iob25hh
Abstract: RAM256X9AA
Contextual Info: ProASICPLUS Macro Library Guide R1-2002 Actel Corporation, Sunnyvale, CA 94086 2002 Actel Corporation. All rights reserved. Part Number: 5579016-1 Release: June 2002 No part of this document may be copied or reproduced in any form or by any means without prior written consent of Actel.
|
Original
|
r1-2002iob25hhram256x9aa |
PDF
|
OB33LN
Abstract: IOB33LNU IOBL33LLU OB25LPLL IOBL25HHU OB33PL IOB33PH OTB33PL OB33LL
Contextual Info: A ppl i cati on N ot e I/O Cell Selection for ProASIC 500K Devices In t ro d u c t i o n Table 1 • Input Pads The ProASIC 500K family offers a variety of different I/O cells to meet specific application requirements. These I/O cells can be configured with a 3.3V or 2.5V I/O ring supply
|
Original
|
ib33uib25uib25lpuib25lp+9ob33lniob33lnuiobl33lluob25lplliobl25hhuob33pliob33photb33plob33ll
|
PDF
|
iob25hh
Abstract: IOB33LNU
Contextual Info: Application Note I/O Cell Selection for ProASIC 500K Devices Introduction Table 1 • Input Pads The ProASIC 500K family offers a variety of different I/O cells to meet specific application requirements. These I/O cells can be configured with a 3.3V or 2.5V I/O ring supply voltage.
|
Original
|
ib33uib25uib25lpuib25lp+8iob25lplniob25lplliobl25lphhiobl25lphniobl25lphliobl25lplhiob25hhiob33lnu
|
PDF
|
A500K050
Abstract: A500K130 IB33U
Contextual Info: Application Note AC144 Using JTAG Boundary-Scan with ProASIC 500K Devices In t ro d u c t i o n Due to the increasing complexity of circuit boards, testing loaded boards is becoming prohibitively expensive and more difficult to perform. Board complexity has resulted from the
|
Original
|
ac144a500k130bg456a500k050a500k130+1ib33u
|
PDF
|
FIFO256X9SSRP
Abstract: iob25hh RAM256X9AA
Contextual Info: ProASIC Macro Library Guide November 1999 Actel Corporation, Sunnyvale, CA 94086 ã 1999 Actel Corporation. All rights reserved. Part Number: 5579016-1 Release: November 1999 No part of this document may be copied or reproduced in any form or by any means without prior
|
Original
|
fifo256x9ssrpiob25hhram256x9aa |
PDF
|
IB33U
Abstract: S148
Contextual Info: A ppl i cati on N ot e Using JTAG Boundary-Scan with ProASIC 500K Devices In t ro d u c t i o n Due to the increasing complexity of circuit boards, testing loaded boards is becoming prohibitively expensive and more difficult to perform. Board complexity has resulted from the
|
Original
|
a500k130bg456ib33us148 |
PDF
|
iob25hh
Contextual Info: ProASIC Macro Library Guide June 1999 Actel Corporation, Sunnyvale, CA 94086 ã 1999 Actel Corporation. All rights reserved. Part Number: 5579016-0 Release: June 1999 No part of this document may be copied or reproduced in any form or by any means without prior
|
Original
|
iob25hh |
PDF
|
AC142
Abstract: IOB33PH IOB33PNU OTB33PL IOB33LL ob33lh OTB33PH
Contextual Info: Application Note AC142 I/O Cell Selection for ProASIC 500K Devices In t ro d u c t i o n Table 1 • Input Pads The ProASIC 500K family offers a variety of different I/O cells to meet specific application requirements. These I/O cells can be configured with a 3.3V or 2.5V I/O ring supply
|
Original
|
ac142iob33phiob33pnuotb33pl+3iob33llob33lhotb33ph
|
PDF
|