MD4148
Abstract: MD5614 MD5615 1N5614 MSC 1n3600 die 1N5550-1N5553 1N4001 microsemi 1N3595 MSC md4007 MD56-2
Contextual Info: GENERAL PARAMETER RESTRICTIONS FOR 100% DICE TEST: U nm ounted dice d o n o t have the pow er ratings o f packaged devices, therefore test conditions as well as ratings m ay need to be reduced or sam pled in packaged form as described below: V p = 200 m A m axim um . A ccuracy variable above 50 m A , highly contact dependent.*
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1n8211n8291n9351n9391n9411n945-cz821cz829+16cz935cz939cz941cz9451n61031n61371n61391m6173dd6103dd6137dd6139dd6173md4148md5614md56151n5614 msc1n3600 die1n5550-1n55531n4001 microsemi1n3595 mscmd4007md56-2
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