DALLAS DS Search Results

Contextual Info: 03/12/2004 RELIABILITY REPORT FOR DS1961S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

FP4527

Abstract: 200G DS1963S Hysol
Contextual Info: 03/11/2003 RELIABILITY REPORT FOR DS1963S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD22-B102

Abstract: JESD78 JESD22-B100 JESD22 B100 JESD-78 PHYSICAL DIMENSIONS JESD22-B100 0422 500 mold compound Amicon ds1323
Contextual Info: 09/13/2004 RELIABILITY REPORT FOR DS1249W Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

9715

Abstract: DS2430A
Contextual Info: 11/07/2003 RELIABILITY REPORT FOR DS2430A, Rev A3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

ds2482

Contextual Info: 11/29/04 PRODUCT RELIABILITY REPORT FOR DS2482-100, Rev A3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com

ABLEBOND

Contextual Info: 8/29/2006 RELIABILITY REPORT FOR DS1086L, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

JESD22-B105

Abstract: G600 mold compound unisem ablebond 8290 JESD22-A115 8200T J-STD-020 0647
Contextual Info: 4/13/2007 RELIABILITY REPORT FOR DS1086H, Rev A2, 8" Fab, Automotive Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292

mark a7 sot23

Abstract: J-STD-20A atec 6710S CDA194 mp8000
Contextual Info: 08/23/2004 RELIABILITY REPORT FOR DS1816, Rev A7 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

CDA194

Abstract: mark a7 sot23
Contextual Info: 08/23/2004 RELIABILITY REPORT FOR DS1810, Rev A7 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

D35WN-3P3M

Contextual Info: 11/28/2005 PRODUCT RELIABILITY REPORT FOR DS2460, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com

Contextual Info: 12/6/2006 PRODUCT RELIABILITY REPORT FOR DS2756, Rev A1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

2p1m

Abstract: 0717 29125C
Contextual Info: 6/4/2007 PRODUCT RELIABILITY REPORT FOR DS2502, Rev D3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

MIL-STD-883-2015

Abstract: plaskon ultrasound CRT MIL-STD-883-2009 9844 9844 maxim
Contextual Info: 12/04/2002 RELIABILITY REPORT FOR DS21FF44, 300 Pin MCMBGA Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

Contextual Info: 3/13/2007 PRODUCT RELIABILITY REPORT FOR DS28E01, Rev B2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com

MIL-STD-883-2012

Abstract: psb 6972
Contextual Info: 09/20/2004 RELIABILITY REPORT FOR DS1643P, 34 Pin Power Cap Base w/DS9034X Cap Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292

DS1648

Contextual Info: 09/20/2004 RELIABILITY REPORT FOR DS1644P, 34 Pin Power Cap Base w/DS9034X Cap Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292

DALLAS CAP DS9034

Abstract: 0231
Contextual Info: 05/14/03 RELIABILITY REPORT FOR DS9034PCX & DS9034PC0 SPRING SUPPLIER CHI CHENG Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy.

analog loss of signal detect

Abstract: 78P2241 78P7200 DS3150 GR-253-CORE GR-499-CORE m2184
Contextual Info: DALLAS SEMICONDUCTOR DS3150 Preliminary Data Sheet V1 August 20, 1999 DALLAS SEMICONDUCTOR DS3150 3.3V T3 / E3 / STS-1 Line Interface Preliminary Data Sheet Version 1 August 20, 1999 1 DALLAS SEMICONDUCTOR DS3150 Preliminary Data Sheet (V1) REVISION HISTORY

JESD78

Contextual Info: 5/24/2006 PRODUCT RELIABILITY REPORT FOR MAXQ2000 Rev A3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Mark Kwist Sr. Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : mark.kwist@dalsemi.com

leadframe

Abstract: DALLAS SEMICONDUCTOR Ds12887 DS12887 dallas ds12887 ds12887 datasheet TRACEABILITY DS12885 DS12887A
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: October 14, 1996 Subject: PRODUCT CHANGE NOTICE – I62502 Description: Alternate Leadframe – DS12885 Description of Change: Dallas Semiconductor is adding an alternate leadframe for the DS12885.

Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: September 14, 1995 To: Subject: PRODUCT CHANGE NOTICE – I50801 Description: DS5002M Metal Planarization Change The attached letter has been generated as a part of the Dallas Semiconductor Product Change Notification

3887

Abstract: 128-PIN DS80CH10 DS80CH11
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244-3292 972 371-4000 Date: March 31, 2000 Product Change Notice – C002902 Subject: Product Obsolescence – DS80CH10 - Green Energy Manager Description of Change: Effective immediately Dallas Semiconductor will accept no additional orders for the DS80CH10.

DS2015

Abstract: f62101 1996 3717 Quad-Port
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: August 13, 1996 Subject: PRODUCT CHANGE NOTICE – F62101 Description: Obsoleting DS2015 Quad Port Serial Product Description of Change: Effective September 30, 1996, Dallas Semiconductor will no longer produce the DS2015 Quad Port

megatest tester datasheet

Abstract: Teradyne megatest tester teradyne tester test system
Contextual Info: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: June 8, 1996 Subject: PRODUCT CHANGE NOTICE – G61201 Description: DS17285/DS17485/DS17885 Tester Change Description of Change: Dallas Semiconductor is in the process of converting the Final Electrical Test programs on the