DON 109 Search Results

Contextual Info: PRELIMINARY CY37128 UltraLogic 128-Macrocell ISR™ CPLD Features • 128 macrocells in eight logic blocks • In-System Reprogrammable ISR™ — JTAG-compliant on-board programming — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37032

Abstract: CY37032V CY37064 CY37064V CY37128 CY37128V CY37192 CY37256 CY37384 CY37512
Contextual Info: Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs Features General Description • In-System Reprogrammable™ ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37032VP44-100AI

Abstract: 5962-9952502QZC 400BA
Contextual Info: Ultra37000 CPLD Family 5V, 3.3V, ISR High-Performance CPLDs Features General Description • In-System Reprogrammable™ ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37512P208-100UMB

Abstract: CY37512P208-100UM CY37032VP44-100AI CY37256P160-83UM CY37064P44-154YMB CY37256P160-125UMB CERAMIC leaded CHIP CARRIER CLCC 68
Contextual Info: Family PRELIMINARY Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs Features General Description • In-System Reprogrammable ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37032VP44-100AI

Abstract: CY37064P44-154YMB CY37512P208-100UMB
Contextual Info: Family Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs Features General Description • In-System Reprogrammable™ ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37512

Abstract: CY37512V AE O47 CY37512P208-83UMB
Contextual Info: Back PRELIMINARY CY37512 UltraLogic 512-Macrocell ISR™ CPLD Features • 512 macrocells in 32 logic blocks • In-System Reprogrammable™ ISR™ — JTAG-compliant on-board programming — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

11l 60 xe

Abstract: CY37512P208-100UMB CY37512P208-83UMB e50j CY37256P160-125UMB vp44 CY37256P160-83UMB CY37064P44-154YMB CY37128P84-125JI U208
Contextual Info: CYPRESS PRELIMINARY Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs General Description Features • In-System Reprogram mable ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37032VP44-100AI

Abstract: CY37512P208-100UM CY37512P208-100UMB CY37064P44-154YMB
Contextual Info: Family Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs Features General Description • In-System Reprogrammable™ ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37032VP44-100AI

Abstract: CY37064P44-154YMB
Contextual Info: Family PRELIMINARY Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs Features General Description • In-System Reprogrammable ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37032VP44-100AI

Contextual Info: Family Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs Features General Description • In-System Reprogrammable™ ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

clcc land pattern

Abstract: CY37512VP208-66UMB CY37032VP44-100AI CY37064P44-154YMB CY37256P160-125UMB TO-220AB/clcc land pattern
Contextual Info: CYPRESS PRELIMINARY Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs General Description Features • In-System Reprogram mable ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

U208

Abstract: O15Z ol87 o1m 147 Y37512P208
Contextual Info: 3 r CYPRESS PRELIMINARY Ultra37512 UltraLogic 512-Macrocell ISR™ CPLD Features • 512 macrocells in 32 logic blocks • In-System Reprogrammable™ ISR™ — JTAG-compliant on-board programming — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

CY37064P44-154YMB

Abstract: CY37512P208-100UMB CY37256P160-125UMB CY37032 CY37032V CY37064 CY37064V CY37128 CY37128V CY37032VP44-100AI
Contextual Info: Family Ultra37000 CPLD Family[1] 5V, 3.3V, ISR™ High-Performance CPLDs Features General Description • In-System Reprogrammable™ ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

l0249

Abstract: CY37032VP44-100AI
Contextual Info: CYPRESS PRELIMINARY Ultra37000 CPLD Family 5V, 3.3V, ISR™ High-Performance CPLDs General Description Features • In-System Reprogram mable ISR™ CMOS CPLDs — JTAG interface for reconfigurability — Design changes don’t cause pinout changes — Design changes don’t cause timing changes

AXP 209 IC

Abstract: AXP 193 AXP 188 AXP 188 IC AXP 199 AXP 209 Datasheet AXP 209 80486DX architecture mb86900 486DX2
Contextual Info: Benchmarking the Am186EM Using the Dhrystone V2.1 as an example Don Gille Sr. Field Application Engineer Advanced Micro Devices Inc. Table of Contents

MAX2135A

Abstract: 56-pin 7x7 QFN Tuner dvb-t I2C program DVB-T Tuner I2C program
Contextual Info: MAX2135A RELIABILITY REPORT FOR MAX2135AETN+ PLASTIC ENCAPSULATED DEVICES March 04, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

max5969betb

Abstract: nq39
Contextual Info: MAX5969B RELIABILITY REPORT FOR MAX5969BETB+ PLASTIC ENCAPSULATED DEVICES April 6, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

Contextual Info: MAX8808X RELIABILITY REPORT FOR MAX8808XETA+ PLASTIC ENCAPSULATED DEVICES July 12, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

MAX5969A

Abstract: nq39
Contextual Info: MAX5969A RELIABILITY REPORT FOR MAX5969AETB+ PLASTIC ENCAPSULATED DEVICES April 6, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

MAX3208E

Contextual Info: MAX3207E RELIABILITY REPORT FOR MAX3207EAUT+ PLASTIC ENCAPSULATED DEVICES April 12, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

JESD22-A114

Abstract: MAX4951BE SATA III sata Connector signal spacing
Contextual Info: MAX4951BE RELIABILITY REPORT FOR MAX4951BECTP+ PLASTIC ENCAPSULATED DEVICES May 19, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

Contextual Info: MAX6175 RELIABILITY REPORT FOR MAX6175BASA+ PLASTIC ENCAPSULATED DEVICES April 20, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

Contextual Info: MAX6383 RELIABILITY REPORT FOR MAX6383LT46D3+ PLASTIC ENCAPSULATED DEVICES March 16, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.

6-Pin SC70 theta jc value

Contextual Info: MAX6382 RELIABILITY REPORT FOR MAX6382XR16D3+ PLASTIC ENCAPSULATED DEVICES March 15, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering Maxim Integrated Products. All rights reserved.