: tfc u u A Integrated Circuits D ata Book Edition 2 1993 Consumer Microcircuits Limited » Consumer Microcircuits Limited 1 Wheaton Road Witham Essex CM8 3TD England Telephone: 0376 513833 • Telex: 99382 CMICRO G • Telefax: (0376) 518247 Printed in Great Britain by The Bath Press;, Avon

CDIP 8 signetics

Abstract: PCB80C31BH-3P signetics eprom "87c51"
Contextual Info: Philips Components-Signetics Document No. 853-0169 ECN No. 99667 Date of Issue May 23, 1990 Status Product Specification 80C31 /80C51 /87C51 CMOS single-chip, 8-bit microcontroller Application Specific Product DESCRIPTION FEATURES The P hilips 80C 31/80C 51/87C 51 is a

SN54ABT18245A

Abstract: SN74ABT18245A
Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110G - A U G U S T 1 9 9 2 - REVISED D ECE M B ER 1996 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus™ Family

Contextual Info: b E j A T E AD S-917 L 14-Bit, 1MHz, Low-Power Sampling A/D Converters IN N O V A TIO N a n d E X C E L L E N C E FEATURES • 14-Bit resolution • 1MHz sampling rate • • • • • • No missing codes Functionally complete Small 24-pin DDIP or SMT package

vdo 007 ads

Contextual Info: A D S -112 □ ksm 12-Bit, 1MHz Low-Power Sampling A/D Converter INNOVATION a nd EXCELLENCE FEATURES • • • • • • • • 12-Bit resolution No missing codes 1MHz minimum sampling rate Functionally complete Small 24-pin DDIP Low-power, 1.3 Watts