DECADE COUNTER WITH PHASE-PULSE DATA REPRESENTATION Search Results
DECADE COUNTER WITH PHASE-PULSE DATA REPRESENTATION Result Highlights (5)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
|---|---|---|---|---|---|
| NFM15PC755R0G3D | Murata Manufacturing Co Ltd | Feed Through Capacitor, | |||
| NFM15PC435R0G3D | Murata Manufacturing Co Ltd | Feed Through Capacitor, | |||
| NFM15PC915R0G3D | Murata Manufacturing Co Ltd | Feed Through Capacitor, | |||
| D1U54T-M-2500-12-HB4C | Murata Manufacturing Co Ltd | 2.5KW 54MM AC/DC 12V WITH 12VDC STBY BACK TO FRONT AIR | |||
| GRJ55DR7LV474KW01K | Murata Manufacturing Co Ltd | Chip Multilayer Ceramic Capacitors with Soft Termination for General Purpose |
DECADE COUNTER WITH PHASE-PULSE DATA REPRESENTATION Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
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Contextual Info: CD74HC4017ĆQ1 HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546 − OCTOBER 2003 D Qualification in Accordance With D D D D D D D D D Significant Power Reduction Compared to AEC-Q100† Qualified for Automotive Applications Customer-Specific Configuration Control |
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CD74HC4017Q1 SCLS546 AEC-Q100 | |
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Contextual Info: CD74HC4017ĆEP HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS550 − DECEMBER 2003 D Controlled Baseline D D D D D D D D D D Fanout Over Temperature Range − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of |
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CD74HC4017EP SCLS550 | |
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Contextual Info: CD74HC4017ĆQ1 HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546 − OCTOBER 2003 D Qualification in Accordance With D D D D D D D D D Significant Power Reduction Compared to AEC-Q100† Qualified for Automotive Applications Customer-Specific Configuration Control |
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CD74HC4017Ä SCLS546 AEC-Q100â | |
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Contextual Info: CD74HC4017ĆQ1 HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546 − OCTOBER 2003 D Qualification in Accordance With D D D D D D D D D Significant Power Reduction Compared to AEC-Q100† Qualified for Automotive Applications Customer-Specific Configuration Control |
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CD74HC4017Q1 SCLS546 AEC-Q100 | |
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Contextual Info: CD74HC4017ĆQ1 HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546 − OCTOBER 2003 D Qualification in Accordance With D D D D D D D D D Significant Power Reduction Compared to AEC-Q100† Qualified for Automotive Applications Customer-Specific Configuration Control |
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CD74HC4017Q1 SCLS546 AEC-Q100 | |
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Contextual Info: CD74HC4017ĆEP HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS550 − DECEMBER 2003 D Controlled Baseline D D D D D D D D D D Fanout Over Temperature Range − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of |
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CD74HC4017Ä SCLS550 | |
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Contextual Info: CD54HCT4017 DECADE COUNTER/DIVIDER WITH TEN DECODED OUTPUTS SGDS012 – MAY 1999 D D D D D D D D D 4.5-V to 5.5-V Operation Fully Static Operation Buffered Inputs Common Reset Positive-Edge Clocking Balanced Propagation Delay and Transition Times Direct LSTTL Input Logic Compatibility |
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CD54HCT4017 SGDS012 CD54HCT4017 | |
CD54HCT4017
Abstract: CD54HCT4017F3A
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CD54HCT4017 SGDS012 CD54HCT4017 CD54HCT4017F3A | |
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Contextual Info: CD54HC4017 DECADE COUNTER/DIVIDER WITH TEN DECODED OUTPUTS SGDS011 – MAY 1999 D D D D D D D D 2-V to 6-V Operation Fully Static Operation Buffered Inputs Common Reset Positive-Edge Clocking Balanced Propagation Delay and Transition Times High Noise Immunity: NIL = 30%, NIH = 30% |
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CD54HC4017 SGDS011 | |
8601101EA
Abstract: CD54HC4017 CD54HC4017F3A
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CD54HC4017 SGDS011 CD54HC4017 8601101EA CD54HC4017F3A | |
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Contextual Info: CD74HC4017-Q1 HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546SA − OCTOBER 2003 − REVISED APRIL 2008 D D D D D D D Qualified for Automotive Applications Fully Static Operation Buffered Inputs Common Reset Positive Edge Clocking |
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CD74HC4017-Q1 SCLS546SA | |
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Contextual Info: CD74HC4017ĆEP HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS550 − DECEMBER 2003 D Controlled Baseline D D D D D D D D D D Fanout Over Temperature Range − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of |
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CD74HC4017EP SCLS550 | |
CD74HC4017
Abstract: CD74HC4017QM96EP CD74HC4017QPWREP MTSS001C HC4017E
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CD74HC4017EP SCLS550 CD74HC4017 CD74HC4017QM96EP CD74HC4017QPWREP MTSS001C HC4017E | |
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Contextual Info: CD74HC4017ĆEP HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS550 − DECEMBER 2003 D Controlled Baseline D D D D D D D D D D Fanout Over Temperature Range − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of |
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CD74HC4017EP SCLS550 | |
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Contextual Info: CD74HC4017-Q1 HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546SA − OCTOBER 2003 − REVISED APRIL 2008 D D D D D D D Qualified for Automotive Applications Fully Static Operation Buffered Inputs Common Reset Positive Edge Clocking |
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CD74HC4017-Q1 SCLS546SA CD74HC4017 | |
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Contextual Info: CD74HC4017ĆEP HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS550 − DECEMBER 2003 D Controlled Baseline D D D D D D D D D D Fanout Over Temperature Range − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of |
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CD74HC4017Ä SCLS550 | |
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Contextual Info: CD74HC4017ĆEP HIGHĆSPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS550 − DECEMBER 2003 D Controlled Baseline D D D D D D D D D D Fanout Over Temperature Range − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of |
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CD74HC4017EP SCLS550 | |
SCLS546
Abstract: texas ttl data book AEC-Q100 CD74HC4017 CD74HC4017QM96Q1 CD74HC4017QPWRQ1 MTSS001C Q100
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CD74HC4017Q1 SCLS546 AEC-Q100 texas ttl data book AEC-Q100 CD74HC4017 CD74HC4017QM96Q1 CD74HC4017QPWRQ1 MTSS001C Q100 | |
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Contextual Info: CD74HC4017-Q1 HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546SA − OCTOBER 2003 − REVISED APRIL 2008 D D D D D D D Qualified for Automotive Applications Fully Static Operation Buffered Inputs Common Reset Positive Edge Clocking |
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CD74HC4017-Q1 SCLS546SA CD74HC4017 | |
LS490
Abstract: SN54LS490 SN54LS90 SN74LS490 SN74LS490N SN74LS90 1N3064 SN74LS90 Decade Counter texas instruments
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SN54LS490, SN74LS490 SDLS125A SN54LS490 LS490 SN54LS490 SN54LS90 SN74LS490 SN74LS490N SN74LS90 1N3064 SN74LS90 Decade Counter texas instruments | |
CD74HC4017
Abstract: CD74HC4017QM96G4Q1 CD74HC4017QM96Q1 CD74HC4017QPWRQ1 MTSS001C
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CD74HC4017Q1 SCLS546SA CD74HC4017 CD74HC4017QM96G4Q1 CD74HC4017QM96Q1 CD74HC4017QPWRQ1 MTSS001C | |
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Contextual Info: CD74HC4017-Q1 HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS SCLS546SA − OCTOBER 2003 − REVISED APRIL 2008 D D D D D D D Qualified for Automotive Applications Fully Static Operation Buffered Inputs Common Reset Positive Edge Clocking |
Original |
CD74HC4017-Q1 SCLS546SA CD74HC4017 | |
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Contextual Info: CD54HC4017 DECADE COUNTER/DIVIDER WITH TEN DECODED OUTPUTS SGDS011 – MAY 1999 D D D D D D D D 2-V to 6-V Operation Fully Static Operation Buffered Inputs Common Reset Positive-Edge Clocking Balanced Propagation Delay and Transition Times High Noise Immunity: NIL = 30%, NIH = 30% |
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CD54HC4017 SGDS011 | |
CD54HC162
Abstract: CD54HC162F3A CD54HC160 CD54HC160F3A
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CD54HC160, CD54HC162 SCHS301 CD54HC160) CD54HC162) CD54HC162 CD54HC162F3A CD54HC160 CD54HC160F3A | |